SCHEMBL19052013

SCHEMBL19052013

C1CCC(N2CCN3CCN(C4CCCCC4)C2N(C2CCCCC2)CC3)CC1

nearest known ligand 0.43

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.31
POLB P06746 1/20 0.31
GAA P10253 1/20 0.31
ALDH1A1 P00352 2/20 0.30
SMN1; SMN2 Q16637 2/20 0.30
CYP3A4 P08684 1/20 0.30
CYP2C9 P11712 1/20 0.30
CYP2C19 P33261 1/20 0.30
KMT2A Q03164 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19052029 0.97 LMNA (0.30) LMNA
SCHEMBL19052022 0.84 LMNA (0.30) LMNAPOLBGAA
Hydrochloric Acid SCHEMBL7772072 0.68 LMNA (0.33) LMNAALDH1A1SMN1; SMN2CYP3A4CYP2C9
SCHEMBL19062360 0.67 SLC18A3 (0.31) ALDH1A1
SCHEMBL2230403 0.65 ABCB1 (0.32)
SCHEMBL31460120 0.65 CYP2D6 (0.36) LMNAALDH1A1SMN1; SMN2CYP3A4CYP2C9
SCHEMBL19062351 0.63
SCHEMBL8594895 0.63 PHGDH (0.33) POLBALDH1A1SMN1; SMN2CYP3A4CYP2C9
SCHEMBL962787 0.62 HTR6 (0.31) KMT2A
SCHEMBL758867 0.62 HTR6 (0.35) ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11720020-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-08-08 US disclosed
US-20180081266-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-03-22 US disclosed
US-20180081267-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-03-22 US disclosed
US-9897914-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-02-20 US disclosed
US-20170184963-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-06-29 US disclosed