SCHEMBL198037

SCHEMBL198037

CC(=O)OC(C)COC(F)(F)F

nearest known ligand 0.45

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.45
CHRM2 P08172 1/20 0.45
CHRM4 P08173 1/20 0.45
CHRM1 P11229 1/20 0.45
TBXA2R P21731 1/20 0.45
GALR3 O60755 1/20 0.44
MAPT P10636 1/20 0.44
BLM P54132 1/20 0.44
SMN1; SMN2 Q16637 1/20 0.44
TDP1 Q9NUW8 1/20 0.38
ALOX15 P16050 1/20 0.33
TRPV1 Q8NER1 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL24405017 0.86 TSHR (0.44) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL29233660 0.82 LMNA (0.47) TSHRCHRM2CHRM4CHRM1MAPT
SCHEMBL29233662 0.82 LMNA (0.47) TSHRCHRM2CHRM4CHRM1MAPT
SCHEMBL66031 0.81 MAPK1 (0.48) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL3256468 0.81 MAPK1 (0.48) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL28051942 0.76 TSHR (0.42) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL29233758 0.76 POLB (0.32)
SCHEMBL2355051 0.75 TSHR (0.54) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL28180034 0.75 TSHR (0.41) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL26454936 0.74 TSHR (0.48) TSHRCHRM2CHRM4CHRM1TBXA2R

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 111 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240043593-A1 Fluorine-Containing Polymer CENTRAL GLASS COMPANY, LIMITED (JP) 2024-02-08 US disclosed
CN-116848162-A Fluorine-containing polymer 中央硝子株式会社 2023-10-03 CN disclosed
WO-2022124183-A1 FLUORINE-CONTAINING POLYMER セントラル硝子株式会社 2022-06-16 WO disclosed
US-9086628-B2 Resist protective film-forming composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-21 US disclosed
US-8933251-B2 Fluorinated monomer of cyclic acetal structure, polymer, resist protective coating composition, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-01-13 US disclosed
US-20130231491-A1 FLUORINATED MONOMER OF CYCLIC ACETAL STRUCTURE, POLYMER, RESIST PROTECTIVE COATING COMPOSITION, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-09-05 US disclosed
US-8431323-B2 Fluorinated monomer of cyclic acetal structure, polymer, resist protective coating composition, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-04-30 US disclosed
US-20130084517-A1 RESIST PROTECTIVE FILM-FORMING COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-04-04 US disclosed
US-8361703-B2 Resist protective coating composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-29 US disclosed
US-8323872-B2 Resist protective coating material and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-12-04 US disclosed
US-20030008231-A1 Polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2003-01-09 US disclosed
US-20020161148-A1 Polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-10-31 US disclosed
US-20020051935-A1 Resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD (JP) 2002-05-02 US disclosed
US-20020051936-A1 Polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-05-02 US disclosed
US-20020048724-A1 Polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-04-25 US disclosed
US-20020004569-A1 Polymer, chemically amplified resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-01-10 US disclosed
US-20010038969-A1 Novel polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. OF (JP) 2001-11-08 US disclosed
US-20010033989-A1 Novel polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-10-25 US disclosed
US-20010018162-A1 Novel polymers, chemical amplification resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-08-30 US disclosed
EP-1126322-A2 Fluorine-containing polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-08-22 EP disclosed