SCHEMBL20312438

SCHEMBL20312438

CC1OB(c2ncccn2)OC1C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL20312442 0.74 KDM4E (0.34) —
SCHEMBL20312390 0.67 HDAC8 (0.30) —
SCHEMBL1535070 0.67 LPL (0.41) —
SCHEMBL20312437 0.66 HSP90AA1 (0.32) —
SCHEMBL20312376 0.65 MAPK1 (0.30) —
SCHEMBL20312439 0.64 HSP90AA1 (0.34) —
SCHEMBL20312455 0.62 SNCA (0.33) —
SCHEMBL20312451 0.62 — —
SCHEMBL20312416 0.62 KDM4E (0.35) —
SCHEMBL20188870 0.62 NOS3 (0.32) —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10504732-B2 Impurity diffusion agent composition and method for manufacturing semiconductor substrate TOKYO OHKA KOGYO CO, LTD. (JP) 2019-12-10 — — US disclosed
US-20180182624-A1 IMPURITY DIFFUSION AGENT COMPOSITION AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE TOKYO OHKA KOGYO CO., LTD. (JP) 2018-06-28 — — US disclosed
US-20180182624-A1 IMPURITY DIFFUSION AGENT COMPOSITION AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE TOKYO OHKA KOGYO CO., LTD. (JP) 2018-06-28 — — US disclosed
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