SCHEMBL20565788

SCHEMBL20565788

O=C(O)NC(=O)C1CCCCC1

nearest known ligand 0.59

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
HDAC8 Q9BY41 1/20 0.58
HDAC6 Q9UBN7 1/20 0.58
HPGD P15428 2/20 0.48
EPHX1 P07099 1/20 0.48
CES2 O00748 1/20 0.48
CES1 P23141 1/20 0.48
ALDH1A1 P00352 5/20 0.46
TSHR P16473 3/20 0.45
MAPK1 P28482 1/20 0.45
ALOX12 P18054 2/20 0.45
HTT P42858 2/20 0.44
POLB P06746 2/20 0.44
HSD11B1 P28845 1/20 0.44
MAPT P10636 1/20 0.44
PTPN1 P18031 1/20 0.44
KDM4E B2RXH2 1/20 0.44
MEN1 O00255 1/20 0.44
GAA P10253 1/20 0.44
KMT2A Q03164 1/20 0.44
NPSR1 Q6W5P4 1/20 0.44

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19325393 1.00 HDAC8 (0.58) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL7056987 0.87 HDAC8 (0.67) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL11291275 0.78 HDAC8 (0.55) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL917236 0.78 HDAC8 (0.56) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL20427412 0.78 HDAC8 (0.56) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL23091318 0.78 MAPT (0.57) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL8332232 0.78 HDAC8 (0.56) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL20787869 0.78 HDAC8 (0.56) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL6185998 0.78 HDAC8 (0.50) HDAC8HDAC6HPGDEPHX1CES2
SCHEMBL11117455 0.76 CES2 (0.44) HDAC8HDAC6HPGDEPHX1CES2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 27 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4597225-A1 FILM PRODUCTION METHOD, PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT PRODUCTION METHOD, CURED PRODUCT, AND LAMINATE FUJIFILM Corporation (JP) 2025-08-06 EP disclosed
CN-119998728-A Film manufacturing method, photosensitive resin composition, cured product manufacturing method, cured product, and laminate 富士胶片株式会社 2025-05-13 CN disclosed
US-20240329525-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-10-03 US disclosed
CN-114981360-B Curable resin composition, cured film, laminate, method for producing cured film, and semiconductor device 富士胶片株式会社 2024-09-10 CN disclosed
US-20240210827-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-06-27 US disclosed
WO-2024070963-A1 FILM PRODUCTION METHOD, PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT PRODUCTION METHOD, CURED PRODUCT, AND LAMINATE 富士フイルム株式会社 2024-04-04 WO disclosed
EP-4317287-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT, LAMINATE, METHOD FOR PRODUCING CURED PRODUCT, AND SEMICONDUCTOR DEVICE FUJIFILM Corporation (JP) 2024-02-07 EP disclosed
CN-117099045-A Negative photosensitive resin composition, cured product, laminate, method for producing cured product, and semiconductor device 富士胶片株式会社 2023-11-21 CN disclosed
CN-113820920-B Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2023-07-04 CN disclosed
CN-115185157-A Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2022-10-14 CN disclosed
WO-2021132578-A1 CURABLE RESIN COMPOSITION, CURED FILM, LAYERED PRODUCT, METHOD FOR PRODUCING CURED FILM, AND SEMICONDUCTOR DEVICE 富士フイルム株式会社 2021-07-01 WO disclosed
US-20200409263-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2020-12-31 US disclosed
US-10831101-B2 Photosensitive resin composition, method for manufacturing cured relief pattern, and semiconductor apparatus ASAHI KASEI KABUSHIKI KAISHA (JP) 2020-11-10 US disclosed
WO-2020143198-A1 KETAMINE DERIVATIVES AND COMPOSITIONS THEREOF XW LABORATORIES INC. (KY) 2020-07-16 WO disclosed
US-10354932-B2 Semiconductor device including semiconductor element and redistribution layer electrically connected thereto, and method of manufacturing the device ASAHI KASEI KABUSHIKI KAISHA (JP) 2019-07-16 US disclosed
US-20190113845-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2019-04-18 US disclosed
US-20180342432-A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE DEVICE ASAHI KASEI KABUSHIKI KAISHA (JP) 2018-11-29 US disclosed
CN-107850844-A Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2018-03-27 CN disclosed
CN-100549828-C Positive photosensitive resin composition ASAHI KASEI EMD CORP (JP) 2009-10-14 CN disclosed
CN-1820228-A Positive photosensitive resin composition ASAHI KASEI EMD CORP (JP) 2006-08-16 CN disclosed