SCHEMBL2084359

SCHEMBL2084359

C[CH]OCCOC12CC3CC(CC(C3)C1)C2

nearest known ligand 0.37

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 6/20 0.37
MEN1 O00255 3/20 0.37
KMT2A Q03164 3/20 0.37
NPSR1 Q6W5P4 2/20 0.37
HTT P42858 2/20 0.37
LMNA P02545 4/20 0.34
SMN1; SMN2 Q16637 4/20 0.33
TSHR P16473 2/20 0.33
CYP1A2 P05177 2/20 0.33
CYP2C9 P11712 2/20 0.33
CYP2C19 P33261 2/20 0.33
CYP3A4 P08684 1/20 0.33
KDM4E B2RXH2 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8490706 0.80 ALDH1A1 (0.34) ALDH1A1MEN1KMT2ANPSR1HTT
SCHEMBL6739715 0.79 ALDH1A1 (0.39) ALDH1A1MEN1KMT2ANPSR1HTT
SCHEMBL12687776 0.77 ALDH1A1 (0.35) ALDH1A1MEN1KMT2ANPSR1HTT
SCHEMBL19798444 0.77 NPSR1 (0.43) ALDH1A1MEN1KMT2ANPSR1HTT
SCHEMBL482480 0.76 ALDH1A1 (0.41) ALDH1A1MEN1KMT2ANPSR1HTT
Ammonia Solution, Strong SCHEMBL11635039 0.74 ALDH1A1 (0.41) ALDH1A1MEN1KMT2ANPSR1HTT
SCHEMBL2084363 0.73 EPHX2 (0.43) ALDH1A1MEN1KMT2ANPSR1HTT
SCHEMBL5917722 0.73 CA12 (0.46) ALDH1A1MEN1KMT2ALMNA
SCHEMBL15533591 0.72 EPHX2 (0.45) ALDH1A1MEN1KMT2ANPSR1HTT
SCHEMBL25753188 0.72 EPHX2 (0.45) ALDH1A1MEN1KMT2ANPSR1HTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 52 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-106019830-B Resist composition and method for producing resist pattern 住友化学株式会社 2021-08-20 CN claimed
US-20150301452-A1 PHOTORESIST COMPOSITION AND METHOD OF FABRICATING DISPLAY SUBSTRATE USING THE SAME SAMSUNG DISPLAY CO., LTD. (KR) 2015-10-22 US claimed
CN-118011733-A Positive photosensitive resin composition, resist film, resist underlayer film, and resist permanent film DIC株式会社 2024-05-10 CN disclosed
CN-106019830-B Resist composition and method for producing resist pattern 住友化学株式会社 2021-08-20 CN disclosed
CN-107207456-B Latent acids and their use 巴斯夫欧洲公司 2021-05-04 CN disclosed
US-9946157-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-04-17 US disclosed
US-20160291464-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 US disclosed
US-20150301452-A1 PHOTORESIST COMPOSITION AND METHOD OF FABRICATING DISPLAY SUBSTRATE USING THE SAME SAMSUNG DISPLAY CO., LTD. (KR) 2015-10-22 US disclosed
US-8431325-B2 Compound, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-04-30 US disclosed
US-7972763-B2 Patterns having high resolution; used for semiconductor microfabrication employing a lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-07-05 US disclosed
US-20110053086-A1 COMPOUND, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY,LIMITED (JP) 2011-03-03 US disclosed
US-20020187421-A1 Method of producing photoresist SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2002-12-12 US disclosed
US-20020164540-A1 Chemical amplifying type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2002-11-07 US disclosed
US-20020155376-A1 Mixture of radiation sensive compound and binder; fluoropolymers SUMITOMO CHEMICAL COMPANY LIMITED (JP) 2002-10-24 US disclosed
US-20020081524-A1 Chemical amplifying type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2002-06-27 US disclosed
US-20020012874-A1 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2002-01-31 US disclosed
US-20010016298-A1 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2001-08-23 US disclosed
EP-1122604-A2 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2001-08-08 EP disclosed
EP-0856773-B1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL CO (JP) 2001-06-13 EP disclosed
EP-0856773-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 1998-08-05 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20110053086-A1 COMPOUND, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN OR10J3, C1R, C9 ALDH1A1 2546/4885MEN1 4120/4885KMT2A 1336/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.