SCHEMBL211850

SCHEMBL211850

C[CH]OC1CCCCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL609096 1.00 CA1 (0.33)
SCHEMBL607692 1.00 CA1 (0.33)
SCHEMBL436662 0.97
SCHEMBL126941 0.91
SCHEMBL128481 0.84
SCHEMBL3942982 0.78 ACHE (0.31)
SCHEMBL1475814 0.78 ACHE (0.31)
SCHEMBL4030169 0.78 ACHE (0.31)
SCHEMBL15227532 0.78 ACHE (0.31)
SCHEMBL1475813 0.78 ACHE (0.31)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 2026 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-114516815-A Controllable defluorination deuteration method for polyfluoroamide 中国科学技术大学 2022-05-20 CN claimed
CN-106019830-B Resist composition and method for producing resist pattern 住友化学株式会社 2021-08-20 CN claimed
CN-108368214-B Novolac resin and resist film DIC株式会社 2021-03-23 CN claimed
CN-108008600-B Radiation-sensitive composition 三菱瓦斯化学株式会社 2021-02-09 CN claimed
CN-112180680-A Radical-cation hybrid photocurable composition and photosensitive dry film resist 四川乐凯新材料有限公司 2021-01-05 CN claimed
CN-112147843-A Cationic photocurable composition and photosensitive dry film resist 四川乐凯新材料有限公司 2020-12-29 CN claimed
EP-2955575-B1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND POLYPHENOL DERIVATIVE USED IN SAME MITSUBISHI GAS CHEMICAL CO (JP) 2020-07-29 EP claimed
CN-104281006-B Radiation-ray sensitive composition 三菱瓦斯化学株式会社 2019-01-22 CN claimed
US-9946157-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-04-17 US claimed
US-20160291464-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-10-06 US claimed
US-6403288-B1 COATING WITH COPOLYMER COMPRISING HYDROXYSTYRENE DERIVATIVE MONOMER HAVING ACID DISSOCIABLE GROUP; EXPOSURE TO RADIATION; DEVELOPMENT JSR CORPORATION (JP) 2002-06-11 US claimed
US-6369279-B1 STYRENE WITH ETHER OR FLUORINE GROUPS FOR POLYMERS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-04-09 US claimed
US-6210856-B1 Resist composition and process of forming a patterned resist layer on a substrate INTERNATIONAL BUSINESS MACHINES CORPORATION 2001-04-03 US claimed
US-6103447-A Approach to formulating irradiation sensitive positive resists INTERNATIONAL BUSINESS MACHINES CORP. (US) 2000-08-15 US claimed
US-5856561-A Bisphenol carboxylic acid tertiary ester derivatives and chemically amplified positive resist compositions SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-01-05 US claimed
US-4749761-A FOR CONTACT LENSES-CROSSLINKED COPOLYMER OF N-VINYL-2-PYRROLIDONE AND ACRYLIC ESTER SMITH & NEPHEW ASSOCIATED COMPANIES P.L.C. (GB) 1988-06-07 US claimed
EP-0039060-B1 A NEW METHOD FOR PREPARATION OF ANTHRACYCLINE DERIVATIVES Zaidanhojin Biseibutsu Kagaku Kenkyukai (JP) 1986-08-06 EP claimed
US-4360664-A ANTITUMOR AGENT, ANTIBIOTIC ZAIDAN HOJIN BISEIBUTSU KAGAKU KENKYU KAI (JP) 1982-11-23 US claimed
US-4303785-A ETHERS OF ADRIAMYCIN AND DAUNORUBICIN ZAIDAN HOJIN BISEIBUTSU KAGAKU KENKYU KAI (JP) 1981-12-01 US claimed
EP-0039060-A1 A new method for preparation of anthracycline derivatives Zaidanhojin Biseibutsu Kagaku Kenkyukai (JP) 1981-11-04 EP claimed