Methacrylic Acid

Methacrylic Acid

SCHEMBL212354

C=C(C)C(=O)O.O=C1CCCO1

nearest known ligand 0.52

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Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
CA1 P00915 1/20 0.52
CA9 Q16790 1/20 0.52
LMNA P02545 2/20 0.39
ALDH1A1 P00352 1/20 0.39
TP53 P04637 1/20 0.39
TSHR P16473 1/20 0.39
CYP2C9 P11712 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Methacrylic Acid SCHEMBL29728225 0.94 CA1 (0.61) CA1CA9LMNAALDH1A1TP53
Methacrylic Acid SCHEMBL5815522 0.92 CA1 (0.59) CA1CA9LMNAALDH1A1TP53
Methacrylic Acid SCHEMBL36254 0.92 CA1 (0.59) CA1CA9LMNAALDH1A1TP53
Methacrylic Acid SCHEMBL326715 0.92 CA1 (0.59) CA1CA9LMNAALDH1A1TP53
Methacrylic Acid SCHEMBL4068636 0.91 CA1 (0.57) CA1CA9LMNAALDH1A1TP53
Butyrolactone SCHEMBL10999881 0.87 CA1 (0.61) CA1CA9LMNAALDH1A1TP53
Methacrylic Acid SCHEMBL1415156 0.87 LMNA (0.52) CA1CA9LMNAALDH1A1TP53
Methacrylic Acid SCHEMBL28002670 0.86 CA1 (0.52) CA1CA9LMNAALDH1A1TP53
Methacrylic Acid SCHEMBL15496 0.86 CA1 (0.52) CA1CA9LMNAALDH1A1TP53
Butyrolactone SCHEMBL7650673 0.85 CA1 (0.64) CA1CA9LMNAALDH1A1TP53

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 929 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-120137111-A Composition for 3D ink-jet printing and preparation method and application thereof 珠海赛纳三维科技有限公司 2025-06-13 CN claimed
CN-119798525-A Resin for immersion photoresist, preparation method and immersion photoresist 宁波南大光电材料有限公司 2025-04-11 CN claimed
CN-119798524-A Resin for immersion type ArF photoresist, preparation method and immersion type ArF photoresist 宁波南大光电材料有限公司 2025-04-11 CN claimed
CN-116162186-B Acid generator based on polystyrene sulfonium salt and photoresist composition thereof 中国科学院理化技术研究所 2025-04-11 CN claimed
CN-115542665-B Positive chemical amplification type photoresist and application method thereof 徐州博康信息化学品有限公司 2025-03-07 CN claimed
CN-119264321-A Method for regulating and controlling molecular weight change of electronic grade acrylic resin 厦门大学 2025-01-07 CN claimed
CN-118165261-A Preparation method of high-viscosity photoresist resin 明士新材料有限公司 2024-06-11 CN claimed
CN-117304413-A Composition for three-dimensional printing of biocompatible object, printing method and device 珠海赛纳三维科技有限公司 2023-12-29 CN claimed
CN-116162186-A Acid generator based on polystyrene sulfonium salt and photoresist composition thereof 中国科学院理化技术研究所 2023-05-26 CN claimed
CN-116003702-A 3D printing resin and application 深圳市纵维立方科技有限公司 2023-04-25 CN claimed
CN-102627887-A Photopolymerizable inkjet black ink, and ink cartridge, inkjet printer and printed material using the ink, and method of preparing the ink RICOH KK 2012-08-08 CN claimed
US-20120147103-A1 ULTRAVIOLET CROSSLINKING INKJET INK, INK CARTRIDGE CONTAINING SAME, AND IMAGE FORMING METHOD AND APPARATUS USING SAME RICOH COMPANY, LTD. (JP) 2012-06-14 US claimed
US-20120103935-A1 METHOD FOR IMPROVING SELF-ASSEMBLED POLYMER FEATURES JSR CORPORATION (JP) 2012-05-03 US claimed
EP-1664927-B1 LOW-POLYDISPERSITY PHOTOIMAGEABLE ACRYLIC POLYMERS, PHOTORESISTS AND PROCESSES FOR MICROLITHOGRAPHY COMMW SCIENT IND RES ORG (AU) 2011-04-06 EP claimed
US-20090214823-A1 METHODS FOR ALIGNING POLYMER FILMS AND RELATED STRUCTURES INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-08-27 US claimed
EP-1766474-A2 PHOTOACTIVE COMPOUNDS AZ Electronic Materials USA Corp. (US) 2007-03-28 EP claimed
WO-2005121894-A2 PHOTOACTIVE COMPOUNDS AZ ELECTRONICS MATERIALS USA CORP. (DE) 2005-12-22 WO claimed
US-20050271974-A1 Photoactive compounds AZ ELECTRONIC MATERIALS USA CORP. 2005-12-08 US claimed
US-6902859-B2 Chemically amplified resist composition and method for forming patterned film using same FUJITSU LIMITED (JP) 2005-06-07 US claimed
US-20020150834-A1 Chemically amplified resist composition and method for forming patterned film using same FUJITSU LIMITED (JP) 2002-10-17 US claimed