SCHEMBL21396856

SCHEMBL21396856

O=C1OCCCC1OC(=O)C(F)S(=O)(=O)O

nearest known ligand 0.37

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 3/20 0.37
HPGD P15428 2/20 0.37
POLB P06746 3/20 0.36
KDM4E B2RXH2 4/20 0.34
HSD17B10 Q99714 1/20 0.34
SMN1; SMN2 Q16637 3/20 0.34
TDP1 Q9NUW8 2/20 0.34
CASP6 P55212 1/20 0.32
MAPK1 P28482 1/20 0.32
CYP1A2 P05177 1/20 0.32
CYP2C19 P33261 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12256177 0.83 POLB (0.40) ALDH1A1HPGDPOLBKDM4EHSD17B10
SCHEMBL12705158 0.79 POLB (0.40) ALDH1A1HPGDPOLBKDM4EHSD17B10
SCHEMBL686593 0.74 ALDH1A1 (0.37) ALDH1A1HPGDPOLBKDM4EHSD17B10
SCHEMBL12256175 0.73 POLB (0.49) ALDH1A1HPGDPOLBKDM4EHSD17B10
SCHEMBL12705400 0.73 MAPK1 (0.38) ALDH1A1HPGDPOLBKDM4EHSD17B10
SCHEMBL18748723 0.72 KDM4E (0.43) ALDH1A1HPGDPOLBKDM4EHSD17B10
SCHEMBL14015365 0.72 ALDH1A1 (0.35) ALDH1A1HPGDPOLBKDM4ESMN1; SMN2
SCHEMBL28658121 0.72 POLB (0.40) ALDH1A1HPGDPOLBKDM4EHSD17B10
SCHEMBL15858404 0.71
SCHEMBL21398822 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12032290-B2 Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2024-07-09 US disclosed
US-20210318616-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2021-10-14 US disclosed
US-20190294042-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2019-09-26 US disclosed