SCHEMBL2315545

SCHEMBL2315545

O=C(c1cccc(O)c1)c1c(O)cc(O)cc1O

nearest known ligand 0.65

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
FASN P49327 2/20 0.65
CA12 O43570 1/20 0.57
CA1 P00915 1/20 0.57
CA2 P00918 1/20 0.57
CA6 P23280 1/20 0.57
CA9 Q16790 1/20 0.57
DYRK1A Q13627 3/20 0.56
CLK1 P49759 2/20 0.56
DYRK1B Q9Y463 2/20 0.56
PARP1 P09874 1/20 0.55
KDM4E B2RXH2 2/20 0.52
EGLN2 Q96KS0 1/20 0.52
HSD17B1 P14061 6/20 0.51
HSD17B2 P37059 5/20 0.51
STS P08842 1/20 0.51
ALDH1A1 P00352 1/20 0.50
CYP2C19 P33261 1/20 0.49
CHRNA7 P36544 2/20 0.49
MEN1 O00255 1/20 0.48
USP2 O75604 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6847967 0.91 FASN (0.64) FASNCA12CA1CA2CA6
SCHEMBL8861241 0.89 FASN (0.66) FASNCA12CA1CA2CA6
SCHEMBL809540 0.84 FASN (0.76) FASNCA12CA1CA2CA6
SCHEMBL29699163 0.84 FASN (0.76) FASNCA12CA1CA2CA6
SCHEMBL353943 0.83 FASN (0.64) FASNDYRK1ACLK1DYRK1BPARP1
SCHEMBL8861197 0.83 FASN (0.74) FASNCA12CA1CA2CA6
SCHEMBL21935597 0.82 FASN (0.68) FASNCA12CA1CA2CA6
SCHEMBL8535254 0.81 FASN (0.66) FASNCA12CA1CA2CA6
SCHEMBL21936712 0.81 FASN (0.66) FASNCA12CA1CA2CA6
SCHEMBL9638514 0.80 FASN (0.60) FASNCA12CA1CA2CA9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 45 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-101355056-B Method for manufacturing thin film transistor substrate and photosensitive composition used in the substrate SAMSUNG DISPLAY CO LTD 2014-02-26 CN claimed
CN-120158100-A Preparation method of high-temperature-resistant corrosion-resistant alloy rubber 上海焦能新材料有限公司 2025-06-17 CN disclosed
CN-117986663-A High-temperature-resistant corrosion-resistant alloy rubber and preparation method thereof 上海焦能新材料有限公司 2024-05-07 CN disclosed
CN-108732868-B Positive resist film laminate and pattern forming method 信越化学工业株式会社 2022-12-13 CN disclosed
US-10719015-B2 Positive resist film laminate and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2020-07-21 US disclosed
WO-2020142450-A1 POLYMER COMPOSITIONS COMPRISING COMPOUNDS DERIVED FROM BIOLOGY ZYMERGEN INC. (US) 2020-07-09 WO disclosed
EP-3392708-B1 POSITIVE RESIST FILM LAMINATE AND PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2020-03-18 EP disclosed
US-20180312886-A1 MICROBIAL PRODUCTION OF CHEMICAL PRODUCTS AND RELATED COMPOSITIONS, METHODS AND SYSTEMS CARGILL INC (US) 2018-11-01 US disclosed
US-20180312887-A1 MICROBIAL PRODUCTION OF CHEMICAL PRODUCTS AND RELATED COMPOSITIONS, METHODS AND SYSTEMS CARGILL INC (US) 2018-11-01 US disclosed
EP-3392708-A1 POSITIVE RESIST FILM LAMINATE AND PATTERN FORMING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2018-10-24 EP disclosed
EP-0369219-A1 Light-sensitive compounds, preparation of a light-sensitive mixture therewith and a recording material HOECHST AKTIENGESELLSCHAFT (DE) 1990-05-23 EP disclosed
US-4902785-A Phenolic photosensitizers containing quinone diazide and acidic halide substituents HOECHST CELANESE CORPORATION (US) 1990-02-20 US disclosed
US-4892801-A PHOTORESISTS HOECHST CELANESE CORPORATION (US) 1990-01-09 US disclosed
US-4863827-A O-QUINONE DIAZIDE AMERICAN HOECHST CORPORATION (US) 1989-09-05 US disclosed
EP-0264845-A2 Multilayer positive-registration material HOECHST CELANESE CORPORATION (US) 1988-04-27 EP disclosed
US-4732836-A SOLUTION STABILITY PHENOLIC COMPOUNDS CONDENSED WITH QUINONES HOECHST CELANESE CORPORATION (US) 1988-03-22 US disclosed
US-4732837-A Novel mixed ester O-quinone photosensitizers HOECHST CELANESE CORPORATION (US) 1988-03-22 US disclosed
EP-0244763-A2 Positive-working photosensitive composition and photosensitive recording material prepared therefrom HOECHST CELANESE CORPORATION (US) 1987-11-11 EP disclosed
EP-0244762-A2 Photosensitive positive composition and photosensitive registration material prepared therefrom HOECHST CELANESE CORPORATION (US) 1987-11-11 EP disclosed
EP-0243964-A2 Photosensitive positive composition and photosensitive registration material prepared therefrom HOECHST CELANESE CORPORATION (US) 1987-11-04 EP disclosed