SCHEMBL2334101

SCHEMBL2334101

C=C(C)c1ccccc1OC(C)(C)C

nearest known ligand 0.40

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ADRA2A P08913 1/20 0.40
ADRA2B P18089 1/20 0.40
ADRA2C P18825 1/20 0.40
ELANE P08246 2/20 0.38
KDM4E B2RXH2 5/20 0.36
HSD17B10 Q99714 4/20 0.36
ALDH1A1 P00352 3/20 0.36
TDP1 Q9NUW8 2/20 0.36
HPGD P15428 2/20 0.36
ESR1 P03372 1/20 0.36
ITGB3 P05106 1/20 0.36
ITGA2B P08514 1/20 0.36
HMGB1 P09429 1/20 0.36
TSHR P16473 1/20 0.36
GGT1 P19440 1/20 0.36
PTGS1 P23219 1/20 0.36
PTGS2 P35354 1/20 0.36
BLM P54132 1/20 0.36
NAPRT Q6XQN6 1/20 0.36
LMNA P02545 3/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19635599 0.82 KCNK3 (0.46) ADRA2AADRA2BADRA2CALDH1A1KCNK3
SCHEMBL30526883 0.80 LMNA (0.53) ELANEKDM4EHSD17B10ALDH1A1TDP1
SCHEMBL8260079 0.80 LMNA (0.53) ELANEKDM4EHSD17B10ALDH1A1TDP1
SCHEMBL7188551 0.79 HTT (0.47) ADRA2AADRA2BADRA2CELANEKDM4E
SCHEMBL31093097 0.77 CA1 (0.52) TSHRLMNASMN1; SMN2KCNK3KCNK9
SCHEMBL1433789 0.77 CA1 (0.52) TSHRLMNASMN1; SMN2KCNK3KCNK9
SCHEMBL27476404 0.77 ADRA2A (0.43) ADRA2AADRA2BADRA2CELANEKDM4E
SCHEMBL282647 0.76 KDM4E (0.58) ELANEKDM4EHSD17B10ALDH1A1TDP1
SCHEMBL2154712 0.76 ELANE (0.46) ELANEKDM4EHSD17B10ALDH1A1TDP1
SCHEMBL7861711 0.75 KDM4E (0.46) ADRA2AADRA2BADRA2CELANEKDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 15 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6465150-B1 COMPRISING AN AROMATIC SULFONIC ACID ONIUM SALT COMPOUND ACID GENERATOR, FOR EXAMPLE, 2,4-DIFLUOROBENZENESULFONIC ACID ANION AND AN ONIUM CATION OF SULFUR OR IODONIUM, AND A COPOLYMER REPRESENTED BY 4-HYDROXYSTYRENE/4-T-BUTOXYSTYRENE COPOLYMER JSR CORPORATION (JP) 2002-10-15 US claimed
US-5352564-A Copolymer of styrene derivatives, an acid release agent and a dissolution inhibitor containing an unstable acid group SHIN-ETSU CHEMICAL CO., LTD. (JP) 1994-10-04 US claimed
WO-2024020780-A1 STAR-SHAPED POLYMER, PAINT, COATING, AND METHOD FOR PRODUCING STAR-SHAPED POLYMER DIC CORPORATION (JP) 2024-02-01 WO disclosed
WO-2022236548-A1 STAR POLYMER, COATING MATERIAL, COATING FILM, AND METHOD FOR PRODUCING STAR POLYMER DIC CORPORATION (JP) 2022-11-17 WO disclosed
CN-104822714-B The manufacture method of polymer 日本曹达株式会社 2017-10-13 CN disclosed
US-8206888-B2 Radiation-sensitive resin composition JSR CORPORATION (JP) 2012-06-26 US disclosed
US-20110198730-A1 HYPERBRANCHED POLYMER SYNTHESIZING METHOD, HYPERBRANCHED POLYMER, RESIST COMPOSITION, SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT FABRICATION METHOD LION CORPORATION 2011-08-18 US disclosed
US-20100028800-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2010-02-04 US disclosed
EP-1953593-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR Corporation (JP) 2008-08-06 EP disclosed
US-20080160449-A1 Photoresist polymer having nano-smoothness and etching resistance, and resist composition LION CORPORATION (JP) 2008-07-03 US disclosed
US-6465150-B1 COMPRISING AN AROMATIC SULFONIC ACID ONIUM SALT COMPOUND ACID GENERATOR, FOR EXAMPLE, 2,4-DIFLUOROBENZENESULFONIC ACID ANION AND AN ONIUM CATION OF SULFUR OR IODONIUM, AND A COPOLYMER REPRESENTED BY 4-HYDROXYSTYRENE/4-T-BUTOXYSTYRENE COPOLYMER JSR CORPORATION (JP) 2002-10-15 US disclosed
US-6235446-B1 MIXTURE OF P-HYDROXYSTYRENE, ACRYLATED ESTER JSR CORPORATION (JP) 2001-05-22 US disclosed
EP-0284868-B1 Photoresist compositions MICROSI INC (US) 1995-05-03 EP disclosed
US-5352564-A Copolymer of styrene derivatives, an acid release agent and a dissolution inhibitor containing an unstable acid group SHIN-ETSU CHEMICAL CO., LTD. (JP) 1994-10-04 US disclosed
EP-0284868-A2 Photoresist compositions MicroSi, Inc. (a Delaware corporation) (US) 1988-10-05 EP disclosed