SCHEMBL23909598

SCHEMBL23909598

N#Cc1ccc2c(S(N)(=O)=O)cccc2c1

nearest known ligand 0.56

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
CA2 P00918 7/20 0.56
CA1 P00915 6/20 0.56
CA9 Q16790 4/20 0.56
ATIC P31939 1/20 0.48
PTGES2 Q9H7Z7 3/20 0.44
CDK2 P24941 1/20 0.42
CA12 O43570 1/20 0.41
SLC6A4 P31645 5/20 0.40
SLC6A2 P23975 1/20 0.39
SLC6A3 Q01959 1/20 0.39
MAPK1 P28482 1/20 0.39
CA13 Q8N1Q1 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL23909576 0.87 CA1 (0.56) CA2CA1CA9ATICPTGES2
SCHEMBL12212871 0.85 CA1 (0.51) CA2CA1CA9ATICSLC6A4
SCHEMBL23909530 0.84 CA1 (0.54) CA2CA1CA9SLC6A4SLC6A2
SCHEMBL1346003 0.76 CA2 (0.63) CA2CA1CA9ATICCDK2
SCHEMBL1805507 0.76 CA2 (0.63) CA2CA1CA9ATICCDK2
SCHEMBL30440356 0.76 CA2 (0.63) CA2CA1CA9ATICCDK2
SCHEMBL1805508 0.75 CA2 (0.61) CA2CA1CA9ATICCDK2
SCHEMBL1807861 0.75 CA2 (0.61) CA2CA1CA9ATICCDK2
SCHEMBL12212866 0.74 CA1 (0.50) CA2CA1CA9ATICCDK2
SCHEMBL5092282 0.74 CA1 (0.53) CA2CA1SLC6A4SLC6A2SLC6A3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-113527680-B Polymer, photosensitive resin composition, pattern forming method, cured film, and electronic component 信越化学工业株式会社 2023-04-28 CN disclosed
EP-3896521-B1 POLYMER, PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING METHOD, METHOD OF FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT SHINETSU CHEMICAL CO (JP) 2022-12-14 EP disclosed
US-11333975-B2 Polymer, photosensitive resin composition, patterning method, method of forming cured film, interlayer insulating film, surface protective film, and electronic component INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2022-05-17 US disclosed
CN-113527680-A Polymer, photosensitive resin composition, pattern forming method, cured film, and electronic component 信越化学工业株式会社 2021-10-22 CN disclosed
EP-3896521-A1 POLYMER, PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING METHOD, METHOD OF FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT Shin-Etsu Chemical Co., Ltd. (JP) 2021-10-20 EP disclosed
US-20210317268-A1 POLYMER, PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING METHOD, METHOD OF FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT SHIN-ETSU CHEMICAL CO., LTD. (JP) 2021-10-14 US disclosed