SCHEMBL2619047

SCHEMBL2619047

C=C(C)C(=O)OCc1ccc2ccccc2c1

nearest known ligand 0.47

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TACR1 P25103 1/20 0.47
CYP1A2 P05177 2/20 0.46
SLC1A3 P43003 1/20 0.46
SLC1A2 P43004 1/20 0.46
SLC1A1 P43005 1/20 0.46
CYP2A6 P11509 1/20 0.44
RAB9A P51151 1/20 0.43
CACNA1B Q00975 1/20 0.43
ALDH1A1 P00352 1/20 0.42
L3MBTL1 Q9Y468 1/20 0.42
MAOB P27338 1/20 0.41
ALOX5 P09917 1/20 0.41
CTSL P07711 1/20 0.41
CTSB P07858 1/20 0.41
CTSS P25774 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29503697 1.00 TACR1 (0.47) TACR1CYP1A2SLC1A3SLC1A2SLC1A1
SCHEMBL11145716 0.95 TACR1 (0.43) TACR1CYP1A2SLC1A3SLC1A2SLC1A1
SCHEMBL15020207 0.95 TACR1 (0.43) TACR1CYP1A2SLC1A3SLC1A2SLC1A1
SCHEMBL15020074 0.95 TACR1 (0.43) TACR1CYP1A2SLC1A3SLC1A2SLC1A1
SCHEMBL1324374 0.94 CA2 (0.43) TACR1CYP1A2SLC1A3SLC1A2SLC1A1
SCHEMBL1323726 0.88 CA2 (0.40) TACR1CYP1A2RAB9AALDH1A1
SCHEMBL908789 0.88 CA2 (0.40) TACR1CYP1A2SLC1A3SLC1A2SLC1A1
SCHEMBL28936084 0.87 CYP1A2 (0.54) TACR1CYP1A2SLC1A3SLC1A2SLC1A1
SCHEMBL29503741 0.87 CYP1A2 (0.50) TACR1CYP1A2ALDH1A1L3MBTL1
SCHEMBL13609729 0.87 CYP1A2 (0.50) TACR1CYP1A2ALDH1A1L3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 112 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250243389-A1 COMPOSITION COMPRISING ADDITIVE HAVING A POLYCYCLIC AROMATIC GROUP E INK CORPORATION 2025-07-31 US claimed
CN-106886127-A Photoimprint resin composition, photoimprint resin film, and patterning process 财团法人工业技术研究院 2017-06-23 CN claimed
CN-105493236-A Curable composition for photoimprint and method for producing film, optical component, circuit board or electronic component using the same CANON KK 2016-04-13 CN claimed
CN-101880352-A Be used for multipolymer, its preparation method of gap filling material composition and be used for the gap filling material composition of antireflecting coating KOREA KUMHO PETROCHEM CO LTD 2010-11-10 CN claimed
WO-2007110387-A1 PHOTO-CURABLE RESINS AND RESIN COMPOSITIONS WITH VERY HIGH REFRACTIVE INDICES FOR APPLICATION IN PLASIC OPTICS SEEREAL TECHNOLOGIES S.A. (DE) 2007-10-04 WO claimed
EP-1840652-A1 Photo-curable resins and resin compositions with very high refractive indices for application in plastic optics SeeReal Technologies S.A. (LU) 2007-10-03 EP claimed
US-20250243389-A1 COMPOSITION COMPRISING ADDITIVE HAVING A POLYCYCLIC AROMATIC GROUP E INK CORPORATION 2025-07-31 US disclosed
US-11822248-B2 Coating compositions for use with an overcoated photoresist ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2023-11-21 US disclosed
US-11762292-B2 Coating compositions for use with an overcoated photoresist ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2023-09-19 US disclosed
EP-4214247-A1 COMPOSITION COMPRISING ADDITIVE HAVING A POLYCYCLIC AROMATIC GROUP E Ink Corporation (US) 2023-07-26 EP disclosed
CN-115989251-A Composition comprising an additive having polycyclic aromatic groups 伊英克公司 2023-04-18 CN disclosed
US-20220081596-A1 COMPOSITION COMPRISING ADDITIVE HAVING A POLYCYCLIC AROMATIC GROUP E INK CORPORATION 2022-03-17 US disclosed
US-20210047449-A1 COPOLYMER AND COLORED RESIN COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-02-18 US disclosed
US-7687228-B2 Antireflection film composition and patterning process using the same SHIN ETSU CHEMICAL CO., LTD. (JP) 2010-03-30 US disclosed
US-20080227037-A1 Resist lower layer film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-18 US disclosed
US-20080227037-A1 Resist lower layer film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-18 US disclosed
US-20080220381-A1 Antireflection film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-11 US disclosed
US-20080220381-A1 Antireflection film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-11 US disclosed
WO-2007110387-A1 PHOTO-CURABLE RESINS AND RESIN COMPOSITIONS WITH VERY HIGH REFRACTIVE INDICES FOR APPLICATION IN PLASIC OPTICS SEEREAL TECHNOLOGIES S.A. (DE) 2007-10-04 WO disclosed
EP-1840652-A1 Photo-curable resins and resin compositions with very high refractive indices for application in plastic optics SeeReal Technologies S.A. (LU) 2007-10-03 EP disclosed