SCHEMBL27746599

SCHEMBL27746599

CCOC(=O)C1CCCCC1N1CCOCC1

nearest known ligand 0.49

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 7/20 0.49
TSHR P16473 2/20 0.45
LMNA P02545 2/20 0.43
POLB P06746 2/20 0.43
RECQL P46063 1/20 0.42
RAB9A P51151 2/20 0.40
CYP3A4 P08684 1/20 0.40
CYP2C19 P33261 1/20 0.40
L3MBTL1 Q9Y468 1/20 0.40
LGMN Q99538 1/20 0.40
KMT2A Q03164 2/20 0.40
MAPT P10636 1/20 0.40
HPGD P15428 1/20 0.40
NPSR1 Q6W5P4 1/20 0.40
GAA P10253 1/20 0.40
SMN1; SMN2 Q16637 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL23662579 0.97 ALDH1A1 (0.46) ALDH1A1TSHRLMNAPOLBRECQL
SCHEMBL10340227 0.88 ALDH1A1 (0.46) ALDH1A1POLBRAB9AKMT2AMAPT
SCHEMBL10340224 0.88 ALDH1A1 (0.46) ALDH1A1POLBRAB9AKMT2AMAPT
SCHEMBL10340228 0.88 ALDH1A1 (0.46) ALDH1A1POLBRAB9AKMT2AMAPT
SCHEMBL12015496 0.85 ALDH1A1 (0.39) ALDH1A1TSHRPOLBRECQLCYP3A4
SCHEMBL11483634 0.83 ALDH1A1 (0.44) ALDH1A1POLBRAB9AKMT2AMAPT
SCHEMBL2098632 0.81 CHRM4 (0.45) ALDH1A1LMNAPOLBRAB9AKMT2A
SCHEMBL12017273 0.79 ALDH1A1 (0.34) ALDH1A1LMNAPOLBCYP3A4CYP2C19
SCHEMBL20193826 0.79 ALDH1A1 (0.42) ALDH1A1POLBRAB9AL3MBTL1KMT2A
SCHEMBL14296477 0.78 ALDH1A1 (0.46) ALDH1A1POLBCYP3A4CYP2C19L3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-101477307-B Photomask blank, resist pattern forming process, and photomask preparation process SHIN ETSU EHEMICAL CO LTD 2012-12-12 CN disclosed
CN-101477307-A Photomask blank, resist pattern forming process, and photomask preparation process SHINETSU CHEMICAL CO (JP) 2009-07-08 CN disclosed