Methane

Methane

SCHEMBL284453

C.CC(C)(O)C(=O)O

nearest known ligand 0.00

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⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1618313 0.96 ALDH1A1 (1.00)
SCHEMBL29373 0.96
SCHEMBL11327880 0.92
SCHEMBL8940464 0.92
SCHEMBL28402001 0.92
Ethane SCHEMBL7940564 0.92
SCHEMBL10458538 0.92 ALDH1A1 (0.92)
SCHEMBL9323495 0.92
SCHEMBL6756839 0.92
Ammonia Solution, Strong SCHEMBL1782484 0.92

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 191 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230288799-A1 METHOD OF FORMING PATTERNS SAMSUNG ELECTRONICS CO., LTD. (KR) 2023-09-14 US claimed
US-6291385-B1 Catalyst for polymerization or copolymerization of olefin SAMSUNG GENERAL CHEMICALS CO., LTD. (KR) 2001-09-18 US claimed
US-20240201591-A1 PHOTORESIST UNDERLAYER COMPOSITION DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2024-06-20 US disclosed
US-11940731-B2 Photoresist topcoat compositions and methods of processing photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2024-03-26 US disclosed
US-11932713-B2 Monomers, polymers and lithographic compositions comprising same ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2024-03-19 US disclosed
US-11874603-B2 Photoresist composition comprising amide compound and pattern formation methods using the same ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2024-01-16 US disclosed
US-20230418161-A1 COATING COMPOSITIONS FOR USE WITH AN OVERCOATED PHOTORESIST ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2023-12-28 US disclosed
US-11846885-B2 Topcoat compositions and photolithographic methods ROHM AND HAAS ELECTRONIC MATERIALS, LLC (US) 2023-12-19 US disclosed
US-11829069-B2 Photoresist compositions and methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2023-11-28 US disclosed
CN-117089418-A Substrate treatment composition and substrate treatment method using same SK株式会社 2023-11-21 CN disclosed
US-11822248-B2 Coating compositions for use with an overcoated photoresist ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2023-11-21 US disclosed
EP-2275490-A1 Coating compositions for use with an overcoated photoresist Rohm and Haas Electronic Materials, L.L.C. (US) 2011-01-19 EP disclosed
EP-2258691-A1 Coating compositions for use with an overcoated photoresist Rohm and Haas Electronic Materials, L.L.C. (US) 2010-12-08 EP disclosed
EP-2102184-A2 PHOTOACTIVE COMPOUNDS AZ Electronic Materials USA Corp. (US) 2009-09-23 EP disclosed
EP-2102156-A2 PHOTOACTIVE COMPOUNDS AZ Electronic Materials USA Corp. (US) 2009-09-23 EP disclosed
US-7582585-B2 Underlying antireflective coating employed with overcoated photoresist layer in manufacture microelectronic wafers; relief images ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2009-09-01 US disclosed
WO-2008068617-A2 PHOTOACTIVE COMPOUNDS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2008-06-12 WO disclosed
WO-2008068610-A2 PHOTOACTIVE COMPOUNDS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2008-06-12 WO disclosed
US-20050181299-A1 Coating compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2005-08-18 US disclosed
WO-2005066240-A1 COATING COMPOSITIONS ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2005-07-21 WO disclosed