Tetrabuthylammonium

Tetrabuthylammonium

SCHEMBL2859337

CCCC[N+](CCCC)(CCCC)CCCC.COc1c2ccccc2c(OC)c2cc(S(=O)(=O)O)ccc12

nearest known ligand 0.40

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Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
S1PR3 Q99500 1/20 0.40
SLC2A1 P11166 5/20 0.39
MAPK1 P28482 2/20 0.38
KDM4E B2RXH2 1/20 0.38
ALDH1A1 P00352 1/20 0.38
SMN1; SMN2 Q16637 1/20 0.38
LMNA P02545 1/20 0.36
HTT P42858 1/20 0.36
MCL1 Q07820 2/20 0.33
BCL2A1 Q16548 2/20 0.33
PTPN11 Q06124 1/20 0.33
PSEN1 P49768 1/20 0.33
PSEN2 P49810 1/20 0.33
APH1B Q8WW43 1/20 0.33
NCSTN Q92542 1/20 0.33
APH1A Q96BI3 1/20 0.33
PSENEN Q9NZ42 1/20 0.33
CTSD P07339 1/20 0.33
PTGS2 P35354 1/20 0.33
HSD17B10 Q99714 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Tetrabuthylammonium SCHEMBL2859336 0.89 MAPK1 (0.39) SLC2A1MAPK1KDM4EALDH1A1SMN1; SMN2
Butylamine SCHEMBL27515190 0.86 SLC2A1 (0.40) S1PR3SLC2A1MAPK1KDM4EALDH1A1
SCHEMBL29432545 0.85 ALDH1A1 (0.52) SLC2A1MAPK1KDM4EALDH1A1SMN1; SMN2
SCHEMBL29868203 0.85 ALDH1A1 (0.52) SLC2A1MAPK1KDM4EALDH1A1SMN1; SMN2
SCHEMBL601324 0.85 ALDH1A1 (0.52) SLC2A1MAPK1KDM4EALDH1A1SMN1; SMN2
Iodide SCHEMBL3838572 0.84 ALDH1A1 (0.50) SLC2A1MAPK1KDM4EALDH1A1SMN1; SMN2
SCHEMBL2858131 0.84 ALDH1A1 (0.50) SLC2A1MAPK1KDM4EALDH1A1SMN1; SMN2
Iodide SCHEMBL3838568 0.84 ALDH1A1 (0.50) SLC2A1MAPK1KDM4EALDH1A1SMN1; SMN2
SCHEMBL5147506 0.81 ALDH1A1 (0.43) MAPK1KDM4EALDH1A1SMN1; SMN2LMNA
SCHEMBL2858146 0.81 S1PR3 (0.54) S1PR3SLC2A1ALDH1A1LMNAPTPN11

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2146359-B1 Solid electrolytic capacitor and method for producing the same MURATA MANUFACTURING CO (JP) 2012-05-16 EP disclosed
EP-2146359-A1 Solid electrolytic capacitor and method for producing the same SHOWA DENKO KABUSHIKI KAISHA (JP) 2010-01-20 EP disclosed
EP-1988556-B1 Solid electrolytic capacitor and method for producing the same SHOWA DENKO KK (JP) 2010-01-13 EP disclosed
EP-0971382-B1 SOLID ELECTROLYTIC CAPACITOR AND PROCESS FOR THE PRODUCTION THEREOF SHOWA DENKO KK (JP) 2009-04-22 EP disclosed
EP-1988556-A2 Solid electrolytic capacitor and method for producing the same Showa Denko K.K. (JP) 2008-11-05 EP disclosed
EP-1811532-A2 Solid electrolytic capacitor and method for producing the same SHOWA DENKO KABUSHIKI KAISHA (JP) 2007-07-25 EP disclosed
EP-1190426-B1 SOLID ELECTROLYTIC CAPACITOR AND METHOD FOR PRODUCING THE SAME SHOWA DENKO KK (JP) 2007-05-30 EP disclosed
US-7175781-B2 Valve acting metal having pores, dielectric film formed on surface, and electroconductive polythiophene as solid electrolyte provided on dielectric film; improved moisture/heat/thermal stess resistance SHOWA DENKO K.K. (JP) 2007-02-13 US disclosed
US-20060179627-A1 Valve acting metal having pores, dielectric film formed on surface, and electroconductive polythiophene as solid electrolyte provided on dielectric film; improved moisture/heat/thermal stess resistance SHOWA DENKO K.K. 2006-08-17 US disclosed
US-7087292-B2 Solid electrolytic capacitor and method for producing the same SHOWA DENKO K.K. (JP) 2006-08-08 US disclosed
US-6790384-B2 VALVE METAL HAVING MICROFINE PORES; DIELECTRIC FILM; LAMELLAR STRUCTURE; HEAT AND STRESS RESISTANCE; WATERPROOFING SHOWA DENKO K.K. (JP) 2004-09-14 US disclosed
US-20040136145-A1 Solid electrolytic capacitor and method for producing the same SHOWA DENKO K.K. 2004-07-15 US disclosed
US-6696138-B2 POROUS VALVE ACTING METAL HAVING DIELECTRIC FILM SHOWA DENKO K.K. (JP) 2004-02-24 US disclosed
US-20030148023-A1 Solid electrolytic capacitor and method for producing the same SHOWA DENKO K.K. 2003-08-07 US disclosed
US-6517892-B1 Forming electroconductive film filling microfine pores and covering dielectric layer; oxidative solution polymerization; such as cationic polythiophene or polyfuran SHOWA DENKO K.K. (JP) 2003-02-11 US disclosed
US-20020039274-A1 SOLID ELECTROLYTE LAYER COMPRISES A COMPOSITION CONTAINING A PI -ELECTRON CONJUGATE POLYMER AND/OR OTHER ELECTRICALLY CONDUCTING POLYMER, A CONDENSED HETEROPOLYCYCLIC POLYMER SHOWA DENKO K.K. 2002-04-04 US disclosed
EP-1190426-A1 SOLID ELECTROLYTIC CAPACITOR AND METHOD FOR PRODUCING THE SAME Showa Denko K K (JP) 2002-03-27 EP disclosed
US-20020034060-A1 VALVE METAL HAVING MICROFINE PORES; DIELECTRIC FILM; LAMELLAR STRUCTURE; HEAT AND STRESS RESISTANCE; WATERPROOFING SHOWA DENKO K.K. 2002-03-21 US disclosed
WO-2000060620-A1 SOLID ELECTROLYTIC CAPACITOR AND METHOD FOR PRODUCING THE SAME SHOWA DENKO K. K. (JP) 2000-10-12 WO disclosed
EP-0971382-A1 SOLID ELECTROLYTIC CAPACITOR AND PROCESS FOR THE PRODUCTION THEREOF Showa Denko K K (JP) 2000-01-12 EP disclosed