SCHEMBL2881928

SCHEMBL2881928

C=Cc1ccc(OC(OC2CCCCCCCCC2)(OC2CCCCCCCCC2)C(C)(C)OC2CCCCCCCCC2)cc1

nearest known ligand 0.32

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
HPGD P15428 1/20 0.32
POLB P06746 1/20 0.31
MAPT P10636 1/20 0.31
ALDH1A1 P00352 1/20 0.31
CHRNB2 P17787 1/20 0.30
CHRNB4 P30926 1/20 0.30
CHRNA3 P32297 1/20 0.30
CHRNA7 P36544 1/20 0.30
CHRNA4 P43681 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6697794 0.84 POLB (0.34) HPGDPOLBMAPTALDH1A1CHRNB2
SCHEMBL6694601 0.82 ALDH1A1 (0.34) HPGDPOLBMAPTALDH1A1CHRNB2
SCHEMBL6692559 0.82 HPGD (0.32) HPGDPOLBMAPTALDH1A1CHRNB2
SCHEMBL6695291 0.80 ALDH1A1 (0.32) HPGDALDH1A1CHRNB2CHRNB4CHRNA3
SCHEMBL6689020 0.80 HPGD (0.31) HPGDPOLBMAPT
SCHEMBL6699720 0.80 CHRNB2 (0.35) HPGDPOLBMAPTCHRNB2CHRNB4
SCHEMBL6698245 0.78 CHRNB2 (0.35) POLBMAPTALDH1A1CHRNB2CHRNB4
SCHEMBL6691342 0.78 ALDH1A1 (0.31) ALDH1A1CHRNB2CHRNB4CHRNA3CHRNA7
SCHEMBL6694514 0.77 CHRNB2 (0.33) POLBMAPTCHRNB2CHRNB4CHRNA3
SCHEMBL6690480 0.76 CHRNB2 (0.34) CHRNB2CHRNB4CHRNA3CHRNA7CHRNA4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2482132-B1 Resist pattern forming process SHINETSU CHEMICAL CO (JP) 2019-10-16 EP disclosed
EP-2146247-B1 Resist patterning process and manufacturing photo mask SHINETSU CHEMICAL CO (JP) 2015-04-15 EP disclosed
US-20120196211-A1 RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-02 US disclosed
EP-2482132-A1 Resist pattern forming process Shin-Etsu Chemical Co., Ltd. (JP) 2012-08-01 EP disclosed
EP-2146247-A1 Resist patterning process and manufacturing photo mask Shin-Etsu Chemical Co., Ltd. (JP) 2010-01-20 EP disclosed