SCHEMBL2900266

SCHEMBL2900266

CCCC(=CN(C)C)C([NH])=O

nearest known ligand 0.35

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
CES2 O00748 1/20 0.35
CES1 P23141 1/20 0.35
HDAC3 O15379 4/20 0.33
HDAC1 Q13547 4/20 0.33
HDAC2 Q92769 4/20 0.33
HDAC8 Q9BY41 4/20 0.33
FFAR3 O14843 3/20 0.33
ALDH1A1 P00352 2/20 0.32
TSHR P16473 1/20 0.32
CYP2C9 P11712 1/20 0.32
HDAC6 Q9UBN7 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10356558 0.81 CES2 (0.33) CES2CES1HDAC3HDAC1HDAC2
SCHEMBL876069 0.80 HDAC3 (0.40) CES2CES1HDAC3HDAC1HDAC2
SCHEMBL423119 0.78 CES2 (0.35) CES2CES1HDAC3HDAC1HDAC2
Hydrochloric Acid SCHEMBL27592323 0.77 CES2 (0.33) CES2CES1HDAC3HDAC1HDAC2
Chloromethane SCHEMBL5007039 0.75 TSHR (0.34) CES2CES1HDAC3HDAC1HDAC2
SCHEMBL17156138 0.75 CYP2C9 (0.37) CES2CES1HDAC3HDAC1HDAC2
SCHEMBL17156139 0.75 CYP2C9 (0.37) CES2CES1HDAC3HDAC1HDAC2
SCHEMBL5901415 0.74 CYP2C9 (0.51) ALDH1A1TSHRCYP2C9
SCHEMBL5901419 0.74 CYP2C9 (0.51) ALDH1A1TSHRCYP2C9
Sulfuric Acid SCHEMBL27573794 0.72 CES2 (0.30) CES2CES1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20100203456-A1 METHOD OF FORMING RESIST PATTERN AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE RENESAS TECHNOLOGY CORP. (JP) 2010-08-12 US disclosed
US-7727709-B2 Method of forming resist pattern and method of manufacturing semiconductor device RENESAS TECHNOLOGY CORP. (JP) 2010-06-01 US disclosed
US-20070224546-A1 Method of forming resist pattern and method of maufacturing semiconductor device RENESAS TECHNOLOGY CORP. 2007-09-27 US disclosed
EP-1476530-A1 ANTIFOULING DETERGENT FOR HARD SURFACES Kao Corporation (JP) 2004-11-17 EP disclosed
WO-2003070867-A1 ANTIFOULING DETERGENT FOR HARD SURFACES KAO CORPORATION (JP) 2003-08-28 WO disclosed
EP-0233588-B1 A COLD ROLLING OIL COMPOSITION FOR ALUMINIUM AND ALUMINIUM-CONTAINING ALLOYS Kao Corporation (JP) 1990-09-19 EP disclosed
US-4800034-A HIGHER FATTY ACIDS AND ALCOHOLS AS LUBRICANTS; WATER SOLUBLE CATIONIC AND AMPHOTERIC POLYMERS AS DISPERSANTS KAO CORPORATION (JP) 1989-01-24 US disclosed
EP-0233588-A1 A cold rolling oil composition for aluminium and aluminium-containing alloys Kao Corporation (JP) 1987-08-26 EP disclosed