SCHEMBL2919192

SCHEMBL2919192

C[CH]c1ccccc1CCCCCCC

nearest known ligand 0.55

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LIPG Q9Y5X9 1/20 0.55
THRA P10827 1/20 0.45
THRB P10828 1/20 0.45
NR1H2 P55055 1/20 0.45
NR1H3 Q13133 1/20 0.45
BID P55957 3/20 0.42
MCL1 Q07820 3/20 0.42
BCL2L1 Q07817 2/20 0.42
BAK1 Q16611 2/20 0.42
KAT8 Q9H7Z6 2/20 0.42
PPARG P37231 1/20 0.42
PPARA Q07869 1/20 0.42
EP300 Q09472 1/20 0.42
KAT2A Q92830 1/20 0.42
KAT2B Q92831 1/20 0.42
KAT5 Q92993 1/20 0.42
SAE1 Q9UBE0 1/20 0.42
KCNH2 Q12809 1/20 0.41
ALOX5 P09917 2/20 0.41
PTGS2 P35354 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL667813 1.00 LIPG (0.55) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL677573 1.00 LIPG (0.55) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL677129 0.98 LIPG (0.52) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL2921344 0.92 CYP3A4 (0.45) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL31348033 0.85 LIPG (0.51) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL31348025 0.85 LIPG (0.51) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL17160025 0.85 LIPG (0.51) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL17159999 0.85 LIPG (0.51) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL11896275 0.85 LIPG (0.51) LIPGTHRATHRBNR1H2NR1H3
SCHEMBL11896269 0.85 LIPG (0.51) LIPGTHRATHRBNR1H2NR1H3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1467251-B1 Positive resist composition FUJIFILM CORP (JP) 2010-09-08 EP disclosed
US-20080096130-A1 POSITIVE RESIST COMPOSITION FUJIFILM CORPORATION 2008-04-24 US disclosed
US-7361446-B2 Sensitivity, high resolution, good pattern profile, used for super-microlithography FUJIFILM CORPORATION (JP) 2008-04-22 US disclosed
EP-1467251-A1 Positive resist composition Fuji Photo Film Co., Ltd. (JP) 2004-10-13 EP disclosed
US-20040197702-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2004-10-07 US disclosed
US-6727033-B2 A POSITIVE RESIST COMPOSITION COMPRISING A RESIN (A), WHICH IS DECOMPOSED BY THE ACTION OF AN ACID TO INCREASE SOLUBILITY IN AN ALKALI DEVELOPING SOLUTION, CONTAINING A STRUCTURAL UNIT INCLUDING A GROUP REPRESENTED BY FORMULA (X) DEFINED IN FUJI PHOTO FILM CO., LTD. (JP) 2004-04-27 US disclosed
US-20030134221-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2003-07-17 US disclosed