⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| Zinc Ion SCHEMBL296817 | 0.87 | — | — | |
| Zinc Ion SCHEMBL285709 | 0.87 | — | — | |
| Zinc Ion SCHEMBL31464204 | 0.87 | — | — | |
| Silver SCHEMBL31098889 | 0.75 | — | — | |
| Zinc Ion SCHEMBL19511652 | 0.75 | — | — | |
| Zinc Ion SCHEMBL31098890 | 0.75 | — | — | |
| Zinc Ion SCHEMBL296861 | 0.75 | — | — | |
| Zinc Ion SCHEMBL5391444 | 0.75 | — | — | |
| Zinc Ion SCHEMBL285089 | 0.75 | — | — | |
| Zinc Ion SCHEMBL29937030 | 0.75 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-8216370-B2 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. (US) | 2012-07-10 | — | — | US | claimed |
| EP-1715086-B1 | Method for reducing defect concentrations in crystals | GEN ELECTRIC (US) | 2012-03-14 | — | — | EP | claimed |
| EP-1378591-B1 | Method for removing defects in crystals | DIAMOND INNOVATIONS INC (US) | 2009-03-25 | — | — | EP | claimed |
| US-7175704-B2 | Method for reducing defect concentrations in crystals | DIAMOND INNOVATIONS, INC. (US) | 2007-02-13 | — | — | US | claimed |
| EP-1715086-A1 | Method for reducing defect concentrations in crystals | GENERAL ELECTRIC COMPANY (US) | 2006-10-25 | — | — | EP | claimed |
| US-20060096521-A1 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. | 2006-05-11 | — | — | US | claimed |
| EP-1378591-A1 | Method for removing defects in crystals | General Electric Company (US) | 2004-01-07 | — | — | EP | claimed |
| US-20040000266-A1 | Method for reducing defect concentrations in crystals | Diamond Innovations, Inc | 2004-01-01 | — | — | US | claimed |
| US-8216370-B2 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. (US) | 2012-07-10 | — | — | US | disclosed |
| EP-1715086-B1 | Method for reducing defect concentrations in crystals | GEN ELECTRIC (US) | 2012-03-14 | — | — | EP | disclosed |
| EP-1378591-B1 | Method for removing defects in crystals | DIAMOND INNOVATIONS INC (US) | 2009-03-25 | — | — | EP | disclosed |
| US-7175704-B2 | Method for reducing defect concentrations in crystals | DIAMOND INNOVATIONS, INC. (US) | 2007-02-13 | — | — | US | disclosed |
| EP-1715086-A1 | Method for reducing defect concentrations in crystals | GENERAL ELECTRIC COMPANY (US) | 2006-10-25 | — | — | EP | disclosed |
| US-20060096521-A1 | Method for reducing defect concentration in crystals | MOMENTIVE PERFORMANCE MATERIALS INC. | 2006-05-11 | — | — | US | disclosed |
| EP-1378591-A1 | Method for removing defects in crystals | General Electric Company (US) | 2004-01-07 | — | — | EP | disclosed |
| US-20040000266-A1 | Method for reducing defect concentrations in crystals | Diamond Innovations, Inc | 2004-01-01 | — | — | US | disclosed |