SCHEMBL3090693

SCHEMBL3090693

[O]S(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F

nearest known ligand 0.56

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
CA2 P00918 14/20 0.56
CA1 P00915 13/20 0.52
MMP1 P03956 4/20 0.52
MMP2 P08253 4/20 0.52
MMP9 P14780 4/20 0.52
MMP8 P22894 4/20 0.52
MMP13 P45452 4/20 0.52
F2 P00734 4/20 0.46
PRSS1 P07477 4/20 0.46
PRSS2 P07478 4/20 0.46
PRSS3 P35030 4/20 0.46
LMNA P02545 1/20 0.36
THRB P10828 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1146132 1.00 CA2 (0.56) CA2CA1MMP1MMP2MMP9
SCHEMBL3100188 1.00 CA2 (0.56) CA2CA1MMP1MMP2MMP9
SCHEMBL3082432 1.00 CA2 (0.56) CA2CA1MMP1MMP2MMP9
SCHEMBL455847 0.97 CA2 (0.52) CA2CA1MMP1MMP2MMP9
SCHEMBL1766721 0.88 CA2 (0.42) CA2CA1MMP1MMP2MMP9
SCHEMBL9335744 0.79 CA2 (0.59) CA2CA1MMP1MMP2MMP9
SCHEMBL7660482 0.77 CA2 (0.56) CA2CA1MMP1MMP2MMP9
SCHEMBL585171 0.77 CA2 (0.56) CA2CA1MMP1MMP2MMP9
SCHEMBL584864 0.77 CA2 (0.56) CA2CA1MMP1MMP2MMP9
SCHEMBL302264 0.77 CA2 (0.56) CA2CA1MMP1MMP2MMP9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230176479-A1 NEGATIVE RESIST FILM LAMINATE AND PATTERN FORMATION METHOD SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-08 US disclosed
EP-4167028-A1 NEGATIVE RESIST FILM LAMINATE AND PATTERN FORMATION METHOD SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-04-19 EP disclosed
CN-108107676-B Chemically amplified positive resist film laminate and pattern formation method 信越化学工业株式会社 2023-02-21 CN disclosed
CN-108459469-B Pattern forming method 信越化学工业株式会社 2022-11-11 CN disclosed
US-11460774-B2 Photosensitive resin composition, photosensitive dry film, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-10-04 US disclosed
CN-114600045-A Photosensitive resin composition, photosensitive dry film and pattern forming method 信越化学工业株式会社 2022-06-07 CN disclosed
US-11256174-B2 Pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-02-22 US disclosed
EP-3671345-B1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE DRY FILM, AND PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2022-02-02 EP disclosed
WO-2021079679-A1 PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE DRY FILM, AND PATTERN FORMATION METHOD 信越化学工業株式会社 2021-04-29 WO disclosed
CN-111338181-A Photosensitive resin composition, photosensitive dry film and pattern forming method 信越化学工业株式会社 2020-06-26 CN disclosed
EP-3367164-B1 PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2019-11-13 EP disclosed
EP-3327504-B1 CHEMICALLY AMPLIFIED POSITIVE RESIST FILM LAMINATE AND PATTERN FORMING PROCESS SHINETSU CHEMICAL CO (JP) 2019-05-15 EP disclosed
EP-3367164-A1 PATTERN FORMING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2018-08-29 EP disclosed
US-20180239255-A1 PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-08-23 US disclosed
EP-3327504-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST FILM LAMINATE AND PATTERN FORMING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2018-05-30 EP disclosed
US-20180143535-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST FILM LAMINATE AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-05-24 US disclosed
US-7799469-B2 electrolytic salt e.g. LiPF6 is dissolved in an organic solvent ( ethylene carbonate, vinyline carbonate, diethyl carbonate) and a silicon compound additive; increase of internal resistance in storage at high temperature; stable power souce for hybrid or battery cars using electrical power; green energy DENSO CORPORATION (JP) 2010-09-21 US disclosed
US-20090253881-A1 POLYMERIZABLE COMPOUND FOR PHOTORESIST, POLYMER THEREOF, AND PHOTORESIST COMPOSITION CONTAINING SUCH POLYMER IDEMITSU KOSAN CO., LTD. (JP) 2009-10-08 US disclosed
EP-1882705-A1 POLYMERIZABLE COMPOUND FOR PHOTORESIST, POLYMER THEREOF, AND PHOTORESIST COMPOSITION CONTAINING SUCH POLYMER IDEMITSU KOSAN CO., LTD. (JP) 2008-01-30 EP disclosed
US-20070243470-A1 electrolytic salt e.g. LiPF6 is dissolved in an organic solvent ( ethylene carbonate, vinyline carbonate, diethyl carbonate) and a silicon compound additive; increase of internal resistance in storage at high temperature; stable power souce for hybrid or battery cars using electrical power; green energy DENSO CORPORATION (JP) 2007-10-18 US disclosed