SCHEMBL3090902

SCHEMBL3090902

CC(C)(C)c1ccc([I+](OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F)c2ccc(C(C)(C)C)cc2)cc1

nearest known ligand 0.37

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CA2 P00918 13/20 0.37
CA1 P00915 12/20 0.37
CA9 Q16790 1/20 0.34
ALDH1A1 P00352 2/20 0.33
RORA P35398 1/20 0.33
LMNA P02545 1/20 0.31
GAA P10253 1/20 0.31
PDK1 Q15118 1/20 0.31
PDK2 Q15119 1/20 0.31
PDK3 Q15120 1/20 0.31
PDK4 Q16654 1/20 0.31
F2 P00734 1/20 0.31
PRSS1 P07477 1/20 0.31
PRSS2 P07478 1/20 0.31
PRSS3 P35030 1/20 0.31
FFAR1 O14842 1/20 0.30
FFAR4 Q5NUL3 1/20 0.30
MMP1 P03956 1/20 0.30
MMP2 P08253 1/20 0.30
MMP9 P14780 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL448975 1.00 CA2 (0.37) CA2CA1CA9ALDH1A1RORA
SCHEMBL114860 0.99 CA1 (0.36) CA2CA1CA9ALDH1A1RORA
SCHEMBL3828157 0.94 CA1 (0.38) CA2CA1CA9ALDH1A1RORA
SCHEMBL548236 0.88 CA2 (0.39) CA2CA1CA9MMP1MMP2
SCHEMBL548592 0.87 CA1 (0.38) CA2CA1CA9
SCHEMBL5405594 0.87 CA1 (0.37) CA2CA1LMNA
SCHEMBL2897585 0.85 CA2 (0.39) CA2CA1CA9GAAF2
SCHEMBL4410699 0.85 NPC1 (0.36) CA2CA1LMNA
SCHEMBL2895496 0.84 CA2 (0.38) CA2CA1CA9ALDH1A1GAA
SCHEMBL3284975 0.84 CA2 (0.40) CA2CA1F2PRSS1PRSS2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 27 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20090291392-A1 WET DEVELOPABLE BOTTOM ANTIREFLECTIVE COATING COMPOSITION AND METHOD FOR USE THEREOF INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-11-26 US claimed
US-20080233514-A1 POSITIVE PHOTORESIST COMPOSITION WITH A POLYMER INCLUDING A FLUOROSULFONAMIDE GROUP AND PROCESS FOR ITS USE INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-09-25 US claimed
US-7081326-B2 Negative photoresist and method of using thereof INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2006-07-25 US claimed
US-7063931-B2 Positive photoresist composition with a polymer including a fluorosulfonamide group and process for its use INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2006-06-20 US claimed
US-6653045-B2 Negative resist containing a polysilsesquioxane polymer with pendant fused rings and sites for reaction with a crosslinking agent, an acid-sensitive glycolurils ascrosslinking agent, and a radiation sensitive generator INTERNATIONAL BUSINESS MACHINES CORPORATION 2003-11-25 US claimed
US-6344305-B1 AMPLIFIED SILICON-CONTAINING NEGATIVE-TONE RESIST COMPOSITION OF AQUEOUS BASE SOLUBLE SILICON-CONTAINING POLYMER HAVING PHENOLIC GROUP FOR O-ALKYLATION; ACID CATALYZABLE CROSSLINKING AGENT; ACID GENERATOR; SOLVENT; PHOTOSENSITIZER INTERNATIONAL BUSINESS MACHINES CORPORATION 2002-02-05 US claimed
US-8846295-B2 Photoresist composition containing a protected hydroxyl group for negative development and pattern forming method using thereof INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2014-09-30 US disclosed
US-20130288178-A1 PHOTORESIST COMPOSITION CONTAINING A PROTECTED HYDROXYL GROUP FOR NEGATIVE DEVELOPMENT AND PATTERN FORMING METHOD USING THEREOF INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-10-31 US disclosed
US-8202678-B2 Wet developable bottom antireflective coating composition and method for use thereof INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-06-19 US disclosed
US-8084185-B2 Substrate planarization with imprint materials and processes INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-12-27 US disclosed
US-20100248147-A1 PHOTORESIST COMPOSITIONS AND PROCESS FOR MULTIPLE EXPOSURES WITH MULTIPLE LAYER PHOTORESIST SYSTEMS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-09-30 US disclosed
US-7803521-B2 Photoresist compositions and process for multiple exposures with multiple layer photoresist systems INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-09-28 US disclosed
EP-2212905-A1 PHOTORESIST COMPOSITIONS AND PROCESS FOR MULTIPLE EXPOSURES WITH MULTIPLE LAYER PHOTORESIST SYSTEMS International Business Machines Corporation (US) 2010-08-04 EP disclosed
US-20080233514-A1 POSITIVE PHOTORESIST COMPOSITION WITH A POLYMER INCLUDING A FLUOROSULFONAMIDE GROUP AND PROCESS FOR ITS USE INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-09-25 US disclosed
US-20070066750-A1 Stabilization of vinyl ether materials GLOBALFOUNDRIES INC. (KY) 2007-03-22 US disclosed
US-20060194144-A1 Low blur molecular resist GLOBALFOUNDRIES U.S. INC. 2006-08-31 US disclosed
US-7081326-B2 Negative photoresist and method of using thereof INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2006-07-25 US disclosed
US-7063931-B2 Positive photoresist composition with a polymer including a fluorosulfonamide group and process for its use INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2006-06-20 US disclosed
US-6048672-A RELIEF IMAGES ON SUBSTRATES WITH TITANIUM NITRIDE SURFACES, HEATING, COATING, EXPOSURE AND DEVELOPMENT SHIPLEY COMPANY, L.L.C. (US) 2000-04-11 US disclosed
EP-0938029-A2 Methods using photoresist compositions and articles produced therewith Shipley Company LLC (US) 1999-08-25 EP disclosed