Triaziquone

Triaziquone

SCHEMBL3172445

NCCOC=O.O=C1C=C(N2CC2)C(=O)C(N2CC2)=C1N1CC1

nearest known ligand 0.33

Full drug profile on Sugi Atlas →

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
DNMT1 P26358 1/20 0.33
TP53 P04637 1/20 0.32
MAPT P10636 1/20 0.32
STAT3 P40763 1/20 0.32
HTT P42858 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Triaziquone SCHEMBL610295 0.86 DNMT1 (0.42) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL10379983 0.85 DNMT1 (0.41) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL2160619 0.85 DNMT1 (0.41) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL11416072 0.83 DNMT1 (0.40) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL600168 0.80 DNMT1 (0.40) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL11644813 0.79 DNMT1 (0.35) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL3700755 0.79 DNMT1 (0.39) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL1961248 0.79 DNMT1 (0.39) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL33439 0.78 HTT (0.42) DNMT1TP53MAPTSTAT3HTT
Triaziquone SCHEMBL11428634 0.78 DNMT1 (0.41) DNMT1TP53MAPTSTAT3HTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7655378-B2 Negative resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-02-02 US disclosed
US-20080090179-A1 Novel polymer, resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-04-17 US disclosed
US-20080020290-A1 Negative resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-01-24 US disclosed