SCHEMBL3199606

SCHEMBL3199606

COC(=O)Cc1c2ccccc2cc2ccccc12

nearest known ligand 0.53

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
EGFR P00533 3/20 0.51
HPGD P15428 4/20 0.47
TSHR P16473 2/20 0.47
MAPT P10636 1/20 0.47
HTR2A P28223 1/20 0.46
L3MBTL1 Q9Y468 1/20 0.46
CNR1 P21554 1/20 0.45
CNR2 P34972 1/20 0.45
CYP1A2 P05177 2/20 0.45
CYP2C19 P33261 2/20 0.45
SMN1; SMN2 Q16637 1/20 0.45
ALDH1A1 P00352 3/20 0.44
KDM4E B2RXH2 2/20 0.44
MEN1 O00255 1/20 0.44
GLA P06280 1/20 0.44
KMT2A Q03164 1/20 0.44
HSD17B10 Q99714 1/20 0.44
NPSR1 Q6W5P4 1/20 0.44
EPHX1 P07099 1/20 0.43
EDNRA P25101 1/20 0.43

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL18670716 0.83 EGFR (0.54) EGFRHPGDTSHRMAPTHTR2A
SCHEMBL28087180 0.82 HTR2A (0.50) EGFRHPGDMAPTHTR2AL3MBTL1
SCHEMBL21438254 0.81 KDM4E (0.66) EGFRHPGDMAPTCYP1A2CYP2C19
SCHEMBL3199683 0.81 MTNR1A (0.42) HPGDMAPTHTR2AL3MBTL1CYP1A2
SCHEMBL10733811 0.81 EGFR (0.57) EGFRHPGDTSHRMAPTL3MBTL1
SCHEMBL10678775 0.80 EGFR (0.47) EGFRHPGDMAPTCNR1CNR2
SCHEMBL559460 0.80 HTR2A (0.41) HPGDHTR2AL3MBTL1CYP1A2CYP2C19
SCHEMBL28195038 0.79 HTR2A (0.50) HPGDMAPTHTR2AL3MBTL1CYP1A2
SCHEMBL12800027 0.79 KDM4E (0.46) EGFRHPGDTSHRMAPTL3MBTL1
SCHEMBL28037499 0.79 NCEH1 (0.40) HPGDTSHRHTR2AL3MBTL1CYP1A2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 57 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-111123649-B Negative photoresist composition containing high heat resistance carboxyl phenolic resin 苏州瑞红电子化学品有限公司 2024-01-30 CN claimed
CN-113999340-B Film-forming resin containing silicon or sulfur and photoresist composition 江苏集萃光敏电子材料研究所有限公司 2023-04-28 CN claimed
EP-1840650-B1 Positive type radiation-sensitive resin composition JSR CORP (JP) 2009-03-18 EP claimed
EP-1840650-A1 Positive type radiation-sensitive resin composition JSR Corporation (JP) 2007-10-03 EP claimed
US-20060223010-A1 Positive type radiation-sensitive resin composition JSR CORPORATION (JP) 2006-10-05 US claimed
CN-111123649-B Negative photoresist composition containing high heat resistance carboxyl phenolic resin 苏州瑞红电子化学品有限公司 2024-01-30 CN disclosed
US-8206888-B2 Radiation-sensitive resin composition JSR CORPORATION (JP) 2012-06-26 US disclosed
EP-1720063-B1 Resin containing ketene-aldehyde copolymer NIPPON SODA CO (JP) 2010-04-07 EP disclosed
US-20100028800-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2010-02-04 US disclosed
CN-100486963-C Sulfonium salt compound WAKO PURE CHEM IND LTD (JP) 2009-05-13 CN disclosed
EP-1840650-B1 Positive type radiation-sensitive resin composition JSR CORP (JP) 2009-03-18 EP disclosed
US-7488566-B2 Positive type radiation-sensitive resin composition JSR CORPORATION (JP) 2009-02-10 US disclosed
EP-0789279-A1 Polymer and resist material WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1997-08-13 EP disclosed
EP-0780732-A2 Polymer composition and resist material WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1997-06-25 EP disclosed
US-5576359-A ANTHRACENE DERIVATIVE, SOLVENT, COMPOUND CONTAINING GLYCIDYL GROUPS WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1996-11-19 US disclosed
US-5558971-A HYDROXYSTYRENE POLYMER DERIVATIVES, PHOTOACID GENERATOR WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1996-09-24 US disclosed
US-5558976-A HYDROXYSTYRENE POLYMER DERIVATIVES, PHOTOACID GENERATOR, PHOTORESISTS WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1996-09-24 US disclosed
EP-0704762-A1 Resist material and pattern formation WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1996-04-03 EP disclosed
EP-0636941-B1 Deep ultraviolet absorbent and its use in pattern formation WAKO PURE CHEM IND LTD (JP) 1996-03-20 EP disclosed
EP-0636941-A1 Deep ultraviolet absorbent and its use in pattern formation WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1995-02-01 EP disclosed