SCHEMBL329028

SCHEMBL329028

O=C(O[Si](OC(=O)C(F)(F)F)(OC(=O)C(F)(F)F)OC(=O)C(F)(F)F)C(F)(F)F

nearest known ligand 0.36

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
CA2 P00918 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1053435 0.84 CA2 (0.31) CA2
SCHEMBL28282053 0.84 CA2 (0.31) CA2
SCHEMBL29281759 0.79
SCHEMBL8441753 0.78 FAAH (0.30)
SCHEMBL4265048 0.77
SCHEMBL423208 0.77
SCHEMBL1050079 0.77
SCHEMBL28601036 0.75
SCHEMBL31477856 0.75
SCHEMBL1278342 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 143 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-110591610-A Pressure-sensitive adhesive 上海固柯胶带科技有限公司 2019-12-20 CN claimed
US-8039049-B2 Treatment of low dielectric constant films using a batch processing system TOKYO ELECTRON LIMITED (JP) 2011-10-18 US claimed
JP-4662718-B2 2011-03-30 JP claimed
US-7445953-B2 Low temperature curable materials for optical applications HONEYWELL INTERNATIONAL INC. (US) 2008-11-04 US claimed
US-7405168-B2 Plural treatment step process for treating dielectric films TOKYO ELECTRON LIMITED (JP) 2008-07-29 US claimed
US-7381441-B2 Low metal porous silica dielectric for integral circuit applications HONEYWELL INTERNATIONAL INC. (US) 2008-06-03 US claimed
US-7381442-B2 Porogens for porous silica dielectric for integral circuit applications HONEYWELL INTERNATIONAL INC. (US) 2008-06-03 US claimed
US-20080076262-A1 METHOD AND SYSTEM FOR TREATING A DIELECTRIC FILM TOKYO ELECTRON LIMITED (JP) 2008-03-27 US claimed
US-7345000-B2 Method and system for treating a dielectric film TOKYO ELECTRON LIMITED (JP) 2008-03-18 US claimed
WO-2008014630-A1 PHOTOSENSITIVE MATERIALS AND USES THEREOF HONEYWELL INTERNATIONAL, INC. (US) 2008-02-07 WO claimed
JP-2005522878-A 2005-07-28 JP claimed
US-20050136687-A1 Porous silica dielectric having improved etch selectivity towards inorganic anti-reflective coating materials for integrated circuit applications, and methods of manufacture HONEYWELL INTERNATIONAL INC 2005-06-23 US claimed
US-20050123735-A1 Porogens for porous silica dielectric for integral circuit applications HONEYWELL INTERNATIONAL INC 2005-06-09 US claimed
US-20050106376-A1 Low metal porous silica dielectric for integral circuit applications HONEYWELL INTERNATIONAL INC 2005-05-19 US claimed
WO-2003088343-A1 NEW POROGENS FOR POROUS SILICA DIELECTRIC FOR INTEGRAL CIRCUIT APPLICATIONS HONEYWELL INTERNATIONAL, INC. (US) 2003-10-23 WO claimed
WO-2003088344-A1 LOW METAL POROUS SILICA DIELECTRIC FOR INTEGRAL CIRCUIT APPLICATIONS HONEYWELL INTERNATIONAL, INC. (US) 2003-10-23 WO claimed
EP-1327260-A2 SIMPLIFIED METHOD TO PRODUCE NANOPOROUS SILICON-BASED FILMS Honeywell International Inc. (US) 2003-07-16 EP claimed
US-20030077918-A1 Simplified method to produce nanoporous silicon-based films WU HUI-JUNG (US) 2003-04-24 US claimed
US-6495479-B1 COATING WITH SUCH AS TETRAACETOXYSILANE AND A POROGEN, AGING OR CONDENSING IN PRESENCE OF WATER AND HEATING THE GELLED FILM HONEYWELL INTERNATIONAL, INC. 2002-12-17 US claimed
WO-2001086709-A2 SIMPLIFIED METHOD TO PRODUCE NANOPOROUS SILICON-BASED FILMS HONEYWELL INTERNATIONAL INC. (US) 2001-11-15 WO claimed