SCHEMBL3338480

SCHEMBL3338480

C=CCNCCCC(C)(C)O[SiH3]

nearest known ligand 0.35

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.35
GAA P10253 1/20 0.35
KDM4E B2RXH2 2/20 0.33
MEN1 O00255 1/20 0.33
KMT2A Q03164 1/20 0.33
NPSR1 Q6W5P4 1/20 0.33
CNR1 P21554 1/20 0.32
CNR2 P34972 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3337531 0.96 ALDH1A1 (0.35) ALDH1A1GAAKDM4EMEN1KMT2A
SCHEMBL12912359 0.78 ALDH1A1 (0.36) ALDH1A1GAAKDM4EMEN1KMT2A
Ammonia Solution, Strong SCHEMBL27513941 0.76 ALDH1A1 (0.35) ALDH1A1GAAKDM4EMEN1KMT2A
SCHEMBL978207 0.75 CA12 (0.44) ALDH1A1KDM4EMEN1KMT2ASMN1; SMN2
SCHEMBL16028020 0.75 TSHR (0.42) ALDH1A1MEN1KMT2A
SCHEMBL2448884 0.74 ALDH1A1 (0.33) ALDH1A1GAAKDM4EMEN1KMT2A
SCHEMBL296165 0.74 TSHR (0.41) ALDH1A1
SCHEMBL29170851 0.74 TSHR (0.39) ALDH1A1
SCHEMBL296309 0.72 TSHR (0.44) ALDH1A1SMN1; SMN2
SCHEMBL6037313 0.72 TSHR (0.44) ALDH1A1SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8968458-B2 Composition for resist underlayer film and process for producing same JSR CORPORATION (JP) 2015-03-03 US disclosed
US-8808446-B2 Composition for resist underlayer film and process for producing same JSR CORPORATION (JP) 2014-08-19 US disclosed
US-20100151384-A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME JSR CORPORATION (JP) 2010-06-17 US disclosed
US-20090050020-A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME JSR CORPORATION (JP) 2009-02-26 US disclosed
EP-1855159-A1 COMPOSITION FOR UNDERLAYER FILM OF RESIST AND PROCESS FOR PRODUCING THE SAME JSR Corporation (JP) 2007-11-14 EP disclosed