SCHEMBL3339284

SCHEMBL3339284

CO[Si](C)(CCc1ccc(CCl)cc1)OC

nearest known ligand 0.33

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
CYP4A11 Q02928 2/20 0.32
CYP4F2 P78329 1/20 0.32
CA1 P00915 2/20 0.31
CA2 P00918 2/20 0.31
TAAR1 Q96RJ0 1/20 0.31
TTR P02766 1/20 0.31
POLB P06746 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL163507 0.89 TAAR1 (0.37) CYP4A11CYP4F2CA2TAAR1
SCHEMBL14454634 0.84 CYP4A11 (0.32) CYP4A11CYP4F2CA1CA2TAAR1
SCHEMBL14498249 0.82 TAAR1 (0.36) CYP4A11CYP4F2TAAR1
SCHEMBL387841 0.82 CYP1A2 (0.45) TAAR1
SCHEMBL680307 0.82 TAAR1 (0.36) CYP4A11CYP4F2TAAR1TTRPOLB
SCHEMBL929249 0.81 CYP4F2 (0.32) CYP4A11CYP4F2
SCHEMBL15735387 0.80 TAAR1 (0.44) TAAR1POLB
SCHEMBL17656478 0.80 TAAR1 (0.53) TAAR1
SCHEMBL8953980 0.80 GFER (0.50) TAAR1
SCHEMBL8961179 0.80 LOXL2 (0.40) TAAR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230302533-A1 Additive Manufacturing Powder And Additively Manufactured Body SEIKO EPSON CORPORATION (JP) 2023-09-28 US disclosed
US-8968458-B2 Composition for resist underlayer film and process for producing same JSR CORPORATION (JP) 2015-03-03 US disclosed
US-8808446-B2 Composition for resist underlayer film and process for producing same JSR CORPORATION (JP) 2014-08-19 US disclosed
US-20100151384-A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME JSR CORPORATION (JP) 2010-06-17 US disclosed
US-20090050020-A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME JSR CORPORATION (JP) 2009-02-26 US disclosed
EP-1855159-A1 COMPOSITION FOR UNDERLAYER FILM OF RESIST AND PROCESS FOR PRODUCING THE SAME JSR Corporation (JP) 2007-11-14 EP disclosed