SCHEMBL3339715

SCHEMBL3339715

CCc1cc[nH]c1[Ru]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3344256 0.81
SCHEMBL319464 0.72
SCHEMBL668146 0.72
SCHEMBL6832129 0.71 GABRA1 (0.34)
SCHEMBL29474236 0.70
SCHEMBL21737116 0.70
SCHEMBL21737072 0.70
SCHEMBL21042229 0.70
SCHEMBL27742755 0.70 HTR1A (0.32)
SCHEMBL7588373 0.70 HTR1A (0.32)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9418890-B2 Method for tuning a deposition rate during an atomic layer deposition process APPLIED MATERIALS, INC. (US) 2016-08-16 US disclosed
US-9032906-B2 Apparatus and process for plasma-enhanced atomic layer deposition APPLIED MATERIALS, INC. (US) 2015-05-19 US disclosed
US-20140248772-A1 METHOD FOR TUNING A DEPOSITION RATE DURING AN ATOMIC LAYER DEPOSITION PROCESS APPLIED MATERIALS, INC. (US) 2014-09-04 US disclosed
US-8491967-B2 In-situ chamber treatment and deposition process APPLIED MATERIALS, INC. (US) 2013-07-23 US disclosed
CN-101448977-B Apparatus and process for plasma-enhanced atomic layer deposition APPLIED MATERIALS INC 2010-12-15 CN disclosed
US-7850779-B2 Apparatus and process for plasma-enhanced atomic layer deposition Applied Materisals, Inc. (US) 2010-12-14 US disclosed
WO-2010132172-A2 METHOD FOR TUNING A DEPOSITION RATE DURING AN ATOMIC LAYER DEPOSITION PROCESS APPLIED MATERIALS, INC. (US) 2010-11-18 WO disclosed
US-7682946-B2 flowing a process gas through a conduit to form a circular gas flow pattern, exposing a substrate to the circular gas flow pattern, pulsing a organoruthanium precursor into the process gas and igniting a plasma of ammonia, N2, H2 from the process gas to deposit a material on the substrate (Ru, Ta, W ) APPLIED MATERIALS, INC. (US) 2010-03-23 US disclosed
US-20100062614-A1 IN-SITU CHAMBER TREATMENT AND DEPOSITION PROCESS APPLIED MATERIALS, INC. 2010-03-11 US disclosed
WO-2010027669-A2 IN-SITU CHAMBER TREATMENT AND DEPOSITION PROCESS APPLIED MATERIALS, INC. (US) 2010-03-11 WO disclosed
CN-101448977-A Apparatus and process for plasma-enhanced atomic layer deposition APPLIED MATERIALS INC (US) 2009-06-03 CN disclosed
US-20080268171-A1 Plasma baffle assembly for receiving process gas within plasma-enhanced vapor deposition chamber APPLIED MATERIALS, INC. 2008-10-30 US disclosed
WO-2007142690-A2 APPARATUS AND PROCESS FOR PLASMA-ENHANCED ATOMIC LAYER DEPOSITION APPLIED MATERIALS, INC. (US) 2007-12-13 WO disclosed
US-20070128864-A1 APPARATUS AND PROCESS FOR PLASMA-ENHANCED ATOMIC LAYER DEPOSITION APPLIED MATERIALS, INC. 2007-06-07 US disclosed
US-20070128863-A1 APPARATUS AND PROCESS FOR PLASMA-ENHANCED ATOMIC LAYER DEPOSITION APPLIED MATERIALS, INC. 2007-06-07 US disclosed
US-20070128862-A1 APPARATUS AND PROCESS FOR PLASMA-ENHANCED ATOMIC LAYER DEPOSITION APPLIED MATERIALS, INC. 2007-06-07 US disclosed
US-20070119370-A1 APPARATUS AND PROCESS FOR PLASMA-ENHANCED ATOMIC LAYER DEPOSITION APPLIED MATERIALS, INC. 2007-05-31 US disclosed
US-20070119371-A1 APPARATUS AND PROCESS FOR PLASMA-ENHANCED ATOMIC LAYER DEPOSITION APPLIED MATERIALS, INC. 2007-05-31 US disclosed
US-20070077750-A1 ATOMIC LAYER DEPOSITION PROCESSES FOR RUTHENIUM MATERIALS APPLIED MATERIALS, INC. 2007-04-05 US disclosed
US-20070054487-A1 ATOMIC LAYER DEPOSITION PROCESSES FOR RUTHENIUM MATERIALS APPLIED MATERIALS, INC. 2007-03-08 US disclosed