SCHEMBL3344615

SCHEMBL3344615

CCC(CC(C)(C)O[SiH3])OC(C)=O

nearest known ligand 0.33

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.33
CYP1A2 P05177 1/20 0.33
HRH1 P35367 1/20 0.33
KMT2A Q03164 1/20 0.33
LMNA P02545 1/20 0.33
SMN1; SMN2 Q16637 1/20 0.33
TSHR P16473 1/20 0.32
SLC18A3 Q16572 1/20 0.32
PRKCA P17252 2/20 0.31
KCNH2 Q12809 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25276753 0.82
SCHEMBL10792473 0.80 TSHR (0.37) MEN1CYP1A2HRH1KMT2ALMNA
SCHEMBL107695 0.80 TSHR (0.33) TSHR
SCHEMBL3338092 0.77 TSHR (0.44) SMN1; SMN2TSHR
SCHEMBL1584634 0.75
SCHEMBL18287678 0.75 TSHR (0.36) MEN1CYP1A2HRH1KMT2ALMNA
SCHEMBL25787987 0.71 MEN1 (0.31) MEN1CYP1A2HRH1KMT2ALMNA
SCHEMBL3341119 0.69 KCNH2 (0.37) LMNASMN1; SMN2TSHRKCNH2
SCHEMBL1220663 0.69
SCHEMBL14409324 0.69

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8968458-B2 Composition for resist underlayer film and process for producing same JSR CORPORATION (JP) 2015-03-03 US disclosed
US-8808446-B2 Composition for resist underlayer film and process for producing same JSR CORPORATION (JP) 2014-08-19 US disclosed
US-20100151384-A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME JSR CORPORATION (JP) 2010-06-17 US disclosed
US-20090050020-A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME JSR CORPORATION (JP) 2009-02-26 US disclosed
EP-1855159-A1 COMPOSITION FOR UNDERLAYER FILM OF RESIST AND PROCESS FOR PRODUCING THE SAME JSR Corporation (JP) 2007-11-14 EP disclosed