SCHEMBL336838

SCHEMBL336838

CCO[Si](COCc1ccco1)(OCC)OCC

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
▸ ALDH1A1 P00352 7/20 0.44
▸ CYP2D6 P10635 1/20 0.40
▸ GAA P10253 1/20 0.39
▸ MAPT P10636 7/20 0.38
▸ MAPK1 P28482 3/20 0.35
▸ TDP1 Q9NUW8 1/20 0.35
▸ HTT P42858 5/20 0.35
▸ SMN1; SMN2 Q16637 3/20 0.35
▸ LMNA P02545 2/20 0.35
▸ POLB P06746 2/20 0.34
▸ HPGD P15428 2/20 0.34
▸ HSD17B10 Q99714 2/20 0.34
▸ SLC1A3 P43003 1/20 0.34
▸ SLC1A2 P43004 1/20 0.34
▸ SLC1A1 P43005 1/20 0.34
▸ TP53 P04637 1/20 0.34
▸ KDM4E B2RXH2 3/20 0.34
▸ NPSR1 Q6W5P4 1/20 0.33
▸ TSHR P16473 1/20 0.33
▸ L3MBTL1 Q9Y468 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12079742 0.81 ALDH1A1 (0.40) ALDH1A1CYP2D6GAAMAPTMAPK1
SCHEMBL1152092 0.80 — —
Water SCHEMBL11881132 0.78 ALDH1A1 (0.52) ALDH1A1CYP2D6GAAMAPTMAPK1
SCHEMBL15842422 0.76 ALDH1A1 (0.39) ALDH1A1GAAMAPTMAPK1TDP1
SCHEMBL891457 0.75 ALDH1A1 (0.55) ALDH1A1CYP2D6GAAMAPTMAPK1
SCHEMBL20324523 0.75 ALDH1A1 (0.49) ALDH1A1CYP2D6GAAMAPTMAPK1
SCHEMBL28521894 0.74 ALDH1A1 (0.55) ALDH1A1CYP2D6GAAMAPTMAPK1
SCHEMBL20324517 0.74 ALDH1A1 (0.47) ALDH1A1CYP2D6GAAMAPTMAPK1
Water SCHEMBL4188957 0.74 ALDH1A1 (0.47) ALDH1A1CYP2D6GAAMAPTMAPK1
SCHEMBL20324519 0.74 ALDH1A1 (0.47) ALDH1A1CYP2D6GAAMAPTMAPK1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 121 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12109812-B2 Ink jet printing method and ink jet printing apparatus SEIKO EPSON CORPORATION (JP) 2024-10-08 — — US disclosed
US-20220032618-A1 Ink Jet Printing Method And Ink Jet Printing Apparatus SEIKO EPSON CORPORATION (JP) 2022-02-03 — — US disclosed
US-11021572-B2 Photosensitive resin composition, cured product of same, interlayer insulating film, surface protective film and electronic component HD MICROSYSTEMS, LTD. (JP) 2021-06-01 — — US disclosed
EP-3067395-B1 ULTRAVIOLET RADIATION-CURABLE COMPOSITION, AND RECORDED MATTER SEIKO EPSON CORP (JP) 2020-10-28 — — EP disclosed
US-10759119-B2 Three dimensional mold object manufacturing apparatus, method for manufacturing three dimensional mold object, and three dimensional mold object SEIKO EPSON CORPORATION (JP) 2020-09-01 — — US disclosed
US-10392522-B2 Ultraviolet curable composition and recorded object SEIKO EPSON CORPORATION (JP) 2019-08-27 — — US disclosed
US-20190161580-A1 PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT OF SAME, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM AND ELECTRONIC COMPONENT HD MICROSYSTEMS, LTD. (JP) 2019-05-30 — — US disclosed
US-10300708-B2 Ink jet composition, housing, and ink jet method SEIKO EPSON CORPORATION (JP) 2019-05-28 — — US disclosed
US-10279603-B2 Production method of recording material, and recording material SEIKO EPSON CORPORATION (JP) 2019-05-07 — — US disclosed
US-10259208-B2 Three-dimensional shaped object manufacturing device, method for manufacturing three-dimensional shaped object, and three-dimensional shaped object SEIKO EPSON CORPORATION (JP) 2019-04-16 — — US disclosed
US-7500895-B2 Patterned substrate, electro-optical device, and method for manufacturing an electro-optical device SEIKO EPSON CORPORATION (JP) 2009-03-10 — — US disclosed
US-20090050020-A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME JSR CORPORATION (JP) 2009-02-26 — — US disclosed
US-20080317943-A1 METHOD FOR FORMING PATTERN, METHOD FOR MANUFACTURING ELECTRO-OPTICAL DEVICE, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE SEIKO EPSON CORPORATION (JP) 2008-12-25 — — US disclosed
US-20080311285-A1 CONTACT HOLE FORMING METHOD, CONDUCTING POST FORMING METHOD, WIRING PATTERN FORMING METHOD, MULTILAYERED WIRING SUBSTRATE PRODUCING METHOD, ELECTRO-OPTICAL DEVICE PRODUCING METHOD, AND ELECTRONIC APPARATUS PRODUCING METHOD SEIKO EPSON CORPORATION (JP) 2008-12-18 — — US disclosed
EP-1855159-A1 COMPOSITION FOR UNDERLAYER FILM OF RESIST AND PROCESS FOR PRODUCING THE SAME JSR Corporation (JP) 2007-11-14 — — EP disclosed
US-20060127563-A1 Patterned substrate, electro-optical device, and method for manufacturing an electro-optical device SEIKO EPSON CORPORATION (JP) 2006-06-15 — — US disclosed
US-20060019034-A1 Process for producing chemical adsorption film and chemical adsorption film SEIKO EPSON CORPORATION (JP) 2006-01-26 — — US disclosed
US-20050287392-A1 Organic electroluminescent device, method for producing the same, and electronic apparatus SEIKO EPSON CORPORATION (JP) 2005-12-29 — — US disclosed
US-6960420-B2 Photosensitive resin composition, process for forming relief pattern, and electronic component HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD (JP) 2005-11-01 — — US disclosed
US-20040142275-A1 Photosensitive resin composition, process for forming relief pattern, and electronic component HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2004-07-22 — — US disclosed
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