SCHEMBL352504

SCHEMBL352504

O=C(c1cc(O)c(O)c(O)c1)c1c(O)cc(O)cc1O

nearest known ligand 0.74

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
FASN P49327 2/20 0.74
KDM4E B2RXH2 3/20 0.52
LMNA P02545 3/20 0.52
TDP1 Q9NUW8 3/20 0.52
HPGD P15428 2/20 0.52
ALDH1A1 P00352 2/20 0.52
MAPT P10636 2/20 0.52
FUT7 Q11130 2/20 0.52
CA12 O43570 1/20 0.52
CA1 P00915 1/20 0.52
CA2 P00918 1/20 0.52
TP53 P04637 1/20 0.52
CA3 P07451 1/20 0.52
SELL P14151 1/20 0.52
SELP P16109 1/20 0.52
FUT4 P22083 1/20 0.52
CA4 P22748 1/20 0.52
CA6 P23280 1/20 0.52
DPP4 P27487 1/20 0.52
MAPK1 P28482 1/20 0.52

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9639010 0.85 FASN (1.00) FASNHPGDCA12CA1CA2
SCHEMBL21936687 0.83 FASN (0.62) FASNKDM4ELMNATDP1HPGD
SCHEMBL21935566 0.82 HDAC1 (0.62) FASNKDM4ELMNATDP1HPGD
SCHEMBL6272879 0.82 FASN (0.75) FASNKDM4ELMNATDP1HPGD
SCHEMBL352369 0.82 KDM4E (0.65) FASNKDM4ELMNATDP1HPGD
SCHEMBL21935531 0.80 KDM4E (0.56) FASNKDM4ELMNATDP1HPGD
SCHEMBL3656921 0.80 FASN (0.73) FASNKDM4ELMNATDP1HPGD
SCHEMBL21935910 0.79 FASN (0.58) FASNHPGDALDH1A1CA12CA1
SCHEMBL21935919 0.79 FASN (0.58) FASNKDM4ELMNATDP1HPGD
SCHEMBL21935534 0.78 FASN (0.62) FASNKDM4ELMNATDP1HPGD

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 415 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1798596-B1 Positive photoresist composition SHINETSU CHEMICAL CO (JP) 2012-08-01 EP claimed
EP-2203783-A2 THICK FILM RESISTS AZ Electronic Materials USA Corp. (US) 2010-07-07 EP claimed
WO-2009040661-A2 THICK FILM RESISTS AZ ELECTRONIC MATERIALS USA CORP. (DE) 2009-04-02 WO claimed
US-20090081589-A1 THICK FILM RESISTS MERCK PATENT GMBH (DE) 2009-03-26 US claimed
US-20030134222-A1 Photoresist composition and method of forming pattern using the same SAMSUNG ELECTRONICS CO., LTD. 2003-07-17 US claimed
EP-4702010-A1 PHOTOACTIVE COMPOUNDS Merck Patent GmbH (DE) 2026-03-04 EP disclosed
US-20250376552-A1 RESIN COMPOSITION, CURED SUBSTANCE, LAMINATE, MANUFACTURING METHOD FOR CURED SUBSTANCE, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORP (JP) 2025-12-11 US disclosed
US-20250264801-A1 RESIN COMPOSITION, CURED SUBSTANCE, LAMINATE, MANUFACTURING METHOD FOR CURED SUBSTANCE, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2025-08-21 US disclosed
EP-4596608-A1 RESIN COMPOSITION, CURED PRODUCT, LAMINATE, METHOD FOR PRODUCING CURED PRODUCT, METHOD FOR PRODUCING LAMINATE, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM Corporation (JP) 2025-08-06 EP disclosed
EP-4597225-A1 FILM PRODUCTION METHOD, PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT PRODUCTION METHOD, CURED PRODUCT, AND LAMINATE FUJIFILM Corporation (JP) 2025-08-06 EP disclosed
EP-4596607-A1 RESIN COMPOSITION, CURED OBJECT, LAYERED PRODUCT, METHOD FOR PRODUCING CURED OBJECT, METHOD FOR PRODUCING LAYERED PRODUCT, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM Corporation (JP) 2025-08-06 EP disclosed
US-20250236697-A1 RESIN COMPOSITION, CURED SUBSTANCE, LAMINATE, MANUFACTURING METHOD FOR CURED SUBSTANCE, MANUFACTURING METHOD FOR LAMINATE, MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2025-07-24 US disclosed
EP-0443533-A2 Positive photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 1991-08-28 EP disclosed
EP-0435437-A1 Positive resist composition NIPPON ZEON CO., LTD. (JP) 1991-07-03 EP disclosed
EP-0365318-A2 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1990-04-25 EP disclosed
US-4883739-A PHOTORESISTS FUJI PHOTO FILM CO., LTD. (JP) 1989-11-28 US disclosed
EP-0307951-A2 Light-sensitive resin composition FUJI PHOTO FILM CO., LTD. (JP) 1989-03-22 EP disclosed
US-4801610-A ANTIINFLAMMATORY G. D. SEARLE & CO. (US) 1989-01-31 US disclosed
US-4683241-A ANTIINFLAMMATORY AGENTS ENZYME INHIBITORS G. D. SEARLE & CO. (US) 1987-07-28 US disclosed
EP-0227487-A2 Positive type radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1987-07-01 EP disclosed