Nonadecanoic Acid

Nonadecanoic Acid

SCHEMBL356183

CCCCCCCCCCCCCCCCCCC(=O)O.N

nearest known ligand 0.94

Full drug profile on Sugi Atlas →

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
GPR84 Q9NQS5 7/20 0.94
PPARG P37231 7/20 0.94
PPARD Q03181 7/20 0.94
PPARA Q07869 7/20 0.94
HDAC11 Q96DB2 5/20 0.94
TSHR P16473 4/20 0.94
PTPN1 P18031 3/20 0.94
FABP4 P15090 3/20 0.94
ALDH1A1 P00352 2/20 0.94
TLR2 O60603 2/20 0.94
TDP1 Q9NUW8 2/20 0.94
KMT2A Q03164 2/20 0.94
ALOX15 P16050 2/20 0.94
HSD17B10 Q99714 2/20 0.94
SLC22A6 Q4U2R8 1/20 0.94
SLC22A8 Q8TCC7 1/20 0.94
MEN1 O00255 1/20 0.94
ESR1 P03372 1/20 0.94
PDE4A P27815 1/20 0.94
PDE3A Q14432 1/20 0.94

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Stearic Acid SCHEMBL7208276 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Undecanoate SCHEMBL358302 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Arachidic Acid SCHEMBL6138833 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Nonanoate SCHEMBL21391850 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Octanoic Acid SCHEMBL21391852 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Stearic Acid SCHEMBL7208286 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Stearic Acid SCHEMBL7208279 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Octanoic Acid SCHEMBL3964568 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Palmitic Acid SCHEMBL324624 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11
Dodecanoate SCHEMBL324541 1.00 GPR84 (0.94) GPR84PPARGPPARDPPARAHDAC11

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 65 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11649367-B2 Aqueous pigment dispersions LANDA LABS (2012) LTD. (IL) 2023-05-16 US disclosed
US-20230049112-A1 AQUEOUS PIGMENT DISPERSIONS LANDA CORPORATION LTD. (IL) 2023-02-16 US disclosed
US-11479687-B2 Aqueous pigment dispersions LANDA LABS (2012) LTD. 2022-10-25 US disclosed
CN-109312176-B Improved aqueous pigment dispersions 兰达拉伯斯(2012)有限公司 2022-06-03 CN disclosed
EP-3464489-B1 IMPROVED AQUEOUS PIGMENT DISPERSIONS LANDA LABS 2012 LTD (IL) 2021-07-21 EP disclosed
US-20200190351-A1 IMPROVED AQUEOUS PIGMENT DISPERSIONS LANDA CORPORATION LTD. (IL) 2020-06-18 US disclosed
EP-3464489-A1 IMPROVED AQUEOUS PIGMENT DISPERSIONS Landa Labs (2012) Ltd. (IL) 2019-04-10 EP disclosed
EP-1621927-B1 Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same FUJIFILM CORP (JP) 2018-05-23 EP disclosed
EP-1566693-B1 Use of a Resist Composition for Immersion Exposure and Pattern Formation Method Using the Composition FUJIFILM CORP (JP) 2018-05-23 EP disclosed
WO-2017208139-A1 IMPROVED AQUEOUS PIGMENT DISPERSIONS LANDA LABS (2012) LTD. (IL) 2017-12-07 WO disclosed
US-20060008736-A1 Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same FUJI PHOTO FILM CO., LTD. 2006-01-12 US disclosed
EP-1612602-A2 Photosensitive composition and method for forming pattern using the same FUJI PHOTO FILM CO., LTD. (JP) 2006-01-04 EP disclosed
US-20050287473-A1 Photosensitive composition and method for forming pattern using the same FUJI PHOTO FILM CO., LTD. 2005-12-29 US disclosed
EP-1580598-A2 Positive resist composition for immersion exposure and pattern-forming method using the same Fuji Photo Film Co. Ltd. (JP) 2005-09-28 EP disclosed
US-20050208419-A1 Fluoropolymer containing unsaturated monomer with a adamantyl, decalin, norbornyl, cedrol , cyclohexyl, cycloheptyl, cyclooctyl , a cyclodecanyl, cyclododecanyl and/or tricyclodecanyl group; sulfonium type compound generates acid upon exposure to actinic radiation; semiconductor, integrated circuits FUJI PHOTO FILM CO., LTD. 2005-09-22 US disclosed
US-20050186505-A1 Positive resist composition for immersion exposure and method of pattern formation with the same FUJI PHOTO FILM CO., LTD. 2005-08-25 US disclosed
US-20050186503-A1 Resist composition for immersion exposure and pattern formation method using the same FUJI PHOTO FILM CO., LTD. 2005-08-25 US disclosed
EP-1566693-A2 Resist composition for immersion exposure and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2005-08-24 EP disclosed
US-4253886-A Corrosion resistant ferromagnetic metal powders and method of preparing the same FUJI PHOTO FILM CO., LTD. (JP) 1981-03-03 US disclosed
US-4197347-A High density magnetic recording media FUJI PHOTO FILM CO., LTD. (JP) 1980-04-08 US disclosed