SCHEMBL3750371

SCHEMBL3750371

N#CC12CC3CC1C(OC2=O)C3OC(=O)CCl

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13651376 0.89 NLRP3 (0.36) —
SCHEMBL13701177 0.84 — —
SCHEMBL19996940 0.83 — —
SCHEMBL12014819 0.82 — —
SCHEMBL13588094 0.82 — —
SCHEMBL12783214 0.82 TGM2 (0.30) —
SCHEMBL685765 0.82 — —
SCHEMBL14189321 0.81 — —
SCHEMBL14924192 0.81 — —
SCHEMBL17146551 0.81 — —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9046773-B2 Actinic ray-sensitive or radiation-sensitive resin composition, pattern forming method using the same, polymerizable compound and polymer compound obtained by polymerizing the polymerizable compound FUJIFILM CORPORATION (JP) 2015-06-02 — — US disclosed
US-9046773-B2 Actinic ray-sensitive or radiation-sensitive resin composition, pattern forming method using the same, polymerizable compound and polymer compound obtained by polymerizing the polymerizable compound FUJIFILM CORPORATION (JP) 2015-06-02 — — US disclosed
US-8637623-B2 Monomer having electron-withdrawing substituent and lactone skeleton, polymeric compound, and photoresist composition DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2014-01-28 — — US disclosed
US-8637623-B2 Monomer having electron-withdrawing substituent and lactone skeleton, polymeric compound, and photoresist composition DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2014-01-28 — — US disclosed
US-8637623-B2 Monomer having electron-withdrawing substituent and lactone skeleton, polymeric compound, and photoresist composition DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2014-01-28 — — US disclosed
US-20100297555-A1 MONOMER HAVING ELECTRON-WITHDRAWING SUBSTITUENT AND LACTONE SKELETON, POLYMERIC COMPOUND, AND PHOTORESIST COMPOSITION DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2010-11-25 — — US disclosed
US-20100297555-A1 MONOMER HAVING ELECTRON-WITHDRAWING SUBSTITUENT AND LACTONE SKELETON, POLYMERIC COMPOUND, AND PHOTORESIST COMPOSITION DAICEL CHEMICAL INDUSTRIES, LTD. (JP) 2010-11-25 — — US disclosed
US-20090246695-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD USING THE SAME, POLYMERIZABLE COMPOUND AND POLYMER COMPOUND OBTAINED BY POLYMERIZING THE POLYMERIZABLE COMPOUND FUJIFILM CORPORATION (JP) 2009-10-01 — — US disclosed
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