SCHEMBL3938862

SCHEMBL3938862

[BaH2].[O-2].[O-2].[SrH2].[Ti+4]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3757594 0.87
SCHEMBL7647327 0.87
SCHEMBL5357990 0.75
SCHEMBL7032532 0.75
SCHEMBL578504 0.75
SCHEMBL9590939 0.75
SCHEMBL5574465 0.75
SCHEMBL19119279 0.75
SCHEMBL578896 0.75
SCHEMBL986829 0.75

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 26 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9117692-B2 Semiconductor device having dual metal silicide layers and method of manufacturing the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2015-08-25 US disclosed
US-20150028423-A1 SEMICONDUCTOR DEVICE HAVING DUAL METAL SILICIDE LAYERS AND METHOD OF MANUFACTURING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2015-01-29 US disclosed
US-8889552-B2 Semiconductor device having dual metal silicide layers and method of manufacturing the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2014-11-18 US disclosed
US-20140248761-A1 SEMICONDUCTOR DEVICE HAVING DUAL METAL SILICIDE LAYERS AND METHOD OF MANUFACTURING THE SAME SAMSUNG ELECTRONICS CO., LTD. (KR) 2014-09-04 US disclosed
US-8382903-B2 Vaporizer and semiconductor processing system TOKYO ELECTRON LIMITED (JP) 2013-02-26 US disclosed
US-8197600-B2 Vaporizer and semiconductor processing system TOKYO ELECTRON LIMITED (JP) 2012-06-12 US disclosed
CN-101285178-B Vaporizer and semiconductor processing system TOKYO ELECTRON LIMITED (JP) 2011-12-14 CN disclosed
CN-101573772-B Mim capacitor NXP BV 2011-10-05 CN disclosed
CN-101135047-B Gasification device and semiconductor processing system TOKYO ELECTRON LTD 2011-04-20 CN disclosed
CN-1955338-B Vaporizer and semiconductor processing system TOKYO ELECTRON LTD 2010-12-01 CN disclosed
US-7297983-B2 Method for fabricating an integrated circuit on a semiconductor substrate INFINEON TECHNOLOGIES AG (DE) 2007-11-20 US disclosed
US-20070155139-A1 Method for fabricating an integrated circuit on a semiconductor substrate INFINEON TECHNOLOGIES AG (DE) 2007-07-05 US disclosed
CN-1955338-A Vaporizer and semiconductor processing system TOKYO ELECTRON LTD (JP) 2007-05-02 CN disclosed
US-20070079760-A1 Vaporizer and semiconductor processing system TOKYO ELECTRON LIMITED (JP) 2007-04-12 US disclosed
US-20020081445-A1 Composite material manufacturing method thereof, substrate processing apparatus and manufacturing method thereof, substrate mouting stage and manufacturing method thereof, and substrate processing method KADOMURA SHINGO (JP) 2002-06-27 US disclosed
US-6391437-B1 CORDIERITE CERAMIC HAVING ALUMINUM NITRIDE AND/OR TEXTURE FILLED ALUMINUM BASED MATERIAL AND ALUMINUM OXIDE OR NITRIDE CERAMIC LAYER; HIGH TEMPERATURE STABILITY; PLASMA ETCHING APPARATUS SONY CORPORATION (JP) 2002-05-21 US disclosed
US-6319765-B1 Method for fabricating a memory device with a high dielectric capacitor HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. (KR) 2001-11-20 US disclosed
WO-1999028972-A1 SEMICONDUCTOR DEVICE WITH FERROELECTRIC CAPACITOR DIELECTRIC AND METHOD FOR MAKING MOTOROLA INC. (US) 1999-06-10 WO disclosed
CN-1213145-A Electronic component, method for making, and target making electronic component MOTOROLA INC (US) 1999-04-07 CN disclosed
US-5066928-A Soliton pulse compressor GENERAL ATOMICS (US) 1991-11-19 US disclosed