SCHEMBL400325

SCHEMBL400325

C[SiH](O[SiH2]O[SiH3])O[Si](C)(C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30914759 0.87
SCHEMBL6860193 0.80
SCHEMBL18424874 0.80
SCHEMBL6552955 0.78
SCHEMBL15227901 0.73
SCHEMBL3676200 0.72
SCHEMBL27942521 0.71
SCHEMBL3684757 0.71
SCHEMBL15400686 0.70
SCHEMBL41518 0.69

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 144 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119978980-A Resin aluminum cover plate for circuit board drilling and preparation method thereof 广东合正科技有限公司 2025-05-13 CN claimed
CN-119340030-B Anti-bending data connecting wire and preparation method thereof 江西省圣盈科技有限公司 2025-04-15 CN claimed
CN-119775509-A Environment-friendly cement grinding aid and preparation method thereof 辛集市润基科技有限责任公司 2025-04-08 CN claimed
CN-119707358-A Basalt fiber reinforced asphalt concrete material 宁波东兴沥青制品有限公司 2025-03-28 CN claimed
CN-119661939-A Low-creep PP composite material for buckle and preparation method thereof 惠州市世旺五金塑胶科技有限公司 2025-03-21 CN claimed
CN-119340030-A Anti-bending data connecting wire and preparation method thereof 江西省圣盈科技有限公司 2025-01-21 CN claimed
CN-118325093-A Method for preparing raw phenyl silicone rubber by one-pot method 江西蓝星星火有机硅有限公司 2024-07-12 CN claimed
CN-116836368-A Epoxy resin containing carbamate and preparation method thereof 常州瓴萃新材料科技有限公司 2023-10-03 CN claimed
CN-116656313-A Adhesive and preparation method thereof, composite board of silica gel and plastic and preparation method thereof 广东省硅革科技有限公司 2023-08-29 CN claimed
EP-4177373-A1 TRANSPARENT WEAR-RESISTANT FILM LAYER, PLASTIC SURFACE MODIFICATION METHOD, AND PRODUCT Jiangsu Favored Nanotechnology Co., Ltd. (CN) 2023-05-10 EP claimed
CN-112480688-A Silicon rubber composition and preparation method and application thereof 广东广山新材料股份有限公司 2021-03-12 CN claimed
CN-112480677-A Silicon rubber composition and preparation method and application thereof 广东广山新材料股份有限公司 2021-03-12 CN claimed
CN-110183854-A A kind of putty type silicone rubber compound and its preparation method and application 浙江新安化工集团股份有限公司 2019-08-30 CN claimed
US-20120308735-A1 ULTRA LOW DIELECTRIC CONSTANT MATERIAL WITH ENHANCED MECHANICAL PROPERTIES INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-12-06 US claimed
US-20110241200-A1 ULTRA LOW DIELECTRIC CONSTANT MATERIAL WITH ENHANCED MECHANICAL PROPERTIES INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-10-06 US claimed
CN-1204605-C Method for forming low dielectric constant material and product thereof TAIWAN SEMICONDUCTOR MFG (CN) 2005-06-01 CN claimed
CN-1464536-A Method for forming low dielectric constant material and product thereof TAIWAN LARGE SCALE INTEGRATED (CN) 2003-12-31 CN claimed
US-5939141-A Waterproof silicone coatings of thermal insulation and vaporization method THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION (US) 1999-08-17 US claimed
EP-0635219-B1 Agent for keeping plant-product fresh SHINETSU CHEMICAL CO (JP) 1997-12-17 EP claimed
JP-5199836-A None JP disclosed
CN-119978980-A Resin aluminum cover plate for circuit board drilling and preparation method thereof 广东合正科技有限公司 2025-05-13 CN disclosed
CN-119340030-B Anti-bending data connecting wire and preparation method thereof 江西省圣盈科技有限公司 2025-04-15 CN disclosed
CN-119775509-A Environment-friendly cement grinding aid and preparation method thereof 辛集市润基科技有限责任公司 2025-04-08 CN disclosed
CN-119707358-A Basalt fiber reinforced asphalt concrete material 宁波东兴沥青制品有限公司 2025-03-28 CN disclosed
CN-119661939-A Low-creep PP composite material for buckle and preparation method thereof 惠州市世旺五金塑胶科技有限公司 2025-03-21 CN disclosed
CN-119340030-A Anti-bending data connecting wire and preparation method thereof 江西省圣盈科技有限公司 2025-01-21 CN disclosed
CN-118430880-B Photoelectric composite cable for underwater buoy and preparation process thereof 上海起帆电缆股份有限公司 2024-10-18 CN disclosed
CN-118430880-A Photoelectric composite cable for underwater buoy and preparation process thereof 上海起帆电缆股份有限公司 2024-08-02 CN disclosed
CN-118344821-A Pe automobile foam moisture-proof adhesive tape and preparation method thereof 东莞市索高实业有限公司 2024-07-16 CN disclosed
CN-118339233-A Compositions comprising polyarylene (ether) sulfones 巴斯夫欧洲公司 2024-07-12 CN disclosed
CN-118255914-A Copolymer having carbosiloxane dendrimer structure, and composition, cosmetic raw material, film-forming agent and cosmetic containing the copolymer 陶氏东丽株式会社 2024-06-28 CN disclosed
CN-115175662-B Cosmetic product 信越化学工业株式会社 2024-05-03 CN disclosed
EP-3603954-B1 POLYMER SUBSTRATE WITH HARD COAT LAYER TEIJIN LTD (JP) 2024-03-20 EP disclosed
CN-116836368-B Epoxy resin containing carbamate and preparation method thereof 常州瓴萃新材料科技有限公司 2024-02-09 CN disclosed
US-11866564-B2 Polymer substrate with hard coat layer TEIJIN LIMITED (JP) 2024-01-09 US disclosed
CN-116751257-B Rosa polypeptide and application thereof in skin whitening and moisturizing medicines or cosmetics 江苏华肌生物科技有限公司 2023-10-20 CN disclosed
US-20230321686-A1 TRANSPARENT WEAR-RESISTANT FILM LAYER, PLASTIC SURFACE MODIFICATION METHOD, AND PRODUCT JIANGSU FAVORED NANOTECHNOLOGY CO., LTD. (CN) 2023-10-12 US disclosed
CN-116836368-A Epoxy resin containing carbamate and preparation method thereof 常州瓴萃新材料科技有限公司 2023-10-03 CN disclosed
CN-116751257-A Rosa polypeptide and application thereof in skin whitening and moisturizing medicines or cosmetics 江苏华肌生物科技有限公司 2023-09-15 CN disclosed
CN-116656313-A Adhesive and preparation method thereof, composite board of silica gel and plastic and preparation method thereof 广东省硅革科技有限公司 2023-08-29 CN disclosed
WO-2023136259-A1 PLATINUM-PHOSPHITE COMPLEX-CONTAINING HYDROSILYLATION CATALYST, METHOD FOR PRODUCING SAME, CURABLE ORGANOPOLYSILOXANE COMPOSITION, AND ARTICLE 信越化学工業株式会社 2023-07-20 WO disclosed
CN-111225920-B Ureido-containing organopolysiloxane, method for producing ureido-containing organopolysiloxane, and cosmetic 信越化学工业株式会社 2023-06-06 CN disclosed
EP-4177373-A1 TRANSPARENT WEAR-RESISTANT FILM LAYER, PLASTIC SURFACE MODIFICATION METHOD, AND PRODUCT Jiangsu Favored Nanotechnology Co., Ltd. (CN) 2023-05-10 EP disclosed
CN-116096815-A Thermoplastic mixture 巴斯夫欧洲公司 2023-05-09 CN disclosed
EP-3200931-B1 COMPOSITE CONSISTING OF A SUBSTRATE, A PLASMA POLYMER LAYER, A MIXED LAYER AND A COVER LAYER FRAUNHOFER GES FORSCHUNG (DE) 2022-08-24 EP disclosed
EP-3892072-A1 CONTACT POINT FOR AN ELECTRICAL CONTACT Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein (DE) 2021-10-13 EP disclosed
US-11028284-B2 Polymer substrate with hardcoat layer, and manufacturing method for same TEIJIN LIMITED (JP) 2021-06-08 US disclosed
CN-112480688-A Silicon rubber composition and preparation method and application thereof 广东广山新材料股份有限公司 2021-03-12 CN disclosed
CN-112480677-A Silicon rubber composition and preparation method and application thereof 广东广山新材料股份有限公司 2021-03-12 CN disclosed
US-20200377682-A1 POLYMER SUBSTRATE WITH HARD COAT LAYER TEIJIN LIMITED (JP) 2020-12-03 US disclosed
EP-3124525-B1 POLYMER SUBSTRATE WITH HARD COAT LAYER AND MANUFACTURING METHOD FOR SUCH POLYMER SUBSTRATE TEIJIN LTD (JP) 2020-11-04 EP disclosed
CN-110183854-B Putty type silicone rubber composition and preparation method and application thereof 浙江新安化工集团股份有限公司 2020-11-03 CN disclosed
EP-3543304-B1 ORGANOFUNCTIONAL SILOXANES, METHOD FOR ITS PREPARATION AND USE FOR THE TREATMENT OF FILLERS AND SURFACES ABCR LABORATORIOS S L (ES) 2020-08-05 EP disclosed
WO-2020115287-A1 CONTACT POINT FOR AN ELECTRICAL CONTACT Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein (DE) 2020-06-11 WO disclosed
EP-3603954-A1 POLYMER SUBSTRATE WITH HARD COAT LAYER Teijin Limited (JP) 2020-02-05 EP disclosed
CN-110183854-A A kind of putty type silicone rubber compound and its preparation method and application 浙江新安化工集团股份有限公司 2019-08-30 CN disclosed
CN-110099975-A It can the cured silicone rubber compound of addition- 莫门蒂夫性能材料股份有限公司 2019-08-06 CN disclosed
CN-109689780-A Polyester for profile extrusion and/or pipe extrusion 巴斯夫欧洲公司 2019-04-26 CN disclosed
US-20180265731-A1 POLYMER SUBSTRATE WITH HARDCOAT LAYER, AND MANUFACTURING METHOD FOR SAME TEIJIN LIMITED (JP) 2018-09-20 US disclosed
EP-3354455-A1 POLYMER SUBSTRATE WITH HARDCOAT LAYER, AND MANUFACTURING METHOD FOR SAME Teijin Limited (JP) 2018-08-01 EP disclosed
US-9758630-B2 Polymer substrate with hard coat layer and manufacturing method for such polymer substrate TEIJIN LIMITED (JP) 2017-09-12 US disclosed
CN-107074785-A Polybasic carboxylic acid and polycarboxylic acid compositions, composition epoxy resin, hot curing resin composition, their solidfied material and optical semiconductor device containing it 日本化药株式会社 2017-08-18 CN disclosed
EP-3200931-A1 COMPOSITE CONSISTING OF A SUBSTRATE, A PLASMA POLYMER LAYER, A MIXED LAYER AND A COVER LAYER Fraunhofer Gesellschaft zur Förderung der angewandten Forschung E.V. (DE) 2017-08-09 EP disclosed
CN-106795125-A Polybasic carboxylic acid and the polycarboxylic acid compositions containing it, composition epoxy resin, hot curing resin composition, their solidfied material and optical semiconductor device 日本化药株式会社 2017-05-31 CN disclosed
US-20170107345-A1 POLYMER SUBSTRATE WITH HARD COAT LAYER AND MANUFACTURING METHOD FOR SUCH POLYMER SUBSTRATE TEIJIN LIMITED (JP) 2017-04-20 US disclosed
EP-3124525-A1 POLYMER SUBSTRATE WITH HARD COAT LAYER AND MANUFACTURING METHOD FOR SUCH POLYMER SUBSTRATE Teijin Limited (JP) 2017-02-01 EP disclosed
US-9484248-B2 Patternable dielectric film structure with improved lithography and method of fabricating same GLOBALFOUNDRIES INC. (KY) 2016-11-01 US disclosed
CN-104162292-B A kind of organic silicon monomer is effectively separated separator and the method for siloxanes in producing ZHEJIANG ZHONGTIAN FLUORINE SILICON MATERIALS CO., LTD. (CN) 2015-11-11 CN disclosed
US-9035462-B2 Airgap-containing interconnect structure with patternable low-k material and method of fabricating INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2015-05-19 US disclosed
US-8946369-B2 Branched polysiloxanes and use of these EVONIK DEGUSSA GMBH (DE) 2015-02-03 US disclosed
CN-204058314-U A kind of organosilane monomer is effectively separated the tripping device of siloxanes in producing ZHEJIANG TRANSIT FLUORINE SILICON MATERIAL CO LTD 2014-12-31 CN disclosed
CN-104162292-A Separation device and method for effectively separating oxosilane during organic silicon monomer preparation ZHEJIANG ZHONGTIAN FLUORINE SILICON MATERIALS CO LTD 2014-11-26 CN disclosed
CN-102422389-B Additive etch and deposition profile control using plasma sheath engineering VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC. (US) 2014-10-22 CN disclosed
US-8858816-B2 Enhanced etch and deposition profile control using plasma sheath engineering VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC. (US) 2014-10-14 US disclosed
US-8659115-B2 Airgap-containing interconnect structure with improved patternable low-K material and method of fabricating INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2014-02-25 US disclosed
US-20140034611-A1 ENHANCED ETCH AND DEPOSITION PROFILE CONTROL USING PLASMA SHEATH ENGINEERING VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC. (US) 2014-02-06 US disclosed
US-8618663-B2 Patternable dielectric film structure with improved lithography and method of fabricating same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-12-31 US disclosed
US-8603591-B2 Enhanced etch and deposition profile control using plasma sheath engineering Varian Semiconductor Ewuipment Associates, Inc. (US) 2013-12-10 US disclosed
US-20130217907-A1 BRANCHED POLYSILOXANES AND USE OF THESE EVONIK GOLDSCHMIDT GMBH (DE) 2013-08-22 US disclosed
EP-2628763-A1 Branched polysiloxanes and their use Evonik Goldschmidt GmbH (DE) 2013-08-21 EP disclosed
US-20130207272-A1 AIRGAP-CONTAINING INTERCONNECT STRUCTURE WITH PATTERNABLE LOW-K MATERIAL AND METHOD OF FABRICATING INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-08-15 US disclosed
US-8487411-B2 Multiple patterning using improved patternable low-κ dielectric materials INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-07-16 US disclosed
US-8476758-B2 Airgap-containing interconnect structure with patternable low-k material and method of fabricating INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2013-07-02 US disclosed
US-20120228775-A1 AIRGAP-CONTAINING INTERCONNECT STRUCTURE WITH PATTERNABLE LOW-K MATERIAL AND METHOD OF FABRICATING INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-09-13 US disclosed
US-20120161296-A1 MULTIPLE PATTERNING USING IMPROVED PATTERNABLE LOW-k DIELECTRIC MATERIALS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-06-28 US disclosed
US-8163658-B2 Multiple patterning using improved patternable low-k dielectric materials INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-04-24 US disclosed
CN-102422389-A Additive etch and deposition profile control using plasma sheath engineering VARIAN SEMICONDUCTOR EQUIPMENT 2012-04-18 CN disclosed
US-8101236-B2 Method of fabricating a SiCOH dielectric material with improved toughness and improved Si-C bonding INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2012-01-24 US disclosed
US-20110101489-A1 SiCOH DIELECTRIC MATERIAL WITH IMPROVED TOUGHNESS AND IMPROVED Si-C BONDING, SEMICONDUCTOR DEVICE CONTAINING THE SAME, AND METHOD TO MAKE THE SAME INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-05-05 US disclosed
CN-101483171-B Airgap-containing interconnect structure with patternable low-K material and method of fabricating IBM 2011-04-06 CN disclosed
US-20110042790-A1 MULTIPLE PATTERNING USING IMPROVED PATTERNABLE LOW-k DIELECTRIC MATERIALS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-02-24 US disclosed
US-7892648-B2 SiCOH dielectric material with improved toughness and improved Si-C bonding INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-02-22 US disclosed
US-20100319971-A1 AIRGAP-CONTAINING INTERCONNECT STRUCTURE WITH IMPROVED PATTERNABLE LOW-K MATERIAL AND METHOD OF FABRICATING INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-12-23 US disclosed
US-20100252531-A1 Enhanced Etch and Deposition Profile Control Using Plasma Sheath Engineering VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC. 2010-10-07 US disclosed
WO-2010115114-A2 ENHANCED ETCH DEPOSITION PROFILE CONTROL USING PLASMA SHEATH ENGINEERING VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES (US) 2010-10-07 WO disclosed
US-7666794-B2 Multiple patterning using patternable low-k dielectric materials INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2010-02-23 US disclosed
US-7655377-B2 Antireflection film and exposure method SONY CORPORATION (JP) 2010-02-02 US disclosed
CN-100552890-C The method of electronic structure and formation deielectric-coating IBM (US) 2009-10-21 CN disclosed
CN-100539118-C Dielectric material and manufacture method thereof IBM (US) 2009-09-09 CN disclosed
US-7582411-B2 formed between a resist layer and a silicon oxide layer formed on a surface of a silicon semiconductor substrate, for reducing reflectance at the interface SONY CORPORATION (JP) 2009-09-01 US disclosed
CN-100524022-C Antireflection film and exposure method SONY CORP (JP) 2009-08-05 CN disclosed
US-20090181178-A1 SiCOH DIELECTRIC MATERIAL WITH IMPROVED TOUGHNESS AND IMPROVED Si-C BONDING, SEMICONDUCTOR DEVICE CONTAINING THE SAME, AND METHOD TO MAKE THE SAME INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-07-16 US disclosed
CN-101483171-A Airgap-containing interconnect structure with patternable low-K material and method of fabricating IBM (US) 2009-07-15 CN disclosed
US-20090174067-A1 AIRGAP-CONTAINING INTERCONNECT STRUCTURE WITH PATTERNABLE LOW-K MATERIAL AND METHOD OF FABRICATING INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-07-09 US disclosed
CN-100485532-C Antireflective film and exposure method SONY CORP (JP) 2009-05-06 CN disclosed
WO-2009037119-A1 PATTERNABLE DIELECTRIC FILM STRUCTURE WITH IMPROVED LITHOGRAPHY AND METHOD OF FABRICATING SAME INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-03-26 WO disclosed
US-20090079076-A1 PATTERNABLE DIELECTRIC FILM STRUCTURE WITH IMPROVED LITHOGRAPHY AND METHOD OF FABRICATING SAME INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-03-26 US disclosed
US-7479306-B2 SiCOH dielectric material with improved toughness and improved Si-C bonding, semiconductor device containing the same, and method to make the same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2009-01-20 US disclosed
WO-2008075293-A1 ADDITIVES TO STABILIZE CYCLOTETRASILOXANE AND ITS DERIVATIVES L'AIR LIQUIDE-SOCIETE ANONYME POUR L'ETUDE ET L'EXPLOITATION DES PROCEDES GEORGES CLAUDE (FR) 2008-06-26 WO disclosed
US-20080150091-A1 MULTIPLE PATTERNING USING PATTERNABLE LOW-k DIELECTRIC MATERIALS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-06-26 US disclosed
US-20080141901-A1 ADDITIVES TO STABILIZE CYCLOTETRASILOXANE AND ITS DERIVATIVES AMERICAN AIR LIQUIDE, INC. (US) 2008-06-19 US disclosed
US-7381659-B2 Method for reducing film stress for SiCOH low-k dielectric materials INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-06-03 US disclosed
US-20080009141-A1 Methods to form SiCOH or SiCNH dielectrics and structures including the same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2008-01-10 US disclosed
CN-101101875-A Electronic structure and method for forming medium film IBM (US) 2008-01-09 CN disclosed
US-20070117408-A1 METHOD FOR REDUCING FILM STRESS FOR SICOH LOW-K DIELECTRIC MATERIALS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2007-05-24 US disclosed
US-20070097514-A1 ANTIREFLECTIVE FILM AND EXPOSURE METHOD SONY CORPORATION (JP) 2007-05-03 US disclosed
CN-1952788-A Antireflective film and exposure method SONY CORP (JP) 2007-04-25 CN disclosed
EP-1760766-A2 Antireflective film and exposure method Sony Corporation (JP) 2007-03-07 EP disclosed
CN-1828419-A Antireflection film and exposure method SONY CORP (JP) 2006-09-06 CN disclosed
US-20060194125-A1 Antireflection film and exposure method SONY CORPORATION (JP) 2006-08-31 US disclosed
CN-1819180-A Dielectric materialand method to make the same IBM (US) 2006-08-16 CN disclosed
US-20060165891-A1 SiCOH dielectric material with improved toughness and improved Si-C bonding, semiconductor device containing the same, and method to make the same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2006-07-27 US disclosed
US-20050194619-A1 SiCOH dielectric material with improved toughness and improved Si-C bonding, semiconductor device containing the same, and method to make the same INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2005-09-08 US disclosed
CN-1204605-C Method for forming low dielectric constant material and product thereof TAIWAN SEMICONDUCTOR MFG (CN) 2005-06-01 CN disclosed
US-6699956-B2 ORGANOPOLYSILOXANE CONTAINING A CYANOALKYL GROUP AND A MONOVALENT HYDROCARBON GROUP HAVING AN ALIPHATIC UNSATURATED BOND, ORGANOHYDROGENPOLYSILOXANE CONTAINING A CYANOALKYL GROUP, PLATINUM GROUP METAL CATALYST SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-03-02 US disclosed
CN-1464536-A Method for forming low dielectric constant material and product thereof TAIWAN LARGE SCALE INTEGRATED (CN) 2003-12-31 CN disclosed
EP-0850893-B1 Photocurable low refractive index fibre coatings LUCENT TECHNOLOGIES INC (US) 2003-04-16 EP disclosed
EP-1299450-A1 CONTINUOUS METHOD FOR PRODUCING POLYAMIDES FROM AMINONITRILES BASF AKTIENGESELLSCHAFT (DE) 2003-04-09 EP disclosed
US-6514667-B2 Tunable vapor deposited materials as antireflective coatings, hardmasks and as combined antireflective coating/hardmasks and methods of fabrication thereof and applications thereof INTERNATIONAL BUSINESS MACHINES CORPORATION 2003-02-04 US disclosed
US-20020198319-A1 Highly dielectric addition type curable compositions SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-12-26 US disclosed
EP-1198491-A1 METHOD FOR PRODUCING POLYAMIDES FROM DINITRILES AND DIAMINES BASF AKTIENGESELLSCHAFT (DE) 2002-04-24 EP disclosed
WO-2002008313-A1 CONTINUOUS METHOD FOR PRODUCING POLYAMIDES FROM AMINONITRILES BASF AKTIENGESELLSCHAFT (DE) 2002-01-31 WO disclosed
US-20020012876-A1 Lithography structure GLOBALFOUNDRIES U.S. INC. 2002-01-31 US disclosed
US-6316167-B1 LITHOGRAPHY STRUCTURE WITH MULTILAYER ELEMENT INTERNATIONAL BUSINESS MACHINES CORPORATION 2001-11-13 US disclosed
US-6249638-B1 Photocurable low refractive index coatings LUCENT TECHNOLOGIES, INC. 2001-06-19 US disclosed
WO-2001009224-A1 METHOD FOR PRODUCING POLYAMIDES FROM DINITRILES AND DIAMINES BASF AKTIENGESELLSCHAFT (DE) 2001-02-08 WO disclosed
US-5939141-A Waterproof silicone coatings of thermal insulation and vaporization method THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION (US) 1999-08-17 US disclosed
EP-0850893-A1 Photocurable low refractive index fibre coatings LUCENT TECHNOLOGIES INC. (US) 1998-07-01 EP disclosed
US-5756209-A Photocurable low refractive index coatings LUCENT TECHNOLOGIES INC. (US) 1998-05-26 US disclosed
EP-0635219-B1 Agent for keeping plant-product fresh SHINETSU CHEMICAL CO (JP) 1997-12-17 EP disclosed
US-5416060-A For fruits, vegetables or flowers, removal of ethylene with a hydrosilylation catalyst and a compound with a hydrosilyl group SHIN-ETSU CHEMICAL CO., LTD. (JP) 1995-05-16 US disclosed
US-5408026-A Blend od a polyene, cyclic silicone compound, and polysiloxane in presence of a hydrosilation catalyst HENKEL CORPORATION 1995-04-18 US disclosed
EP-0635219-A1 Agent for keeping plant-product fresh SHIN-ETSU CHEMICAL CO., LTD. (JP) 1995-01-25 EP disclosed
JP-H05199836-A FRESHNESS KEEPING AGENT SHIN ETSU CHEM CO LTD 1993-08-10 JP disclosed
JP-H05199836-A FRESHNESS KEEPING AGENT SHIN ETSU CHEM CO LTD 1993-08-10 JP disclosed