SCHEMBL4073168

SCHEMBL4073168

C=C(C)C(=O)OCC(O)COC(C)(C)C

nearest known ligand 0.55

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
TSHR P16473 3/20 0.53
MAPK1 P28482 1/20 0.41
THRB P10828 1/20 0.38
ALDH1A1 P00352 4/20 0.36
KDM4E B2RXH2 2/20 0.32
TDP1 Q9NUW8 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9788138 0.89 TSHR (0.53) TSHRTHRBALDH1A1
SCHEMBL94906 0.87 TSHR (0.68) TSHRTHRBALDH1A1KDM4ETDP1
SCHEMBL19998240 0.85 TSHR (0.65) TSHRTHRBALDH1A1KDM4ETDP1
SCHEMBL22035404 0.84 TSHR (0.45) TSHRMAPK1THRBALDH1A1
SCHEMBL19999149 0.83 TSHR (0.59) TSHRTHRBALDH1A1TDP1
SCHEMBL12361090 0.82 TSHR (0.46) TSHRTHRBALDH1A1
SCHEMBL12361088 0.82 TSHR (0.46) TSHRTHRBALDH1A1
SCHEMBL10022219 0.82 TSHR (0.53) TSHRTHRBALDH1A1
SCHEMBL7079212 0.82 TSHR (0.53) TSHRTHRBALDH1A1KDM4E
SCHEMBL9717921 0.81 TSHR (0.49) TSHRTHRBALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 131 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117555204-B Negative photosensitive polyimide glue solution and glue film suitable for flexible circuit board 明士(北京)新材料开发有限公司 2024-04-26 CN claimed
CN-117186403-B Negative photosensitive resin, resin composition, and preparation method and application thereof 明士(北京)新材料开发有限公司 2024-04-02 CN claimed
CN-117555204-A Negative photosensitive polyimide glue solution and glue film suitable for flexible circuit board 明士(北京)新材料开发有限公司 2024-02-13 CN claimed
CN-116836388-B Positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-12-15 CN claimed
CN-117186403-A Negative photosensitive resin, resin composition, and preparation method and application thereof 明士(北京)新材料开发有限公司 2023-12-08 CN claimed
CN-116836388-A Positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-10-03 CN claimed
CN-116577965-B Negative photosensitive solid adhesive film and preparation method thereof 明士(北京)新材料开发有限公司 2023-10-03 CN claimed
CN-116577965-A Negative photosensitive solid adhesive film and preparation method thereof 明士(北京)新材料开发有限公司 2023-08-11 CN claimed
CN-116333303-B Anti-mould-pressing alkaline aqueous development photosensitive adhesive film and application thereof 明士(北京)新材料开发有限公司 2023-08-04 CN claimed
CN-116333303-A Anti-mould-pressing alkaline aqueous development photosensitive adhesive film and application thereof 明士(北京)新材料开发有限公司 2023-06-27 CN claimed
CN-115407610-B Photosensitive resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-05-16 CN claimed
CN-115850596-A Transparent photosensitive polyimide resin and preparation method and application thereof 中国科学院化学研究所 2023-03-28 CN claimed
CN-115437218-A Photosensitive resin with symmetrical and asymmetrical structures and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-12-06 CN claimed
CN-115407610-A Photosensitive resin composition and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-11-29 CN claimed
CN-114995060-B Negative photosensitive resin composition capable of being cured at low temperature and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-11-01 CN claimed
CN-114995060-A Negative photosensitive resin composition capable of being cured at low temperature and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-09-02 CN claimed
CN-114280887-A Negative photosensitive solid glue film developed by alkaline water system and preparation method thereof 明士(北京)新材料开发有限公司 2022-04-05 CN claimed
CN-111522200-B Negative PSPI resin for 12-inch silicon wafer and preparation method and application thereof 中国科学院化学研究所 2021-07-27 CN claimed
CN-111522200-A Negative PSPI resin for 12-inch silicon wafer and preparation method and application thereof 中国科学院化学研究所 2020-08-11 CN claimed
CN-122085600-A Negative photosensitive resin composition and preparation method and application thereof 2026-05-26 CN disclosed
WO-2026100338-A1 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING CURED RELIEF PATTERN 旭化成株式会社 2026-05-15 WO disclosed
US-12613465-B2 Photosensitive resin composition and method for producing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2026-04-28 US disclosed
US-20260099093-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN USING SAME, AND METHOD FOR PRODUCING POLYIMIDE FILM USING SAME ASAHI KASEI KABUSHIKI KAISHA (JP) 2026-04-09 US disclosed
US-12504688-B2 Negative photosensitive resin composition and method for manufacturing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-12-23 US disclosed
US-20250370339-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR MANUFACTURING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-12-04 US disclosed
US-20250251663-A1 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE CURED FILM USING SAME, AND POLYIMIDE CURED FILM ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-08-07 US disclosed
CN-120153318-A Photosensitive resin composition, method for producing cured relief pattern using same, and method for producing polyimide film 旭化成株式会社 2025-06-13 CN disclosed
CN-120129875-A Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2025-06-10 CN disclosed
WO-2025100302-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN USING SAME, AND SEMICONDUCTOR DEVICE 旭化成株式会社 2025-05-15 WO disclosed
CN-119684161-A Compound containing ureido structure, negative photosensitive resin composition, and preparation method and application thereof 波米科技有限公司 2025-03-25 CN disclosed
CN-119596638-A Negative photosensitive resin composition, preparation method and application 波米科技有限公司 2025-03-11 CN disclosed
US-20250068074-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE, PRODUCTION METHOD FOR CURED RELIEF PATTERN, AND SEMICONDUCTOR DEVICE ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-02-27 US disclosed
CN-119350380-A Nitrogen-containing heterocycle and siloxane structural compound, photosensitive resin composition, and preparation method and application thereof 波米科技有限公司 2025-01-24 CN disclosed
CN-119213364-A Photosensitive resin composition, method for producing polyimide cured film using same, and polyimide cured film 旭化成株式会社 2024-12-27 CN disclosed
US-12174539-B2 Negative photosensitive resin composition, production method for polyimide, production method for cured relief pattern, and semiconductor device ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-12-24 US disclosed
WO-2024216630-A1 PHOTOSENSITIVE POLYIMIDE PRECURSOR COMPOSITION 深圳先进电子材料国际创新研究院 2024-10-24 WO disclosed
WO-2024198017-A1 NEGATIVE PHOTOSENSITIVE POLYIMIDE PRECURSOR RESIN COMPOSITION 深圳先进电子材料国际创新研究院 2024-10-03 WO disclosed
US-20240329525-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-10-03 US disclosed
WO-2024148707-A1 POLYIMIDE PRECURSOR AND SYNTHETIC METHOD THEREFOR, AND PHOTOSENSITIVE RESIN COMPOSITION COMPRISING POLYIMIDE PRECURSOR 深圳先进电子材料国际创新研究院 2024-07-18 WO disclosed
US-20240210827-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-06-27 US disclosed
CN-118244580-A Photosensitive resin composition, cured film using same, method for producing same, and semiconductor device 旭化成株式会社 2024-06-25 CN disclosed
CN-118244583-A Negative photosensitive polyimide precursor resin composition 深圳先进电子材料国际创新研究院 2024-06-25 CN disclosed
US-20240176240-A1 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE CURED FILM USING SAME, AND POLYIMIDE CURED FILM ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-05-30 US disclosed
WO-2024095927-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN USING SAME, AND METHOD FOR PRODUCING POLYIMIDE FILM USING SAME 旭化成株式会社 2024-05-10 WO disclosed
WO-2024090486-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN, AND SEMICONDUCTOR DEVICE 旭化成株式会社 2024-05-02 WO disclosed
CN-117555204-B Negative photosensitive polyimide glue solution and glue film suitable for flexible circuit board 明士(北京)新材料开发有限公司 2024-04-26 CN disclosed
CN-117420732-B Negative photosensitive resin composition and application thereof 明士(北京)新材料开发有限公司 2024-04-16 CN disclosed
CN-117186403-B Negative photosensitive resin, resin composition, and preparation method and application thereof 明士(北京)新材料开发有限公司 2024-04-02 CN disclosed
US-20240101761-A1 POLYIMIDE PRECURSOR RESIN COMPOSITION AND METHOD FOR MANUFACTURING SAME ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-03-28 US disclosed
CN-116909100-B Photosensitive polyimide precursor composition 深圳先进电子材料国际创新研究院 2024-03-19 CN disclosed
CN-117555204-A Negative photosensitive polyimide glue solution and glue film suitable for flexible circuit board 明士(北京)新材料开发有限公司 2024-02-13 CN disclosed
CN-114561009-B Preparation method and application of negative photosensitive polyamide acid ester resin and composition thereof 波米科技有限公司 2024-01-30 CN disclosed
CN-117420732-A Negative photosensitive resin composition and application thereof 明士(北京)新材料开发有限公司 2024-01-19 CN disclosed
CN-116836388-B Positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-12-15 CN disclosed
CN-117186403-A Negative photosensitive resin, resin composition, and preparation method and application thereof 明士(北京)新材料开发有限公司 2023-12-08 CN disclosed
US-11809079-B2 Photosensitive resin composition, polyimide production method, and semiconductor device ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-11-07 US disclosed
CN-116909100-A Photosensitive polyimide precursor composition 深圳先进电子材料国际创新研究院 2023-10-20 CN disclosed
CN-116868124-A Photosensitive resin composition, method for producing polyimide cured film using same, and polyimide cured film 旭化成株式会社 2023-10-10 CN disclosed
CN-116836388-A Positive photosensitive resin, resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-10-03 CN disclosed
CN-116577965-B Negative photosensitive solid adhesive film and preparation method thereof 明士(北京)新材料开发有限公司 2023-10-03 CN disclosed
CN-116802560-A Photosensitive resin composition, method for producing polyimide cured film using same, and polyimide cured film 旭化成株式会社 2023-09-22 CN disclosed
CN-116710498-A Polyimide precursor resin composition and method for producing same 旭化成株式会社 2023-09-05 CN disclosed
CN-116577965-A Negative photosensitive solid adhesive film and preparation method thereof 明士(北京)新材料开发有限公司 2023-08-11 CN disclosed
CN-116333303-B Anti-mould-pressing alkaline aqueous development photosensitive adhesive film and application thereof 明士(北京)新材料开发有限公司 2023-08-04 CN disclosed
CN-116482933-A Negative photosensitive polyimide precursor resin composition 深圳先进电子材料国际创新研究院 2023-07-25 CN disclosed
US-20230221639-A1 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-07-13 US disclosed
CN-113820920-B Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2023-07-04 CN disclosed
CN-116333303-A Anti-mould-pressing alkaline aqueous development photosensitive adhesive film and application thereof 明士(北京)新材料开发有限公司 2023-06-27 CN disclosed
CN-116239772-A Polyimide precursor, synthesis method thereof and photosensitive resin composition containing polyimide precursor 深圳先进电子材料国际创新研究院 2023-06-09 CN disclosed
CN-115407610-B Photosensitive resin composition, preparation method and application thereof 明士(北京)新材料开发有限公司 2023-05-16 CN disclosed
US-11640112-B2 Photosensitive resin composition and method for producing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-05-02 US disclosed
US-20230110416-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR MANUFACTURING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-04-13 US disclosed
CN-115850596-A Transparent photosensitive polyimide resin and preparation method and application thereof 中国科学院化学研究所 2023-03-28 CN disclosed
CN-115755526-A Photosensitive resin composition and method for producing cured relief pattern 旭化成株式会社 2023-03-07 CN disclosed
CN-115236938-B Negative photosensitive polyamic acid ester resin composition and use thereof 明士(北京)新材料开发有限公司 2023-01-10 CN disclosed
CN-115160569-B Photosensitive polyamic acid ester resin, resin composition and electronic component 明士(北京)新材料开发有限公司 2022-12-27 CN disclosed
CN-115437218-A Photosensitive resin with symmetrical and asymmetrical structures and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-12-06 CN disclosed
CN-115407610-A Photosensitive resin composition and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-11-29 CN disclosed
CN-114995060-B Negative photosensitive resin composition capable of being cured at low temperature and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-11-01 CN disclosed
CN-115236938-A Negative photosensitive polyamic acid ester resin composition and use thereof 明士(北京)新材料开发有限公司 2022-10-25 CN disclosed
CN-115185157-A Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2022-10-14 CN disclosed
CN-115160569-A Photosensitive polyamic acid ester resin, resin composition and electronic component 明士(北京)新材料开发有限公司 2022-10-11 CN disclosed
US-20220291585-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE, PRODUCTION METHOD FOR CURED RELIEF PATTERN, AND SEMICONDUCTOR DEVICE ASAHI KASEI KABUSHIKI KAISHA (JP) 2022-09-15 US disclosed
CN-115039029-A Negative photosensitive resin composition and method for producing cured relief pattern 旭化成株式会社 2022-09-09 CN disclosed
CN-114995060-A Negative photosensitive resin composition capable of being cured at low temperature and preparation method and application thereof 明士(北京)新材料开发有限公司 2022-09-02 CN disclosed
US-20220269170-A1 PHOTOSENSITIVE RESIN COMPOSITION, POLYIMIDE PRODUCTION METHOD, AND SEMICONDUCTOR DEVICE ASAHI KASEI KABUSHIKI KAISHA (JP) 2022-08-25 US disclosed
WO-2022158359-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING POLYIMIDE CURED FILM WHICH USES SAME, AND POLYIMIDE CURED FILM 旭化成株式会社 2022-07-28 WO disclosed
WO-2022158358-A1 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE CURED FILM USING SAME, AND POLYIMIDE CURED FILM 旭化成株式会社 2022-07-28 WO disclosed
WO-2022154020-A1 POLYIMIDE PRECURSOR RESIN COMPOSITION AND METHOD FOR MANUFACTURING SAME 旭化成株式会社 2022-07-21 WO disclosed
EP-4006073-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE, PRODUCTION METHOD FOR CURED RELIEF PATTERN, AND SEMICONDUCTOR DEVICE Asahi Kasei Kabushiki Kaisha (JP) 2022-06-01 EP disclosed
CN-114561009-A Negative photosensitive polyamic acid ester resin and preparation method and application of composition thereof 波米科技有限公司 2022-05-31 CN disclosed
CN-114280887-A Negative photosensitive solid glue film developed by alkaline water system and preparation method thereof 明士(北京)新材料开发有限公司 2022-04-05 CN disclosed
CN-114207522-A Negative photosensitive resin composition, method for producing polyimide, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2022-03-18 CN disclosed
US-20220011669-A1 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2022-01-13 US disclosed
CN-113820920-A Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2021-12-21 CN disclosed
US-11163234-B2 Photosensitive resin composition and method for producing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2021-11-02 US disclosed
CN-107850844-B Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2021-09-07 CN disclosed
WO-2021153608-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR MANUFACTURING CURED RELIEF PATTERN 旭化成株式会社 2021-08-05 WO disclosed
CN-111522200-B Negative PSPI resin for 12-inch silicon wafer and preparation method and application thereof 中国科学院化学研究所 2021-07-27 CN disclosed
US-20210163650-A1 POLYMER MATERIAL MENICON CO., LTD. (JP) 2021-06-03 US disclosed
CN-110941142-B Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2021-05-25 CN disclosed
EP-3822296-A1 POLYMER MATERIAL Menicon Co., Ltd. (JP) 2021-05-19 EP disclosed
CN-112799281-A Photosensitive resin composition, method for producing polyimide, and semiconductor device 旭化成株式会社 2021-05-14 CN disclosed
CN-112334833-A Negative photosensitive resin composition, polyimide using same, and method for producing cured relief pattern 旭化成株式会社 2021-02-05 CN disclosed
WO-2021020463-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR POLYIMIDE, PRODUCTION METHOD FOR CURED RELIEF PATTERN, AND SEMICONDUCTOR DEVICE 旭化成株式会社 2021-02-04 WO disclosed
US-20200409263-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2020-12-31 US disclosed
CN-107615166-B Photosensitive resin composition, method for producing polyimide, and semiconductor device 旭化成株式会社 2020-12-25 CN disclosed
US-10831101-B2 Photosensitive resin composition, method for manufacturing cured relief pattern, and semiconductor apparatus ASAHI KASEI KABUSHIKI KAISHA (JP) 2020-11-10 US disclosed
US-20200301273-A1 PHOTOSENSITIVE RESIN COMPOSITION, POLYIMIDE PRODUCTION METHOD, AND SEMICONDUCTOR DEVICE ASAHI KASEI KABUSHIKI KAISHA (JP) 2020-09-24 US disclosed
CN-111522200-A Negative PSPI resin for 12-inch silicon wafer and preparation method and application thereof 中国科学院化学研究所 2020-08-11 CN disclosed
US-10719016-B2 Photosensitive resin composition, polyimide production method, and semiconductor device ASAHI KASEI KABUSHIKI KAISHA (JP) 2020-07-21 US disclosed
CN-110941142-A Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2020-03-31 CN disclosed
WO-2020026840-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING POLYIMIDE AND CURED RELIEF PATTERN USING SAME 旭化成株式会社 2020-02-06 WO disclosed
CN-106104381-B Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device 旭化成株式会社 2019-12-13 CN disclosed
US-10354932-B2 Semiconductor device including semiconductor element and redistribution layer electrically connected thereto, and method of manufacturing the device ASAHI KASEI KABUSHIKI KAISHA (JP) 2019-07-16 US disclosed
US-20190113845-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2019-04-18 US disclosed
US-20190072850-A1 PHOTOSENSITIVE RESIN COMPOSITION, POLYIMIDE PRODUCTION METHOD, AND SEMICONDUCTOR DEVICE ASAHI KASEI KABUSHIKI KAISHA (JP) 2019-03-07 US disclosed
US-20180373147-A1 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2018-12-27 US disclosed
US-20180342432-A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE DEVICE ASAHI KASEI KABUSHIKI KAISHA (JP) 2018-11-29 US disclosed
US-8742005-B2 Acrylate-based compounds and photosensitive composition comprising the same LG CHEM, LTD. (KR) 2014-06-03 US disclosed
US-20120156619-A1 ACRYLATE-BASED COMPOUNDS AND PHOTOSENSITIVE COMPOSITION COMPRISING THE SAME LG CHEM, LTD. (KR) 2012-06-21 US disclosed
CN-1668980-B Highly heat-resistant, negative-type photosensitive resin composition ASAHI KASEI E MATERIALS CORP 2010-05-12 CN disclosed
US-20100047185-A1 ACTVIE SUBSTANCE COMBINATION ISDIN S.A. (ES) 2010-02-25 US disclosed
US-7563557-B2 Polyamide ASAHI KASEI EMD CORPORATION (JP) 2009-07-21 US disclosed
US-20080193398-A1 Derivatives of Heptaazaphenalene, Methods for Obtaining Them, and Their Use as Protecting Agents Against Uv Radiation ISDIN, S.A. (ES) 2008-08-14 US disclosed
US-20070248910-A1 heat resistant; low residual stress after curing; electronic insulation; semiconductor; a phthalic acid having an amine or imide group and an aromatic tetracarboxylic acid and a diamino siloxane or polysiloxane; tetracarboxybiphenyl; 5-aminoisophthalic acid; cured relief pattern; polyamide-imide precurso ASAHI KASEI EMD CORPORATION (JP) 2007-10-25 US disclosed
US-7282323-B2 Highly heat-resistant, negative-type photosensitive resin composition ASAHI KASEI EMD CORPORATION (JP) 2007-10-16 US disclosed
EP-1775316-A1 POLYAMIDE Asahi Kasei EMD Corporation (JP) 2007-04-18 EP disclosed
US-20050244739-A1 Highly heat-resistant, negative-type photosensitive resin composition ASAHI KASEI EMD CORPORATION (JP) 2005-11-03 US disclosed
CN-1668980-A Highly heat-resistant, negative-type photosensitive resin composition ASAHI CHEMICAL CORP (JP) 2005-09-14 CN disclosed
EP-1536286-A1 HIGHLY HEAT-RESISTANT, NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION Asahi Kasei EMD Corporation (JP) 2005-06-01 EP disclosed
EP-1536286-A1 HIGHLY HEAT-RESISTANT, NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION Asahi Kasei EMD Corporation (JP) 2005-06-01 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (5 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-12613465-B2 Photosensitive resin composition and method for producing cured relief pattern ARCN1, GLRA1, PSMA1 TSHR 3312/4885MAPK1 2987/4885THRB 3525/4885
US-20080193398-A1 Derivatives of Heptaazaphenalene, Methods for Obtaining Them, and Their Use as Protecting Agents Against Uv Radiation ERCC4, XPA, CYP51A1 TSHR 4144/4885MAPK1 4184/4885THRB 3985/4885
US-20260099093-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN USING SAME, AND METHOD FOR PRODUCING POLYIMIDE FILM USING SAME CD79B, ITGA1, PTK2 TSHR 2388/4885MAPK1 1924/4885THRB 1053/4885
US-20100047185-A1 ACTVIE SUBSTANCE COMBINATION UGT2B17, TACR2, UGT1A1 TSHR 2328/4885MAPK1 4141/4885THRB 1148/4885
US-20120156619-A1 ACRYLATE-BASED COMPOUNDS AND PHOTOSENSITIVE COMPOSITION COMPRISING THE SAME TYR, PAH, ACR TSHR 4719/4885MAPK1 2621/4885THRB 4734/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.