SCHEMBL415460

SCHEMBL415460

c1ccc(C2c3c(ccc4ccccc34)Oc3ccc4ccccc4c32)cc1

nearest known ligand 0.68

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
NPSR1 Q6W5P4 15/20 0.68
CFTR P13569 1/20 0.67
GOPC Q9HD26 1/20 0.67
CYP1A2 P05177 1/20 0.54
CYP2C19 P33261 1/20 0.54
LMNA P02545 2/20 0.52
POLB P06746 1/20 0.50
HPGD P15428 1/20 0.49
MAPT P10636 1/20 0.48
HTT P42858 1/20 0.48
KMT2A Q03164 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21971125 0.90 NPSR1 (0.58) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL24224558 0.90 NPSR1 (0.58) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL25706841 0.87 NPSR1 (0.55) NPSR1CFTRGOPCLMNAPOLB
SCHEMBL2612448 0.86 NPSR1 (0.57) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL28473778 0.86 NPSR1 (0.54) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL28470714 0.86 NPSR1 (0.54) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL28472500 0.86 NPSR1 (0.54) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL28476460 0.86 MEN1 (0.59) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL21971720 0.86 NPSR1 (0.54) NPSR1CFTRGOPCCYP1A2CYP2C19
SCHEMBL21971091 0.86 NPSR1 (0.54) NPSR1CFTRGOPCCYP1A2CYP2C19

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 31 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11767398-B2 Spin-on compositions comprising an inorganic oxide component and an alkynyloxy substituted spin-on carbon component useful as hard masks and filling materials with improved shelf life MERCK PATENT GMBH (DE) 2023-09-26 US disclosed
US-11767398-B2 Spin-on compositions comprising an inorganic oxide component and an alkynyloxy substituted spin-on carbon component useful as hard masks and filling materials with improved shelf life MERCK PATENT GMBH (DE) 2023-09-26 US disclosed
CN-111804340-B Method for preparing dibenzoxanthene derivative by catalysis of magnetic mesoporous polymeric ionic liquid 曲阜师范大学 2022-05-27 CN disclosed
US-20220025109-A1 SPIN-ON COMPOSITIONS COMPRISING AN INORGANIC OXIDE COMPONENT AND AN ALKYNYLOXY SUBSTITUTED SPIN-ON CARBON COMPONENT USEFUL AS HARD MASKS AND FILLING MATERIALS WITH IMPROVED SHELF LIFE MERCK PERFORMANCE MATERIALS GERMANY GMBH (DE) 2022-01-27 US disclosed
US-11143962-B2 Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, pattern forming method, resin, and purification method MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2021-10-12 US disclosed
US-11137686-B2 Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, and resist pattern forming method MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2021-10-05 US disclosed
CN-111804340-A Method for preparing dibenzoxanthene derivative by catalysis of magnetic mesoporous polymeric ionic liquid 曲阜师范大学 2020-10-23 CN disclosed
US-20200144518-A1 ORGANIC ELECTROLUMINESCENCE DEVICE AND POLYCYCLIC COMPOUND FOR ORGANIC ELECTROLUMINESCENCE DEVICE SAMSUNG DISPLAY CO., LTD. (KR) 2020-05-07 US disclosed
EP-2739169-B1 POROUS CATALYTIC MATRICES FOR ELIMINATION OF TOXICANTS FOUND IN TOBACCO COMBUSTION PRODUCTS MASSACHUSETTS INST TECHNOLOGY (US) 2019-06-12 EP disclosed
US-20190041750-A1 MATERIAL FOR FORMING UNDERLAYER FILM FOR LITHOGRAPHY, COMPOSITION FOR FORMING UNDERLAYER FILM FOR LITHOGRAPHY, UNDERLAYER FILM FOR LITHOGRAPHY AND PRODUCTION METHOD THEREOF, PATTERN FORMING METHOD, RESIN, AND PURIFICATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2019-02-07 US disclosed
US-8846846-B2 Naphthalene derivative, resist bottom layer material, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-09-30 US disclosed
US-8795955-B2 Naphthalene derivative, resist bottom layer material, resist bottom layer forming method, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-05 US disclosed
US-8795955-B2 Naphthalene derivative, resist bottom layer material, resist bottom layer forming method, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-05 US disclosed
US-8795955-B2 Naphthalene derivative, resist bottom layer material, resist bottom layer forming method, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-05 US disclosed
US-20130032160-A1 Porous Catalytic Matrices for Elimination of Toxicants Found in Tobacco Combustion Products MASSACHUSETTS INSTITUTE OF TECHNOLOGY 2013-02-07 US disclosed
US-20120064725-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-15 US disclosed
US-20120064725-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-15 US disclosed
US-20110311920-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, RESIST BOTTOM LAYER FORMING METHOD, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD (JP) 2011-12-22 US disclosed
US-20110311920-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, RESIST BOTTOM LAYER FORMING METHOD, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD (JP) 2011-12-22 US disclosed
US-20110311920-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, RESIST BOTTOM LAYER FORMING METHOD, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD (JP) 2011-12-22 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (4 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20110311920-A1 NAPHTHALENE DERIVATIVE, RESIST BOTTOM LAYER MATERIAL, RESIST BOTTOM LAYER FORMING METHOD, AND PATTERNING PROCESS SMC1A, VCAM1, APOB NPSR1 2172/4885CFTR 4390/4885GOPC 2616/4885
US-20190041750-A1 MATERIAL FOR FORMING UNDERLAYER FILM FOR LITHOGRAPHY, COMPOSITION FOR FORMING UNDERLAYER FILM FOR LITHOGRAPHY, UNDERLAYER FILM FOR LITHOGRAPHY AND PRODUCTION METHOD THEREOF, PATTERN FORMING METHOD, RESIN, AND PURIFICATION METHOD MLLT1, JMJD6, DOT1L NPSR1 4579/4885CFTR 4282/4885GOPC 2485/4885
US-11137686-B2 Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, and resist pattern forming method MLLT1, PRDM9, NAP1L1 NPSR1 4116/4885CFTR 4014/4885GOPC 2248/4885
US-11143962-B2 Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, pattern forming method, resin, and purification method MLLT1, MLLT3, KDM2B NPSR1 4355/4885CFTR 4230/4885GOPC 2509/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.