SCHEMBL4235679

SCHEMBL4235679

CCCC(O)C(O)C(C)O

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.44
TSHR P16473 3/20 0.39
SPHK1 Q9NYA1 1/20 0.36
CHRM1 P11229 1/20 0.32
AKR1A1 P14550 1/20 0.32
CHRM3 P20309 1/20 0.32
HTR2A P28223 1/20 0.32
HTR2C P28335 1/20 0.32
ADRA1A P35348 1/20 0.32
HRH1 P35367 1/20 0.32
DRD3 P35462 1/20 0.32
SLC6A3 Q01959 1/20 0.32
HDAC1 Q13547 1/20 0.32
HDAC2 Q92769 1/20 0.32
TDP1 Q9NUW8 1/20 0.32
TRPV1 Q8NER1 1/20 0.31
CYP3A4 P08684 1/20 0.31
NFKB1 P19838 1/20 0.31
NPSR1 Q6W5P4 1/20 0.31
FDPS P14324 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13314790 0.92 LMNA (0.42) LMNATSHRSPHK1CHRM1AKR1A1
SCHEMBL18961176 0.92 LMNA (0.42) LMNATSHRSPHK1CHRM1AKR1A1
SCHEMBL1767673 0.83 SPHK1 (0.48) LMNASPHK1TRPV1CYP3A4FDPS
SCHEMBL13176655 0.82 LMNA (0.44) LMNATSHRSPHK1CHRM1AKR1A1
SCHEMBL105182 0.82 LMNA (0.44) LMNATSHRSPHK1CHRM1AKR1A1
SCHEMBL1302022 0.81
SCHEMBL1301102 0.81
SCHEMBL19125432 0.81
SCHEMBL1301003 0.81
SCHEMBL2984846 0.81

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 59 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4621488-A1 RINSE SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMATION METHOD USING SAME Ycchem Co., Ltd. (KR) 2025-09-24 EP claimed
US-20250236813-A1 RINSE SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMATION METHOD USING SAME YCCHEM CO., LTD. (KR) 2025-07-24 US claimed
CN-120019333-A Flushing liquid composition for extreme ultraviolet lithography and pattern forming method using same YC化学制品株式会社 2025-05-16 CN claimed
WO-2024106711-A1 RINSE SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMATION METHOD USING SAME 와이씨켐 주식회사 2024-05-23 WO claimed
US-20230266672-A1 PROCESS SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME YOUNG CHANG CHEMICAL CO., LTD (KR) 2023-08-24 US claimed
EP-4212958-A1 PROCESS SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME Young Chang Chemical Co., Ltd. (KR) 2023-07-19 EP claimed
CN-116097398-A Process liquid composition for extreme ultraviolet lithography and pattern forming method using the same 荣昌化学制品株式会社 2023-05-09 CN claimed
US-20220342313-A1 PROCESS LIQUID COMPOSITION FOR PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME YOUNG CHANG CHEMICAL CO., LTD (KR) 2022-10-27 US claimed
EP-4036648-A1 PROCESS LIQUID COMPOSITION FOR PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME Young Chang Chemical Co., Ltd. (KR) 2022-08-03 EP claimed
CN-114450640-A Process liquid composition for lithography and pattern formation method using the same 荣昌化学制品株式会社 2022-05-06 CN claimed
WO-2022055128-A1 PROCESS SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME 영창케미칼 주식회사 2022-03-17 WO claimed
WO-2021060672-A1 PROCESS LIQUID COMPOSITION FOR PHOTOLITHOGRAPHY AND PATTERN FORMING METHOD USING SAME 영창케미칼 주식회사 2021-04-01 WO claimed
US-7550239-B2 Alkyltriol titanyl phthalocyanine photoconductors XEROX CORPORATION (US) 2009-06-23 US claimed
US-20080176155-A1 Alkyltriol titanyl phthalocyanine photoconductors XEROX CORPORATION 2008-07-24 US claimed
US-5030550-A Containing a basic compound and a nonionic surfactant containing oxyethylene and oxypropylene groups FUJI PHOTO FILM CO., LTD. (JP) 1991-07-09 US claimed
EP-4621488-A1 RINSE SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMATION METHOD USING SAME Ycchem Co., Ltd. (KR) 2025-09-24 EP disclosed
US-20250236813-A1 RINSE SOLUTION COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY AND PATTERN FORMATION METHOD USING SAME YCCHEM CO., LTD. (KR) 2025-07-24 US disclosed
US-5684026-A GLYCOSIDASE INHIBITOR SEIKAGAKU KOGYO KABUSHIKI KAISHA (SEIKAGAKU CORPORATION) (JP) 1997-11-04 US disclosed
CN-1131672-A Aminocyclopentane derivative SEIKAGAKU KOGYO CO LTD (JP) 1996-09-25 CN disclosed
US-5030550-A Containing a basic compound and a nonionic surfactant containing oxyethylene and oxypropylene groups FUJI PHOTO FILM CO., LTD. (JP) 1991-07-09 US disclosed