SCHEMBL4403393

SCHEMBL4403393

O=Cc1ccc2cc3c(cc2c1)CCC=C3

nearest known ligand 0.37

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
CYP2A6 P11509 6/20 0.37
ALDH1A1 P00352 3/20 0.32
MEN1 O00255 1/20 0.32
GAA P10253 1/20 0.32
MAPT P10636 1/20 0.32
HPGD P15428 1/20 0.32
KMT2A Q03164 1/20 0.32
HSD17B10 Q99714 1/20 0.31
TDP1 Q9NUW8 1/20 0.31
KDM4E B2RXH2 1/20 0.31
PTGS2 P35354 1/20 0.31
RAB9A P51151 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4402558 1.00 CYP2A6 (0.37) CYP2A6ALDH1A1MEN1GAAMAPT
SCHEMBL4402546 0.84 CYP2A6 (0.39) CYP2A6ALDH1A1MEN1GAAMAPT
SCHEMBL4408087 0.84 CYP2A6 (0.39) CYP2A6ALDH1A1MEN1GAAMAPT
SCHEMBL4408078 0.82 ALDH1A1 (0.36) CYP2A6ALDH1A1MEN1GAAMAPT
SCHEMBL4405513 0.82 ALDH1A1 (0.39) CYP2A6ALDH1A1MEN1GAAMAPT
SCHEMBL8664024 0.79
SCHEMBL3418672 0.76 MEN1 (0.35) ALDH1A1MEN1KMT2AHSD17B10TDP1
SCHEMBL17220622 0.76 MEN1 (0.35) ALDH1A1MEN1KMT2AHSD17B10TDP1
SCHEMBL3465539 0.76 MEN1 (0.35) ALDH1A1MEN1KMT2AHSD17B10TDP1
SCHEMBL1818769 0.76 MEN1 (0.35) ALDH1A1MEN1KMT2AHSD17B10TDP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8877422-B2 Resist underlayer film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-04 US disclosed
US-8877422-B2 Resist underlayer film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-04 US disclosed
US-20120108071-A1 RESIST UNDERLAYER FILM COMPOSITION AND PATTERNING PROCESS USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-05-03 US disclosed
US-20120108071-A1 RESIST UNDERLAYER FILM COMPOSITION AND PATTERNING PROCESS USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-05-03 US disclosed
EP-2447775-A1 Resist underlayer film composition and patterning process using the same Shin-Etsu Chemical Co., Ltd. (JP) 2012-05-02 EP disclosed