SCHEMBL4574758

SCHEMBL4574758

CC1(O)CCOC1=O

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28470467 0.86
SCHEMBL149596 0.76
SCHEMBL5860687 0.75 LMNA (0.55)
SCHEMBL2476666 0.74
SCHEMBL5078178 0.73 LMNA (0.44)
SCHEMBL3387084 0.72
SCHEMBL18949957 0.72
SCHEMBL24774637 0.70
SCHEMBL26054544 0.70
SCHEMBL3032063 0.70

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 149 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6388101-B1 METHACRYLIC ACID ESTER OF 3-HYDROXY-3-METHYL-1-OXACYCLOPENTAN-2-ONE TOKYO OHKA KOGYO CO., LTD. (JP) 2002-05-14 US claimed
US-11874601-B2 Resist composition, method of forming resist pattern, compound, and acid diffusion-controlling agent TOKYO OHKA KOGYO CO., LTD. (JP) 2024-01-16 US disclosed
US-11835857-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-12-05 US disclosed
US-11822240-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-11-21 US disclosed
US-11822240-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-11-21 US disclosed
US-11754922-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-12 US disclosed
US-11754922-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-09-12 US disclosed
US-11709425-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-25 US disclosed
US-11703757-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-18 US disclosed
US-11703756-B2 Resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2023-07-18 US disclosed
US-20130302736-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-14 US disclosed
US-20130260314-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2013-10-03 US disclosed
US-20130260312-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2013-10-03 US disclosed
US-20130260319-A1 METHOD OF PRODUCING POLYMERIC COMPOUND, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-10-03 US disclosed
US-20130209941-A1 METHOD OF FORMING PATTERN TOKYO ELECTRON LIMITED (JP) 2013-08-15 US disclosed
EP-2584409-A1 RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, POLYMERIC COMPOUND, AND COMPOUND Tokyo Ohka Kogyo Co., Ltd. (JP) 2013-04-24 EP disclosed
WO-2008080988-A2 CYCLOPENTANONE DERIVATIVES, METHOD OF SYNTHESIS AND USES THEREOF NEUROPHARMA, S.A. (ES) 2008-07-10 WO disclosed
US-6388101-B1 METHACRYLIC ACID ESTER OF 3-HYDROXY-3-METHYL-1-OXACYCLOPENTAN-2-ONE TOKYO OHKA KOGYO CO., LTD. (JP) 2002-05-14 US disclosed
CN-1043529-C Carbonylation of epoxides SHELL INT RESEARCH (NL) 1999-06-02 CN disclosed
CN-1082540-A The carbonylation of epoxy compounds SHELL INT RESEARCH (NL) 1994-02-23 CN disclosed