SCHEMBL4580842

SCHEMBL4580842

CC(C)(C)ONCCCCCCCC(=C=O)NOC(C)(C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14935747 1.00
SCHEMBL14912856 1.00
SCHEMBL5667893 1.00
SCHEMBL9126113 0.83 PAOX (0.38)
SCHEMBL9614821 0.74 POLB (0.30)
SCHEMBL6202483 0.74 ADRA1A (0.50)
SCHEMBL7186679 0.74 ADRA1A (0.50)
SCHEMBL7289421 0.74 ADRA1A (0.50)
SCHEMBL7286381 0.72 ADRA1A (0.47)
SCHEMBL8959106 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7326516-B2 Resist composition for immersion exposure and pattern formation method using the same FUJIFILM CORPORATION (JP) 2008-02-05 US disclosed
US-20050186503-A1 Resist composition for immersion exposure and pattern formation method using the same FUJI PHOTO FILM CO., LTD. 2005-08-25 US disclosed