SCHEMBL4591928

SCHEMBL4591928

CCOCC(C)O.CCOCC(C)OC(C)=O

nearest known ligand 0.42

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
TSHR P16473 3/20 0.42
CHRM2 P08172 1/20 0.42
CHRM4 P08173 1/20 0.42
CHRM1 P11229 1/20 0.42
TBXA2R P21731 1/20 0.42
HSD17B10 Q99714 2/20 0.42
MAPT P10636 2/20 0.41
GALR3 O60755 1/20 0.41
BLM P54132 1/20 0.41
SMN1; SMN2 Q16637 1/20 0.41
TDP1 Q9NUW8 2/20 0.40
ALDH1A1 P00352 2/20 0.36
LMNA P02545 1/20 0.33
ALOX15 P16050 1/20 0.32
MAPK1 P28482 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Isopropyl Alcohol SCHEMBL28434694 0.92 TSHR (0.45) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL60590 0.92 TSHR (0.48) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL155545 0.91 HSD17B10 (0.42) TSHRCHRM2CHRM4CHRM1TBXA2R
Methyl Alcohol SCHEMBL3842813 0.90 TSHR (0.47) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL251201 0.90 TSHR (0.47) TSHRCHRM2CHRM4CHRM1TBXA2R
Propylene Glycol SCHEMBL17627367 0.89 TSHR (0.40) TSHRCHRM2CHRM4CHRM1TBXA2R
Propylene Glycol SCHEMBL155544 0.89 TSHR (0.40) TSHRCHRM2CHRM4CHRM1TBXA2R
Water SCHEMBL8208129 0.88 TSHR (0.45) TSHRCHRM2CHRM4CHRM1TBXA2R
SCHEMBL28080800 0.87 HSD17B10 (0.53) TSHRCHRM2CHRM4CHRM1TBXA2R
Propylene Glycol SCHEMBL5503254 0.87 TSHR (0.39) TSHRCHRM2CHRM4CHRM1TBXA2R

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3000553-B1 USE OF BISMUTH OXIDE-BASED ADDITIVE FOR LASER MARKING TOKAN MATERIAL TECH CO LTD (JP) 2019-10-02 EP disclosed
US-9637651-B2 Bismuth oxide-based addictive for laser marking TOKAN MATERIAL TECHNOLOGY CO., LTD. (JP) 2017-05-02 US disclosed
US-20160168399-A1 BISMUTH OXIDE-BASED ADDICTIVE FOR LASER MARKING TOKAN MATERIAL TECHNOLOGY CO., LTD. (JP) 2016-06-16 US disclosed
EP-3000553-A1 BISMUTH OXIDE-BASED ADDITIVE FOR LASER MARKING Tokan Material Technology Co., Ltd. (JP) 2016-03-30 EP disclosed
US-7425404-B2 Chemical amplification resist composition and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2008-09-16 US disclosed
US-7291441-B2 Positive resist composition and pattern forming method utilizing the same FUJIFILM CORPORATION (JP) 2007-11-06 US disclosed
US-20060046190-A1 Positive resist composition and pattern forming method utilizing the same FUJI PHOTO FILM CO., LTD. 2006-03-02 US disclosed
US-20060040208-A1 Chemical amplification resist composition and pattern-forming method using the same FUJI PHOTO FILM CO., LTD. 2006-02-23 US disclosed