SCHEMBL482464

SCHEMBL482464

O=C(O)C=CC=Cc1ccc(O)cc1.O=C1C=CC(=O)N1

nearest known ligand 0.56

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TYR P14679 3/20 0.56
AKR1B10 O60218 2/20 0.56
AKR1B1 P15121 2/20 0.56
PKM P14618 2/20 0.56
ESR1 P03372 2/20 0.56
ESR2 Q92731 2/20 0.56
CA12 O43570 2/20 0.56
CA1 P00915 2/20 0.56
CA2 P00918 2/20 0.56
CA7 P43166 2/20 0.56
CA9 Q16790 2/20 0.56
CA14 Q9ULX7 2/20 0.56
CA3 P07451 1/20 0.56
CA4 P22748 1/20 0.56
CA6 P23280 1/20 0.56
DPP4 P27487 1/20 0.56
CA5A P35218 1/20 0.56
HCAR2 Q8TDS4 1/20 0.56
CA5B Q9Y2D0 1/20 0.56
APP P05067 1/20 0.48

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL482501 0.87 TYR (0.73) TYRAKR1B10AKR1B1PKMESR1
SCHEMBL10338866 0.87 TYR (0.73) TYRAKR1B10AKR1B1PKMESR1
SCHEMBL9998594 0.87 TYR (0.73) TYRAKR1B10AKR1B1PKMESR1
SCHEMBL9121241 0.73 APP (0.68) TYRAKR1B1PKMESR1CA12
SCHEMBL9121245 0.73 APP (0.68) TYRAKR1B1PKMESR1CA12
Coumaric Acid SCHEMBL20702657 0.73 ESR1 (1.00) TYRAKR1B10AKR1B1PKMESR1
Coumaric Acid SCHEMBL6333102 0.73 ESR1 (1.00) TYRAKR1B10AKR1B1PKMESR1
Coumaric Acid SCHEMBL6333097 0.73 ESR1 (1.00) TYRAKR1B10AKR1B1PKMESR1
Coumaric Acid SCHEMBL39106 0.73 ESR1 (1.00) TYRAKR1B10AKR1B1PKMESR1
Coumaric Acid SCHEMBL43601 0.73 ESR1 (1.00) TYRAKR1B10AKR1B1PKMESR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 96 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2105794-B1 Novel photoacid generator, resist composition, and patterning process SHINETSU CHEMICAL CO (JP) 2015-08-19 EP disclosed
EP-2033966-B1 Novel photoacid generators, resist compositons, and patterning processes SHINETSU CHEMICAL CO (JP) 2015-07-29 EP disclosed
EP-2000851-B1 Photomask blank, resist pattern forming process, and photomask preparation process SHINETSU CHEMICAL CO (JP) 2015-07-29 EP disclosed
EP-1099983-B1 Chemically amplified positive resist composition and patterning method SHINETSU CHEMICAL CO (JP) 2014-08-06 EP disclosed
US-8609889-B2 Photoacid generator, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-12-17 US disclosed
US-8541158-B2 Positive resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-09-24 US disclosed
EP-1710230-B1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2013-08-14 EP disclosed
US-8394570-B2 Sulfonium salt, acid generator, resist composition, photomask blank, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-03-12 US disclosed
US-8343694-B2 Photomask blank, resist pattern forming process, and photomask preparation process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-01 US disclosed
US-8268531-B2 Photoacid generator compounds and compositions CORNELL RESEARCH FOUNDATION, INC. (US) 2012-09-18 US disclosed
US-6440634-B1 MICROFABRICATION OF INTEGRATED CIRCUITS, DEEP UV LITHOGRAPHY; PHENYLSULFONATE SALTS OF SULFONIUM OR IODINIUM CATIONS SHIN-ETSU CHEMICAL CO., LTD (JP) 2002-08-27 US disclosed
US-6416928-B1 HALOGENONIUM OR SULFONIUM SALTS OF SULFONATED DIPHENYLALKANE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-07-09 US disclosed
US-20020076643-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-06-20 US disclosed
US-20020077493-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-06-20 US disclosed
US-6395446-B1 CONTAINING SULFONYLDIAZOMETHANE COMPOUND AS ACID GENERATOR SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-05-28 US disclosed
US-6338931-B1 PHOTOACID GENERATOR OF SULFONYLDIAZOMETHANE COMPOUND SHIN-ETSU CHEMICAL CO., LTD. (JP) 2002-01-15 US disclosed
US-20010035394-A1 Chemically amplified positive resist composition and patterning method SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-11-01 US disclosed
EP-1136885-A1 Chemically amplified positive resist composition and patterning method SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-09-26 EP disclosed
EP-1099983-A1 Chemically amplified positive resist composition and patterning method Shin-Etsu Chemical Co., Ltd. (JP) 2001-05-16 EP disclosed
EP-1077391-A1 Onium salts, photoacid generators for resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-02-21 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20020077493-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process ABL1, PI4K2B, FES TYR 5/4885AKR1B10 3863/4885AKR1B1 4353/4885
US-20020076643-A1 Novel onium salts, photoacid generators, resist compositions, and patterning process PNN, PI4K2B, PI4K2A TYR 5/4885AKR1B10 3802/4885AKR1B1 4349/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.