Ammonia Solution, Strong

Ammonia Solution, Strong

SCHEMBL490795

CC(C)(C)C(O)O.N

nearest known ligand 0.00

Full drug profile on Sugi Atlas →

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL205358 0.95
SCHEMBL30578458 0.90
SCHEMBL476832 0.86 ALDH1A1 (0.42)
Ammonia Solution, Strong SCHEMBL5088015 0.76
SCHEMBL10942109 0.73 TSHR (0.38)
Ammonia Solution, Strong SCHEMBL17508556 0.73
1,5-Pentanediol SCHEMBL4651355 0.71 LMNA (0.45)
Hydrochloric Acid SCHEMBL9720337 0.70
SCHEMBL2164167 0.70 TSHR (0.41)
SCHEMBL2886957 0.70

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 41 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6152148-A APPLYING MECHANICAL FRICTIONAL FORCE TO THE SURFACE OF THE WAFER BEARING A POLY(ARYLENE ETHER) DIELECTRIC LAYER WHILE APPLYING TO THE SURFACE AN ALKALINE AQUEOUS SOLUTION COMPRISING A SURFACTANT AND A TETRAALKYLAMMONIUM HYDROXYDE HONEYWELL, INC. (US) 2000-11-28 US claimed
WO-2000014785-A1 A METHOD FOR CLEANING ORGANIC DIELECTRIC FILM CONTAINING SEMICONDUCTOR WAFERS ALLIEDSIGNAL INC. (US) 2000-03-16 WO claimed
EP-2778782-B1 Negative working radiation-sensitive elements KODAK GRAPHIC COMM GMBH (DE) 2015-12-30 EP disclosed
EP-2778782-A1 Negative working radiation-sensitive elements Kodak Graphic Communications GmbH (DE) 2014-09-17 EP disclosed
EP-2735903-A1 Negative working lithographic printing plate precursors comprising a hyperbranched binder material Eastman Kodak Company (US) 2014-05-28 EP disclosed
US-8652759-B2 Processing of lithographic printing plates with a developer solution containing a hydrophilic polymer EASTMAN KODAK COMPANY (US) 2014-02-18 US disclosed
US-8507181-B2 Method for developing and sealing of lithographic printing plates KODAK (NEAR EAST) INC. 2013-08-13 US disclosed
US-8361701-B2 Method for making lithographic plates EASTMAN KODAK COMPANY (US) 2013-01-29 US disclosed
EP-2293144-B1 Method of drying lithographic printing plates after single-step-processing EASTMAN KODAK CO (US) 2012-11-07 EP disclosed
US-20120152139-A1 METHOD AND APPARATUS FOR DRYING AFTER SINGLE-STEP-PROCESSING OF LITHOGRAPHIC PRINTING PLATES QUALEX INC. 2012-06-21 US disclosed
EP-2284005-B1 Lithographic printing plate precursors with beta-hydroxy alkylamide crosslinkers EASTMAN KODAK CO (US) 2012-05-02 EP disclosed
US-20070196776-A1 Stable High Ph Developer KODAK POLYCHROME GRAPHICS GMBH (DE) 2007-08-23 US disclosed
EP-1723471-A2 STABLE HIGH PH DEVELOPER Kodak Polychrome Graphics GmbH (DE) 2006-11-22 EP disclosed
WO-2006063626-A2 STABLE HIGH PH DEVELOPER KODAK POLYCHROME GRAPHICS GMBH (DE) 2006-06-22 WO disclosed
EP-0804753-B1 METHOD OF DEVELOPING POSITIVE PHOTORESIST AND DEVELOPING COMPOSITIONS THEREFOR CLARIANT FINANCE BVI LTD (VG) 2001-05-02 EP disclosed
US-6152148-A APPLYING MECHANICAL FRICTIONAL FORCE TO THE SURFACE OF THE WAFER BEARING A POLY(ARYLENE ETHER) DIELECTRIC LAYER WHILE APPLYING TO THE SURFACE AN ALKALINE AQUEOUS SOLUTION COMPRISING A SURFACTANT AND A TETRAALKYLAMMONIUM HYDROXYDE HONEYWELL, INC. (US) 2000-11-28 US disclosed
US-5821036-A DEVELOPER INCLUDES AN AMMONIUM HYDROXIDE AQUEOUS BASE AND A SURFACTANT OF THE FLUORINATED ALKYL ALKOXYLATE CLASS CLARIANT FINANCE (BVI) LIMITED (VG) 1998-10-13 US disclosed
EP-0804753-A1 METHOD OF DEVELOPING POSITIVE PHOTORESIST AND COMPOSITIONS THEREFOR HOECHST CELANESE CORPORATION (US) 1997-11-05 EP disclosed
WO-1997034200-A1 PROCESS FOR DEVELOPING A POSITIVE PHOTORESIST HOECHST CELANESE CORPORATION (US) 1997-09-18 WO disclosed
WO-1996022564-A1 METHOD OF DEVELOPING POSITIVE PHOTORESIST AND COMPOSITIONS THEREFOR HOECHST CELANESE CORPORATION (US) 1996-07-25 WO disclosed