SCHEMBL49557

SCHEMBL49557

CN(C)[Si](C)(C)N(C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL16284806 0.74
SCHEMBL22589391 0.74
SCHEMBL2025023 0.73
SCHEMBL16284817 0.71
SCHEMBL430721 0.71
SCHEMBL377532 0.71
SCHEMBL17721697 0.69
SCHEMBL2104186 0.69
SCHEMBL17338715 0.69
SCHEMBL25220941 0.67

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 2336 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260139200-A1 COMPOSITIONS AND METHODS FOR VAPOR PHASE SURFACE MODIFICATION FUJIFILM ELECTRONIC MAT U S A INC (US) 2026-05-21 US claimed
US-20260136856-A1 METHOD AND SYSTEM FOR FORMING SILICON NITRIDE ON A SIDEWALL OF A FEATURE ASM IP HOLDING BV (NL) 2026-05-14 US claimed
US-20260136853-A1 REMOVING OR PREVENTING RESIDUE SUBSEQUENT TO REPAIRING LOW-K MATERIALS APPLIED MATERIALS, INC. (US) 2026-05-14 US claimed
US-20260123314-A1 PROTECTIVE FILM FORMING AGENT FOR SILICON-BASED SUBSTRATE, METHOD FOR PROCESSING SILICON-BASED SUBSTRATE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TOKYO OHKA KOGYO CO LTD (JP) 2026-04-30 US claimed
US-20260123302-A1 METHOD AND APPARATUS FOR DEPOSITING A CARBON-CONTAINING MATERIAL ASM IP HOLDING BV (NL) 2026-04-30 US claimed
US-20260110963-A1 PHOTORESIST COMPOSITION, PATTERN FORMING METHOD USING NEAR-FIELD SURFACE LAYER IMAGING, AND DEPOSITION DEVICE INST OPTICS & ELECTRONICS CAS (CN) 2026-04-23 US claimed
US-12604651-B2 Rapid fabrication of semiconductor thin films MASSACHUSETTS INSTITUTE OF TECHNOLOGY (US) 2026-04-14 US claimed
US-12598977-B2 Fill of vias in single and dual damascene structures using self-assembled monolayer INTEL CORPORATION (US) 2026-04-07 US claimed
US-12588435-B2 Selective inhibition for selective metal deposition TOKYO ELECTRON LIMITED (JP) 2026-03-24 US claimed
US-12557370-B2 Semiconductor device manufacturing method SAMSUNG ELECTRONICS CO., LTD. (KR) 2026-02-17 US claimed
EP-0184567-B1 PROCESS FOR THE FORMATION OF NEGATIVE PATTERNS IN A PHOTORESIST LAYER UCB Electronics, S.A. (BE) 1989-12-13 EP claimed
US-4885262-A Chemical modification of spin-on glass for improved performance in IC fabrication INTEL CORPORATION (US) 1989-12-05 US claimed
US-4778871-A SILPHENYLENE-VINYLMETHYLSILOXANE ELASTOMER CURED WITH MIXTURE HYDROSILYLATION AND URETHANE CURING AGENTS THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY (US) 1988-10-18 US claimed
EP-0274757-A2 Bilayer lithographic process EASTMAN KODAK COMPANY (a New Jersey corporation) (US) 1988-07-20 EP claimed
US-4491669-A Mixed alkoxyaminosilanes, methods of making same and vulcanizing silicons prepared therefrom PETRARCH SYSTEMS INC. (US) 1985-01-01 US claimed
US-4412874-A Silane ballistic modifier containing propellant THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY (US) 1983-11-01 US claimed
US-4412073-A Isocyanurate preparation by catalytic, aminosilyl initiated cyclotrimerization of isocyanates RHONE-POULENC SPECIALITES CHIMIQUES (FR) 1983-10-25 US claimed
US-4379067-A Self-sealing refrigerant Packo, Joseph J. (US) 1983-04-05 US claimed
US-4304805-A Sealing leaks by polymerization of volatilized aminosilane monomers Packo, Joseph J. (US) 1981-12-08 US claimed
US-4237172-A Sealing leaks by polymerization of volatilized aminosilane monomers Packo, Joseph J. (US) 1980-12-02 US claimed