SCHEMBL5033348

SCHEMBL5033348

C=C(C)c1ccc(C(=O)Nc2ccccc2O)cc1

nearest known ligand 0.66

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
NPC1 O15118 5/20 0.66
KMT2A Q03164 5/20 0.66
MEN1 O00255 4/20 0.66
RAB9A P51151 3/20 0.66
TP53 P04637 2/20 0.66
GAA P10253 2/20 0.54
LMNA P02545 1/20 0.54
HTT P42858 1/20 0.54
KCNMA1 Q12791 1/20 0.54
TOP1 P11387 2/20 0.51
TERT O14746 1/20 0.51
HDAC1 Q13547 3/20 0.50
POLB P06746 2/20 0.50
F10 P00742 1/20 0.50
KDM4E B2RXH2 1/20 0.50
MAPT P10636 1/20 0.50
TDP1 Q9NUW8 1/20 0.50
TOP2A P11388 1/20 0.49
TOP2B Q02880 1/20 0.49
HPGD P15428 1/20 0.49

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6029925 0.88 NPC1 (0.82) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL16404286 0.86 NPC1 (0.70) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL15782665 0.84 PARP1 (0.51) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL3661213 0.82 NPC1 (0.74) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL1470784 0.82 NPC1 (0.73) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL4946074 0.82 NPC1 (0.73) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL8349162 0.82 HDAC1 (0.70) HDAC1HDAC3
SCHEMBL15782663 0.81 IDO1 (0.51) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL308111 0.81 NPC1 (0.72) NPC1KMT2AMEN1RAB9ATP53
SCHEMBL14030915 0.80 MAPT (0.50) KMT2AMEN1RAB9AGAALMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11573491-B2 Negative tone photosensitive composition for EUV light, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2023-02-07 US disclosed
EP-3779596-A1 NEGATIVE-TYPE PHOTOSENSITIVE COMPOSITION FOR EUV LIGHT, PATTERN FORMING METHOD, AND MANUFACTURING METHOD OF ELECTRONIC DEVICE FUJIFILM Corporation (JP) 2021-02-17 EP disclosed
US-7439005-B2 Styrene derivative, styrene polymer, photosensitive resin composition, and method for forming pattern NEC CORPORATION (JP) 2008-10-21 US disclosed
US-7439005-B2 Styrene derivative, styrene polymer, photosensitive resin composition, and method for forming pattern NEC CORPORATION (JP) 2008-10-21 US disclosed
US-7439005-B2 Styrene derivative, styrene polymer, photosensitive resin composition, and method for forming pattern NEC CORPORATION (JP) 2008-10-21 US disclosed
US-20070134586-A1 Styrene derivative, styrene polymer, photosensitive resin composition, and method for forming pattern NEC CORPORATION (JP) 2007-06-14 US disclosed
US-20070134586-A1 Styrene derivative, styrene polymer, photosensitive resin composition, and method for forming pattern NEC CORPORATION (JP) 2007-06-14 US disclosed
US-20070134586-A1 Styrene derivative, styrene polymer, photosensitive resin composition, and method for forming pattern NEC CORPORATION (JP) 2007-06-14 US disclosed