SCHEMBL503438

SCHEMBL503438

CC(=O)OC=C(C)C(=O)O

nearest known ligand 0.35

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
PTGS1 P23219 1/20 0.34
AKR1C3 P42330 1/20 0.34
ALDH1A1 P00352 2/20 0.33
TSHR P16473 1/20 0.33
FFAR3 O14843 1/20 0.32
LCK P06239 1/20 0.32
FYN P06241 1/20 0.32
APEX1 P27695 2/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3414053 1.00 PTGS1 (0.34) PTGS1AKR1C3ALDH1A1TSHRFFAR3
SCHEMBL5134574 0.83 PTGS1 (0.34) PTGS1AKR1C3FFAR3LCKFYN
SCHEMBL3739902 0.79 LMNA (0.33) PTGS1AKR1C3
SCHEMBL28517978 0.77
SCHEMBL1865885 0.77 PTGS1 (0.37) PTGS1AKR1C3ALDH1A1TSHRFFAR3
SCHEMBL1865884 0.77 PTGS1 (0.37) PTGS1AKR1C3ALDH1A1TSHRFFAR3
SCHEMBL30864320 0.76 LMNA (0.35) ALDH1A1TSHR
SCHEMBL7482039 0.75 PTGS1 (0.30) PTGS1AKR1C3
SCHEMBL5591839 0.75 ALDH1A1 (0.42) PTGS1AKR1C3ALDH1A1TSHR
SCHEMBL28201801 0.75 PTGS1 (0.30) PTGS1AKR1C3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 44 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3411427-B1 MECHANOCHEMICAL RESISTANT INTRAMOLECULAR CROSSLINKED POLYMERS AND USES THEREOF TECHNION RES & DEV FOUNDATION (IL) 2021-10-06 EP claimed
CN-110691818-A Polymer, thermochromic and/or hydrogel compositions and devices, including products embodying same, and methods and processes for making same 上海创始实业(集团)有限公司 2020-01-14 CN disclosed
CN-109782540-A The forming method of photoetching agent pattern 台湾积体电路制造股份有限公司 2019-05-21 CN disclosed
CN-109782553-A Photoresist developer 台湾积体电路制造股份有限公司 2019-05-21 CN disclosed
EP-1708027-B1 UPPER LAYER FILM FORMING COMPOSITION FOR LIQUID IMMERSION AND METHOD OF FORMING PHOTORESIST PATTERN JSR CORP (JP) 2019-03-13 EP disclosed
US-9182674-B2 Immersion upper layer film forming composition and method of forming photoresist pattern JSR CORPORATION (JP) 2015-11-10 US disclosed
WO-2015132734-A1 3D PRINTED NAILS MOYAL DANIEL (IL) 2015-09-11 WO disclosed
US-20140147794-A1 METHOD OF FORMING PHOTORESIST PATTERN JSR CORPORATION (JP) 2014-05-29 US disclosed
EP-2468780-B1 Copolymer and top coating composition JSR CORP (JP) 2013-11-13 EP disclosed
US-8580482-B2 Copolymer and top coating composition JSR CORPORATION (JP) 2013-11-12 US disclosed
US-20070269734-A1 Uper Layer Film Forming Composition for Liquid Immersion and Method of Forming Photoresist Pattern JSR CORPORATION (JP) 2007-11-22 US disclosed
EP-1818723-A1 COMPOSITION FOR FORMING ANTIREFLECTION FILM, LAYERED PRODUCT, AND METHOD OF FORMING RESIST PATTERN JSR Corporation (JP) 2007-08-15 EP disclosed
EP-1806370-A1 COPOLYMER AND UPPER FILM-FORMING COMPOSITION JSR Corporation (JP) 2007-07-11 EP disclosed
US-20060223008-A1 Composition for forming antireflection film, laminate, and method for forming resist pattern JSR CORPORATION (JP) 2006-10-05 US disclosed
EP-1708027-A1 UPPER LAYER FILM FORMING COMPOSITION FOR LIQUID IMMERSION AND METHOD OF FORMING PHOTORESIST PATTERN JSR Corporation (JP) 2006-10-04 EP disclosed
EP-1703327-A2 Composition for forming antireflection film, laminate, and method for forming resist pattern JSR Corporation (JP) 2006-09-20 EP disclosed
US-6455033-B1 ANTIMICROBIAL COMPOSITION; POLYMERIZABLE ACRYLIC MONOMERS; POLYMERIZATION CATALYSTS; MYCONE DENTAL CORP. 2002-09-24 US disclosed
US-5525457-A Copolymers of unsaturated carboxylic acid, an epoxy-functional monomer, and cinnamoylphenyl group-monomer; high halation preventing effect, involves no sublimation of radiation absorbing components contained therein, possesses excellent heat resistance, dry etching performance, storage stability JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1996-06-11 US disclosed
US-5410005-A Comprising acrylic amide and ester copolymers and their salts, having carboxyl and sulfonic acid groups as well as fluoro JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1995-04-25 US disclosed
EP-0583918-A2 Reflection preventing film and process for forming resist pattern using the same JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1994-02-23 EP disclosed