SCHEMBL504002

SCHEMBL504002

CC12CC[C@H](C(CC(=O)O)C1O)C2(C)C

nearest known ligand 0.40

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
DPP4 P27487 1/20 0.40
CNR2 P34972 2/20 0.33
CDC25A P30304 6/20 0.33
HSD11B1 P28845 1/20 0.32
PTPN1 P18031 1/20 0.32
CDC45 O75419 2/20 0.32
ATP1A1 P05023 1/20 0.32
ATP1B1 P05026 1/20 0.32
ATP1A3 P13637 1/20 0.32
ATP1B2 P14415 1/20 0.32
ATP1A2 P50993 1/20 0.32
ATP1B3 P54709 1/20 0.32
FXYD2 P54710 1/20 0.32
ATP1A4 Q13733 1/20 0.32
PTPRC P08575 1/20 0.32
POLA1 P09884 1/20 0.30
TOP2A P11388 1/20 0.30
TOP2B Q02880 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL638375 1.00 DPP4 (0.40) DPP4CNR2CDC25AHSD11B1PTPN1
SCHEMBL1285599 1.00 DPP4 (0.40) DPP4CNR2CDC25AHSD11B1PTPN1
SCHEMBL6907574 0.78 CNR2 (0.36) DPP4CNR2
SCHEMBL6907572 0.78 CNR2 (0.36) DPP4CNR2
SCHEMBL637619 0.73 ALDH1A1 (0.30)
SCHEMBL10406290 0.72 CNR2 (0.36) CNR2
SCHEMBL6568487 0.71 ALDH1A1 (0.38) DPP4
SCHEMBL5407267 0.69 CNR2 (0.36) DPP4CNR2
SCHEMBL1668635 0.69 CNR2 (0.36) DPP4CNR2
SCHEMBL29761172 0.69 CNR2 (0.36) DPP4CNR2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20140147794-A1 METHOD OF FORMING PHOTORESIST PATTERN JSR CORPORATION (JP) 2014-05-29 US disclosed
US-8435718-B2 Upper layer-forming composition and photoresist patterning method JSR CORPORATION (JP) 2013-05-07 US disclosed
US-20120171613-A1 UPPER LAYER FILM-FORMING COMPOSITION AND METHOD OF FORMING PHOTORESIST PATTERN JSR CORPORATION (JP) 2012-07-05 US disclosed
EP-1950610-B1 IMMERSION LITHOGRAPHIC COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR CORP (JP) 2012-05-02 EP disclosed
US-20120028198-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2012-02-02 US disclosed
US-20100003615-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2010-01-07 US disclosed
EP-1950610-A1 COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR Corporation (JP) 2008-07-30 EP disclosed