SCHEMBL512417

SCHEMBL512417

C[Si](C)(CC(=O)O)O[Si](C)(C)CC(=O)O

nearest known ligand 0.35

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
FFAR3 O14843 2/20 0.35
TSHR P16473 2/20 0.33
HDAC3 O15379 1/20 0.30
HDAC1 Q13547 1/20 0.30
HDAC2 Q92769 1/20 0.30
HDAC8 Q9BY41 1/20 0.30
LDHA P00338 1/20 0.30
SRR Q9GZT4 1/20 0.30
LMNA P02545 1/20 0.30
ALKBH5 Q6P6C2 1/20 0.30
SUCNR1 Q9BXA5 1/20 0.30
EGLN1 Q9GZT9 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14518486 0.89 FFAR3 (0.32) FFAR3TSHR
SCHEMBL9419778 0.80
SCHEMBL18231793 0.78
SCHEMBL16021771 0.75 AKR1B1 (0.34) TSHR
SCHEMBL527377 0.74 TSHR (0.33) FFAR3TSHRLMNA
SCHEMBL17230164 0.73
SCHEMBL513566 0.72 TSHR (0.41) FFAR3TSHRHDAC3HDAC1HDAC2
SCHEMBL29065871 0.71 FFAR3 (0.41) FFAR3TSHRHDAC3HDAC1HDAC2
SCHEMBL632284 0.71 FFAR3 (0.41) FFAR3TSHRHDAC3HDAC1HDAC2
Hydrochloric Acid SCHEMBL11148349 0.70 TSHR (0.39) FFAR3TSHRHDAC3HDAC1HDAC2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2598589-B1 A COMPOSITION FOR COATING OVER A PHOTORESIST PATTERN MERCK PATENT GMBH (DE) 2019-05-22 EP disclosed
US-9040641-B2 Polycarbonate-polysiloxane copolymer, and method for preparing same CHEIL INDUSTRIES INC. (KR) 2015-05-26 US disclosed
US-8852848-B2 Composition for coating over a photoresist pattern Z Electronic Materials USA Corp. (US) 2014-10-07 US disclosed
US-20130289224-A1 Polycarbonate-Polysiloxane Copolymer, and Method for Preparing Same LOTTE ADVANCED MATERIALS CO., LTD. (KR) 2013-10-31 US disclosed
US-8420291-B2 Positive photosensitive resin composition, method for forming pattern, electronic component HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2013-04-16 US disclosed
US-20120028195-A1 Composition for Coating over a Photoresist Pattern MERCK PATENT GMBH (DE) 2012-02-02 US disclosed
US-20100258336-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, ELECTRONIC COMPONENT HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2010-10-14 US disclosed
US-7205373-B2 Enzyme catalyzed organosilicon esters and amides DOW CORNING CORPORATION (US) 2007-04-17 US disclosed
US-20070021578-A1 Enzyme catalyzed organosilicon esters and amides BRANDSTADT KURT F 2007-01-25 US disclosed