SCHEMBL5403635

SCHEMBL5403635

CC(C)c1ccc([I+](OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F)c2ccc(C(C)C)cc2)cc1

nearest known ligand 0.35

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
CA1 P00915 9/20 0.35
CA2 P00918 9/20 0.35
MMP1 P03956 4/20 0.32
MMP2 P08253 4/20 0.32
MMP9 P14780 4/20 0.32
MMP8 P22894 4/20 0.32
MMP13 P45452 4/20 0.32
PTPN5 P54829 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5422209 0.99 CA2 (0.36) CA1CA2MMP1MMP2MMP9
SCHEMBL2895496 0.84 CA2 (0.38) CA1CA2MMP1MMP2MMP9
SCHEMBL1805141 0.84 CA2 (0.38) CA1CA2MMP1MMP2MMP9
SCHEMBL2897585 0.82 CA2 (0.39) CA1CA2MMP1MMP2MMP9
SCHEMBL1804477 0.82 CA2 (0.39) CA1CA2MMP1MMP2MMP9
SCHEMBL1801411 0.82 CA2 (0.38) CA1CA2MMP1MMP2MMP9
SCHEMBL114860 0.81 CA1 (0.36) CA1CA2
SCHEMBL3284975 0.81 CA2 (0.40) CA1CA2MMP1MMP2MMP9
SCHEMBL548592 0.81 CA1 (0.38) CA1CA2
SCHEMBL51423 0.80 CA2 (0.39) CA1CA2MMP1MMP2MMP9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7312014-B2 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2007-12-25 US disclosed
US-20040170918-A1 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2004-09-02 US disclosed
EP-1406123-A1 RESIST COMPOSITIONS Wako Pure Chemical Industries, Ltd. (JP) 2004-04-07 EP disclosed