SCHEMBL5409120

SCHEMBL5409120

FC(F)(F)C1(C(F)(F)F)CCO1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14046810 0.83
SCHEMBL454976 0.72
SCHEMBL15053179 0.71
SCHEMBL21919199 0.69
SCHEMBL24653609 0.69
SCHEMBL14749872 0.67
SCHEMBL21919187 0.65
SCHEMBL9465401 0.65
SCHEMBL21919198 0.64
SCHEMBL10001288 0.62

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7166416-B2 Protecting groups in polymers, photoresists and processes for microlithography E. I. DU PONT DE NEMOURS AND COMPANY (US) 2007-01-23 US disclosed
US-7166416-B2 Protecting groups in polymers, photoresists and processes for microlithography E. I. DU PONT DE NEMOURS AND COMPANY (US) 2007-01-23 US disclosed
US-20050191579-A1 Protecting groups in polymers, photoresists and processes for microlithography FEIRING ANDREW E (US) 2005-09-01 US disclosed
US-6899995-B2 Protecting groups in polymers, photoresists and processes for microlithography E.I. DU PONT DE NEMOURS AND COMPANY (US) 2005-05-31 US disclosed
US-20040023157-A1 Protecting groups in polymers, photoresists and processes for microlithography E.I. DU PONT DE NEMOURS AND COMPANY 2004-02-05 US disclosed
EP-1340125-A2 PROTECTING GROUPS IN POLYMERS, PHOTORESISTS AND PROCESSES FOR MICROLITHOGRAPHY E.I. DU PONT DE NEMOURS AND COMPANY (US) 2003-09-03 EP disclosed
WO-2002044845-A2 PROTECTING GROUPS IN POLYMERS, PHOTORESISTS AND PROCESSES FOR MICROLITHOGRAPHY E.I. DU PONT DE NEMOURS AND COMPANY (US) 2002-06-06 WO disclosed